公开(公告)号：US20220115203A1

公开(公告)日：2022-04-14

申请号：US17497384

申请日：2021-10-08

Applicant: Hitachi High-Tech Corporation

Inventor： Kaori BIZEN ,  Ryota WATANABE ,  Yuzuru MIZUHARA ,  Daisuke BIZEN

IPC: H01J37/24 ,  H01J37/147 ,  H01J37/244 ,  H01J37/22 ,  H01J37/28

Abstract: A charged particle beam apparatus acquires an image that is not affected by movement of a stage at a high speed. The apparatus includes: a charged particle source for irradiating a sample with a charged particle beam; a stage on which the sample is placed; a measurement unit for measuring a movement amount of the stage; a deflector; a deflector offset control unit, which is a feedback control unit for adjusting a deflection amount of the deflector according to the movement amount of the stage; a plurality of detectors for detecting secondary charged particles emitted from the sample by irradiation of the charged particle beam; a composition ratio calculation unit that calculates composition ratios of signals output from the detectors based on the deflection amount adjusted by the feedback control unit; and an image generation unit for generating a composite image by compositing the signals using the composition ratio.

公开(公告)号：US20230288439A1

公开(公告)日：2023-09-14

申请号：US18015971

申请日：2021-03-11

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Takushi MIYAKAWA ,  Ryota WATANABE ,  Yuichi IWASE ,  Takahiro KUMAGAI ,  Masafumi MIYAKE

IPC: G01N35/00 ,  G01N35/04

CPC classification number: G01N35/00732 ,  G01N35/04 ,  G01N2035/0462 ,  G01N2035/00891

Abstract: There is provided an electrolyte analyzer that can appropriately replace consumable items while more exerting analysis processing performances than a conventional electrolyte analyzer does. An electrolyte analyzer includes a plurality of analysis chambers 50 having ISE electrodes 1 configured to measure the concentration of the electrolyte of a sample and a controller 29 configured to control operations in the electrolyte analyzer 100 including the analysis chambers 50. The ISE electrodes 1 of the plurality of analysis chambers 50 analyze the same analysis items. The controller 29 selects an analysis chamber 50 used for measurement from the plurality of analysis chambers 50 corresponding to the remaining measurable numbers of a plurality of ISE electrodes 1 and measurement request status.

公开(公告)号：US20250085305A1

公开(公告)日：2025-03-13

申请号：US18580224

申请日：2022-04-18

Applicant: Hitachi High-Tech Corporation

Inventor： Takahiro KUMAGAI ,  Takushi MIYAKAWA ,  Ryota WATANABE

IPC: G01N35/10 ,  G01N35/00 ,  G01N35/02 ,  G01N35/04

Abstract: There are provided an automatic analyzing device and a reagent management method in the automatic analyzing device capable of managing a remaining amount of a consumable reagent with higher accuracy than in the related art. An automatic analyzing device includes a sipper syringe 10 and a liquid feed valve 40 that dispense a consumable reagent filled in a reference electrode solution bottle 5 and an alkaline detergent bottle 39 respectively, a liquid level detection unit 38 that detects a liquid level of the consumable reagent in the reference electrode solution bottle 5 and the alkaline detergent bottle 39, and a control device 29 that calculates a remaining amount of the consumable reagent based on an estimated dispensing amount of the sipper syringe 10 and the liquid feed valve 40, in which the control device 29 corrects the estimated dispensing amount based on consumption of the consumable reagent up to a predetermined height detected by the liquid level detection unit 38 and a dispensing operation history until the liquid level reaches the predetermined height.

公开(公告)号：US20230230796A1

公开(公告)日：2023-07-20

申请号：US18009898

申请日：2020-07-03

Applicant: Hitachi High-Tech Corporation

Inventor： Tomohito NAKANO ,  Makoto SUZUKI ,  Yuzuru MIZUHARA ,  Ryota WATANABE

IPC: H01J37/141 ,  H01J37/28 ,  H01J37/21 ,  H01J37/153

CPC classification number: H01J37/141 ,  H01J37/28 ,  H01J37/21 ,  H01J37/153 ,  H01J2237/216

Abstract: This charged particle beam device comprises: a charged particle beam source that generates charged particle beams; an objective lens in which coil current is inputted to focus the charged particle beams on a sample; a control unit that controls the coil current; a hysteresis characteristics storage unit that stores hysteresis characteristics information of the objective lens; a history information storage unit that stores history information relating to the coil current; and an estimating unit that estimates the magnetic field generated by the objective lens based on the coil current, the history information, and the hysteresis characteristic information, and has a magnetic field correction unit that, when the absolute value of the change amount of the coil current is greater than a prescribed value, further adds to the magnetic field estimated by the estimating unit a correction value according to the coil current and its change amount, correcting the magnetic field generated by the objective lens.

公开(公告)号：US20220026453A1

公开(公告)日：2022-01-27

申请号：US17274797

申请日：2019-11-12

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Masayuki ITO ,  Osamu MATSUMOTO ,  Ryota WATANABE

IPC: G01N35/00 ,  G01N35/10

Abstract: The automatic analyzer includes a first storage device that stores sample information including a measurement result of a reaction solution for each sample and a second storage device that stores the sample information on at least a part of the samples among the sample information stored in the first storage device, in which when the automatic analyzer reaches a predetermined operation state, the control device performs a backup process of backing up the sample information on the samples satisfying a predetermined backup condition from the first storage device to the second storage device, and deleting the sample information on the backed up samples from the first storage device.