公开(公告)号：US12211667B2

公开(公告)日：2025-01-28

申请号：US18367066

申请日：2023-09-12

Applicant: Integrated Dynamic Electron Solutions, Inc.

Inventor： Ruth Bloom ,  Sang Tae Park ,  Bryan Reed ,  Daniel Masiel

IPC: H01J37/26 ,  H01J37/147 ,  H01J37/244

Abstract: Methods and systems for acquiring transmission electron microscope video data on a rolling-shutter detector at an enhanced frame rate and without temporal distortions are described. Also described are methods to enhance the dynamic range of image and diffraction data acquired using a transmission electron microscope. The disclosed methods and systems may also be applicable to photon detection and imaging systems.

公开(公告)号：US12080514B2

公开(公告)日：2024-09-03

申请号：US18201536

申请日：2023-05-24

Applicant: Integrated Dynamic Electron Solutions, Inc.

Inventor： Ruth Shewmon Bloom ,  Bryan Walter Reed ,  Daniel Joseph Masiel ,  Sang Tae Park

IPC: H01J37/24 ,  H01J37/147 ,  H01J37/28 ,  H01J37/29

CPC classification number: H01J37/243 ,  H01J37/147 ,  H01J37/28 ,  H01J37/292

Abstract: A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.

公开(公告)号：US11804359B2

公开(公告)日：2023-10-31

申请号：US16939576

申请日：2020-07-27

Applicant: Integrated Dynamic Electron Solutions, Inc.

Inventor： Ruth Bloom ,  Sang Tae Park ,  Bryan Reed ,  Daniel Masiel

IPC: H01J37/26 ,  H01J37/147 ,  H01J37/244

CPC classification number: H01J37/26 ,  H01J37/1474 ,  H01J37/244 ,  H01J2237/2802 ,  H01J2237/2804

Abstract: Methods and systems for acquiring transmission electron microscope video data on a rolling-shutter detector at an enhanced frame rate and without temporal distortions are described. Also described are methods to enhance the dynamic range of image and diffraction data acquired using a transmission electron microscope. The disclosed methods and systems may also be applicable to photon detection and imaging systems.

公开(公告)号：US11728128B2

公开(公告)日：2023-08-15

申请号：US17825261

申请日：2022-05-26

Applicant: Integrated Dynamic Electron Solutions, Inc.

Inventor： Ruth Shewmon Bloom ,  Bryan Walter Reed ,  Daniel Joseph Masiel ,  Sang Tae Park

IPC: H01J37/24 ,  H01J37/29 ,  H01J37/28 ,  H01J37/147

CPC classification number: H01J37/243 ,  H01J37/147 ,  H01J37/28 ,  H01J37/292

Abstract: A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.

公开(公告)号：US11476082B1

公开(公告)日：2022-10-18

申请号：US17688339

申请日：2022-03-07

Applicant: Integrated Dynamic Electron Solutions, Inc.

Inventor： Ruth Shewmon Bloom ,  Bryan Walter Reed ,  Daniel Joseph Masiel ,  Sang Tae Park

IPC: H01J37/24 ,  H01J37/29 ,  H01J37/28 ,  H01J37/147

Abstract: A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.