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公开(公告)号:US20240413550A1
公开(公告)日:2024-12-12
申请号:US18805632
申请日:2024-08-15
Applicant: Intel Corporation
Inventor: Chenghai Yan , Wenzhi Wang , Qihang Shang , Tao Xu , Weijiao Jiang , Xinjun Zhang , Lei Wang , Xiaorui Xu
IPC: H01R12/70 , H01R13/6461
Abstract: An apparatus and method for reducing differential cross-talk in a CPU pin arrangement of a server motherboard are described. The CPU pin arrangement has pin patterns that are arranged in a square, separated from each other, and are mirrored around an axis between the pin patterns. Each pin pattern has pins that each include a main body with a lateral asymmetric cross-section, a first connector extending from one end of the main body and coupled to the motherboard through solder, and a second connector extending from an opposing end of the main body and coupled to the CPU through a pressure contact.
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公开(公告)号:US20240274521A1
公开(公告)日:2024-08-15
申请号:US18570455
申请日:2021-12-15
Applicant: Intel Corporation
Inventor: Chenghai Yan , Lei Wang , Maoxin Yin , Wenzhi Wang
IPC: H01L23/498 , H01L23/00 , H01L23/66
CPC classification number: H01L23/49838 , H01L23/49816 , H01L23/66 , H01L24/14 , H01L24/16 , H01L2223/6661 , H01L2224/1403 , H01L2224/16227
Abstract: Methods, apparatus, systems, and articles of manufacture to reduce impedance discontinuities and crosstalk in integrated circuit packages are disclosed. A disclosed apparatus includes: a package substrate, and a ball grid array on a first surface of the package substrate. The ball grid array includes a first ball and a second ball adjacent the first ball. The ball grid array is to enable the package substrate to be electrically coupled to a circuit board. The apparatus further includes a metal interconnect within the package substrate. The metal interconnect is electrically coupled to the first ball. The metal interconnect includes an inductive loop that extends toward the second ball.
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公开(公告)号:US20240088069A1
公开(公告)日:2024-03-14
申请号:US18260810
申请日:2021-02-26
Applicant: Intel Corporation
Inventor: Wenzhi Wang , Xiaoning Ye , Yunhui Chu , Chunfei Ye , James A. McCall
IPC: H01L23/66 , H01L23/498 , H01L23/538 , H01L25/18 , H10B80/00
CPC classification number: H01L23/66 , H01L23/49822 , H01L23/49838 , H01L23/5383 , H01L23/5386 , H01L25/18 , H10B80/00 , H01L2223/6627
Abstract: Disclosed herein are integrated circuit (IC) supports with microstrips, and related embodiments. For example, an IC support may include a plurality of microstrips and a plurality of conductive segments. Individual ones of the conductive segments may be at least partially over at least two microstrips, a dielectric material may be between the plurality of microstrips and the plurality of conductive segments, and the conductive segments are included in a tape.
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公开(公告)号:US20240063134A1
公开(公告)日:2024-02-22
申请号:US18260805
申请日:2021-02-26
Applicant: Intel Corporation
Inventor: Xiaoning Ye , Pooya Tadayon , Wenzhi Wang , Srinivasa R. Aravamudhan , Nathan Somnang Tan , Brett Daniel Grossman
IPC: H01L23/538 , H01L25/065 , H01L23/498
CPC classification number: H01L23/5386 , H01L25/0655 , H01L23/5383 , H01L23/49894 , H01L23/49877 , H01L2224/16225 , H01L24/16
Abstract: Disclosed herein are integrated circuit (IC) supports with microstrips, and related embodiments. For example, an IC support may include a plurality of microstrips and a plurality of conductive segments. Individual ones of the conductive segments may be at least partially over at least two microstrips, a dielectric material may be between the plurality of microstrips and the plurality of conductive segments, and an individual conductive segment may have a conductivity that is close to or less than a conductivity of a conductive line of an individual microstrip.
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