公开(公告)号：US20220283193A1

公开(公告)日：2022-09-08

申请号：US17628367

申请日：2020-07-17

Applicant: Hitachi High-Tech Corporation

Inventor： Riku Tamura ,  Yuichiro Hashimoto ,  Yuka Sugawara ,  Hiroyuki Yasuda

IPC: G01N35/00 ,  G01N30/88

Abstract: There is provided a specimen analyzer that can measure carry-over without degrading a specimen processing capability. A specimen analyzer according to the present invention measures a first sample including a first specimen and a first internal reference material, subsequently measures a second sample including a second specimen and a second internal reference material, and calculates an amount of the second specimen included in the second sample using an amount of the first internal reference material measured when the first sample has been measured and an amount of the second internal reference material measured when the second sample has been measured.

公开(公告)号：US12025626B2

公开(公告)日：2024-07-02

申请号：US17628367

申请日：2020-07-17

Applicant: Hitachi High-Tech Corporation

Inventor： Riku Tamura ,  Yuichiro Hashimoto ,  Yuka Sugawara ,  Hiroyuki Yasuda

IPC: G01N35/00 ,  G01N30/02 ,  G01N30/72 ,  G01N30/74 ,  G01N30/86 ,  G01N30/88

CPC classification number: G01N35/00613 ,  G01N30/02 ,  G01N30/72 ,  G01N30/74 ,  G01N30/86 ,  G01N30/88 ,  G01N35/0092 ,  G01N2030/8804

Abstract: There is provided a specimen analyzer that can measure carry-over without degrading a specimen processing capability. A specimen analyzer according to the present invention measures a first sample including a first specimen and a first internal reference material, subsequently measures a second sample including a second specimen and a second internal reference material, and calculates an amount of the second specimen included in the second sample using an amount of the first internal reference material measured when the first sample has been measured and an amount of the second internal reference material measured when the second sample has been measured.

公开(公告)号：US12033842B2

公开(公告)日：2024-07-09

申请号：US17628388

申请日：2020-07-22

Applicant: Hitachi High-Tech Corporation

Inventor： Hiroyuki Yasuda ,  Yuichiro Hashimoto ,  Yuka Sugawara ,  Riku Tamura

IPC: H01J49/06 ,  G01N30/72 ,  G01N35/00 ,  H01J49/24 ,  H01J49/42 ,  G01N30/32

CPC classification number: H01J49/063 ,  G01N30/72 ,  G01N35/00584 ,  H01J49/24 ,  H01J49/42 ,  G01N2030/326 ,  G01N2030/328

Abstract: There is provided a mass spectrometer that can appropriately maintain the atmospheric pressure of a vacuum chamber, and a method of controlling the same. An example of a mass spectrometer according to the present invention includes first vacuum chambers, first vacuum pumps, an atmospheric pressure relating value acquiring unit, and an adjustment unit configured to adjust the effective exhaust velocity of the first vacuum pumps, and controllers. The controllers control the adjustment unit corresponding to an atmospheric pressure relating value.

公开(公告)号：US20240177983A1

公开(公告)日：2024-05-30

申请号：US18551211

申请日：2022-03-22

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Masuyuki Sugiyama ,  Hideki Hasegawa ,  Yuka Sugawara ,  Riku Tamura ,  Hiroyuki Yasuda ,  Yuichiro Hashimoto

IPC: H01J49/04 ,  H01J49/24

CPC classification number: H01J49/0422 ,  H01J49/24

Abstract: Provided are a mass spectrometer and a method for controlling the same capable of suppressing decrease in sensitivity even where the atmospheric pressure around the mass spectrometer varies. The mass spectrometer includes an ion source, a mass analysis unit, a control unit, and a storage unit. The ion source includes an ion source chamber, an inlet, a first gas introduction port, a second gas introduction port, an outlet, and a gas discharge port. The storage unit stores a table indicating a relationship between a measurement condition and a flow rate of the second gas. The control unit changes the flow rate of the second gas according to the measurement condition on the basis of the table, and controls a flow rate of the first gas to suppress a variation in a pressure inside the ion source chamber.

公开(公告)号：US20250146985A1

公开(公告)日：2025-05-08

申请号：US18691091

申请日：2022-09-21

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuka Sugawara ,  Hiroyuki Yasuda ,  Riku Tamura ,  Tsugunao Toma ,  Yuichiro Hashimoto ,  Masuyuki Sugiyama

IPC: G01N30/72 ,  B01D15/16 ,  B01D15/42 ,  G01N30/02 ,  G01N30/86

Abstract: To provide a method for controlling a liquid chromatograph mass spectrometer by which contamination of a mobile phase solvent caused by a foreign substance can be detected without using an internal standard substance. The method for controlling a liquid chromatograph mass spectrometer according to the present disclosure includes: calculating a first ratio of signal intensities at a first time point and a second time point when measurement is performed using a first mobile phase solvent; calculating a second ratio of signal intensities at the first time point and the second time point when measurement is further performed using a second mobile phase solvent; and determining whether or not the second mobile phase solvent is contaminated according to an absolute difference between the first ratio and the second ratio.

公开(公告)号：US20220270868A1

公开(公告)日：2022-08-25

申请号：US17628388

申请日：2020-07-22

Applicant: Hitachi High-Tech Corporation

Inventor： Hiroyuki Yasuda ,  Yuichiro Hashimoto ,  Yuka Sugawara ,  Riku Tamura

IPC: H01J49/06 ,  G01N30/72 ,  H01J49/24 ,  H01J49/42 ,  G01N35/00

Abstract: There is provided a mass spectrometer that can appropriately maintain the atmospheric pressure of a vacuum chamber, and a method of controlling the same. An example of a mass spectrometer according to the present invention includes first vacuum chambers, first vacuum pumps, an atmospheric pressure relating value acquiring unit, and an adjustment unit configured to adjust the effective exhaust velocity of the first vacuum pumps, and controllers. The controllers control the adjustment unit corresponding to an atmospheric pressure relating value.