公开(公告)号：US09523708B2

公开(公告)日：2016-12-20

申请号：US14556612

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Ya-Hung Lo ,  Shou-Jen Tsai

IPC: G01R31/00 ,  G01R1/04 ,  G01R31/28 ,  G01R1/073

CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.

Abstract translation: 电测试装置包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在第一轨道之间的支撑件，测试臂，设置在测试臂上的旋转台，设置在旋转台上的多个保持架 ，以及分别设置在保持器上的多个探针组。 支撑件具有设置在其上的第二轨道，并且可相对于基座和平台移动。 测试臂设置在第二轨道上并在平台上方，其中测试臂可与支撑件一起移动，并且也可相对于支撑件移动。 旋转台相对于测试臂是可移动的或可旋转的。 支架可与旋转工作台一起移动，并且也可相对于旋转工作台移动或旋转。 探头组与支架一起可移动。

公开(公告)号：US20240248129A1

公开(公告)日：2024-07-25

申请号：US18406668

申请日：2024-01-08

Applicant: MPI Corporation

Inventor： Wen-Wei Lin ,  Wen-Chung Lin ,  Chia-Nan Chou ,  Huang-Huang Yang ,  Yu-Tse Wang ,  Wei-Heng Hung ,  Ya-Hung Lo ,  Shou-Jen Tsai ,  Fuh-Chyun Tang

IPC: G01R31/28 ,  G01R1/04 ,  G01R1/067

CPC classification number: G01R31/2808 ,  G01R1/04 ,  G01R1/06705

Abstract: A circuit board detection device includes a base, a stage assembly, a first gantry support, and a first probe assembly. The stage assembly is arranged on the base and includes a linear drive module, a rotary motor, and a platform. The platform is configured to carry a circuit board and can be driven by the linear drive module to move along a first axial direction. The platform can also be driven by the rotary motor to rotate relative to a first rotation axis. The first gantry support is fixed on the base and includes a first beam. The first beam extends along a second axial direction perpendicular to the first axial direction to span over the linear drive module, and includes a first probe guide rail. The first probe assembly is arranged on the first probe guide rail to be movable along the second axial direction.

公开(公告)号：US20250044322A1

公开(公告)日：2025-02-06

申请号：US18672112

申请日：2024-05-23

Applicant: MPI Corporation

Inventor： Ya-Hung Lo ,  Chien-Hsun Chen ,  Chia-Nan Chou ,  Shou-Jen Tsai ,  Fuh-Chyun Tang

IPC: G01R1/067

Abstract: The present invention provides a quick coupling probe card, utilized to test circuit board. The quick coupling probe card comprises a base, a coaxial connector, mechanical connector, and probe holding part, wherein the base has a first surface and a second surface corresponding to the first surface, the coaxial connector arranged on the base has one end above the first surface, and is coupled to the test machine for transmitting the high frequency signal, the mechanical connector is arranged on the first surface for coupling to the test machine, and is closer to a center of the base than the coaxial connector, and the probe holding part, arranged on the second surface and utilized to couple to the coaxial connector, has one end connected to a high frequency probe corresponding to one specific kind of the different kinds of pitches.

公开(公告)号：US11536765B2

公开(公告)日：2022-12-27

申请号：US16892076

申请日：2020-06-03

Applicant: MPI Corporation

Inventor： Kang-Yen Fu ,  Ya-Hung Lo ,  Shou-Jen Tsai ,  Wei-Cheng Ku

IPC: G01R31/28 ,  H01L21/67 ,  G01R1/073

Abstract: A probing apparatus includes a frame, a testing device, a rotatable testing platform, and a probe module. The testing device is disposed on the frame and is displaceable along an X direction and a Y direction perpendicular to the X direction. The rotatable testing platform is disposed on the frame and is rotatable around a rotating axis extending in the X direction. A direction perpendicular to the X direction and the Y direction is a Z direction, and the rotatable testing platform and the testing device are located at different positions of the Z direction. The probe module is disposed on the rotatable testing platform.

公开(公告)号：US11460498B2

公开(公告)日：2022-10-04

申请号：US17034741

申请日：2020-09-28

Applicant: MPI CORPORATION

Inventor： Yang-Hung Cheng ,  Ya-Hung Lo ,  Chien-Hsun Chen ,  Chia-Nan Chou ,  Chung-Yen Huang ,  Shou-Jen Tsai ,  Fuh-Chyun Tang

IPC: G01R31/28 ,  G01R1/073

Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.