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公开(公告)号：US09622348B2
公开(公告)日：2017-04-11
申请号：US14332269
申请日：2014-07-15
Applicant: MPI CORPORATION
Inventor： Wei-Cheng Ku , Jun-Liang Lai , Chun-Chung Huang , Jing-Zhi Hung , Yung Nan Wu , Chih-Hao Ho
CPC classification number: H05K1/116 , H05K1/0298 , H05K3/429 , H05K2201/09845
Abstract: A multilayer circuit board includes a plurality of stacked substrates, a plurality of first conductive lands, and a plurality of second conductive lands. A surface at a side of each of the substrates has an exposed portion which is not covered by the neighboring substrate, wherein each of the first conductive lands is respectively provided on each of the exposed portions. Each of the second conductive lands is provided on the exposed portion of the outermost substrate, wherein each of the substrates has a conductor pattern to be electrically connected to one of the first conductive lands and to one of the second conductive lands.
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公开(公告)号：US20150015291A1
公开(公告)日：2015-01-15
申请号：US14332200
申请日：2014-07-15
Applicant: MPI CORPORATION
Inventor： WEI-CHENG KU , Jun-Liang Lai , Chun-Chung HUANG , Jing-Zhi Hung , Yung Nan Wu , CHIH-HAO HO
CPC classification number: G01R1/06772 , G01R1/06727 , G01R1/07342
Abstract: A cantilever probe card, which is provided between a device under test (DUT) and a tester, includes a carrier board, a probe base, two probes, and a transmission device. The carrier board is provided with through holes. The probe base is provided on the carrier board, and the probes are mounted to the probe base. Each probe has a tip to contact a test pad of the DUT. The transmission device is flexible, and has signal circuits. The transmission device passes through the through hole on the carrier board, and the signal circuits connect the probes to the tester respectively.
Abstract translation: 设置在被测设备（DUT）和测试仪之间的悬臂探针卡包括载板，探针基座，两个探针和传输装置。 载板上设有通孔。 探针底座设置在载板上，探头安装在探针底座上。 每个探头都有一个提示，用于接触DUT的测试焊盘。 传输设备灵活，并具有信号电路。 传输装置通过载板上的通孔，信号电路将探头分别连接到测试仪。
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