RADIO FREQUENCY INDUCED MICRO LED INSPECTION

    公开(公告)号:US20250105065A1

    公开(公告)日:2025-03-27

    申请号:US18472555

    申请日:2023-09-22

    Applicant: Orbotech Ltd.

    Inventor: Arie Glazer

    Abstract: The system includes a glass panel, a radio frequency generator, a camera, and a processor. The glass panel includes a conductive layer, and the conductive layer is disposed on top of an LED. The radio frequency generator is configured to apply a radio frequency signal to the glass panel, and the radio frequency signal illuminates the LED by induction through the conductive layer. The camera is configured to capture an image of the LED illuminated by the radio frequency signal. The processor is in electronic communication with the camera and is configured to receive the image from the camera and determine whether the LED is a defective LED or a functioning LED based on the image of the LED.

    A Method and Apparatus for Preparing a PCB Product Having Highly Dense Conductors

    公开(公告)号:US20220104360A1

    公开(公告)日:2022-03-31

    申请号:US17425023

    申请日:2020-02-11

    Applicant: Orbotech Ltd.

    Abstract: A method for preparing a PCB product having highly dense conductors, the method including providing a PCB substrate including a conductive layer, employing an inkjet printer to selectively print unexposed photosensitive patterns on the PCB substrate, the unexposed photosensitive patterns having a thickness of less than 5 pm, exposing the photosensitive patterns to radiation thereby to define exposed patterns, the exposed patterns having a pitch less than 20 pm and wet etching the conductive layer in accordance with a pattern defined by the exposed patterns thereby to define the highly dense conductors having a pitch of less than 30 pm.

    Electrical inspection of electronic devices using electron-beam induced plasma probes
    3.
    发明授权
    Electrical inspection of electronic devices using electron-beam induced plasma probes 有权
    使用电子束感应等离子体探针对电子设备进行电气检查

    公开(公告)号:US09523714B2

    公开(公告)日:2016-12-20

    申请号:US14155808

    申请日:2014-01-15

    CPC classification number: G01R1/072 G01R31/305 H01J33/00 H01J2237/164

    Abstract: A non-mechanical contact signal measurement apparatus includes a first conductor on a structure under test and a gas in contact with the first conductor. At least one electron beam is directed into the gas so as to induce a plasma in the gas where the electron beam passes through the gas. A second conductor is in electrical contact with the plasma. A signal source is coupled to an electrical measurement device through the first conductor, the plasma, and the second conductor when the plasma is directed on the first conductor. The electrical measurement device is responsive to the signal source.

    Abstract translation: 非机械接触信号测量装置包括被测结构上的第一导体和与第一导体接触的气体。 至少一个电子束被引导到气体中,以便在电子束通过气体的气体中引入等离子体。 第二导体与等离子体电接触。 当等离子体被引导到第一导体上时,信号源通过第一导体,等离子体和第二导体耦合到电测量装置。 电测量装置响应于信号源。

    VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL TEST

    公开(公告)号:US20240429106A1

    公开(公告)日:2024-12-26

    申请号:US18338838

    申请日:2023-06-21

    Applicant: Orbotech Ltd.

    Abstract: The Voltage Image Optical System (VIOS) includes a substrate, an electro-optic modulator, a light source, a detector, and a processor. The electro-optic modulator is separated from the substrate by a buffer material and includes a mirrored pellicle, a transparent electrode, and a polymer dispersed liquid crystal (PDLC) sensor material disposed between the transparent electrode and the mirrored pellicle. The buffer material is disposed between the mirrored pellicle and the substrate. The light source is configured to illuminate the PDLC sensor material during application of a voltage to the transparent electrode, and the detector is configured to detect intensity of light reflected by the mirrored pellicle. The processor is configured to determine whether a pixel electrode on the substrate is a defective pixel electrode or a functioning pixel electrode based on the intensity of the light transmitted by the PDLC and reflected by the mirrored pellicle.

    PULSED LASER MICRO LED INSPECTION

    公开(公告)号:US20250102558A1

    公开(公告)日:2025-03-27

    申请号:US18472508

    申请日:2023-09-22

    Applicant: Orbotech Ltd.

    Inventor: Arie Glazer

    Abstract: The system includes a laser generator, an antenna, and a processor. The laser generator is configured to emit a pulsed laser beam toward an LED. The LED generates a photovoltaic radio frequency signal when radiated by the pulsed laser beam. The antenna is configured to receive the photovoltaic radio frequency signal generated by the LED. The processor is in electronic communication with the antenna and is configured to read the photovoltaic radio frequency signal and determine whether the LED is a defective LED or a functioning LED based on the photovoltaic radio frequency signal.

    Apparatus for use in preparing a printed circuit board and photosensitive ink for in an ink jet printer

    公开(公告)号:US11596070B2

    公开(公告)日:2023-02-28

    申请号:US17425023

    申请日:2020-02-11

    Applicant: Orbotech Ltd.

    Abstract: An apparatus is used in preparing a printed circuit board (PCB). The apparatus can include a common chassis, an inkjet printer mounted on the common chassis, and a pattern exposer mounted on the common chassis. The inkjet printer can selectively print unexposed photosensitive patterns on a PCB substrate with a photosensitive ink. The pattern exposer can expose said photosensitive patterns to radiation thereby defining exposed patterns. A photosensitive ink for use in an ink jet printer can include a photoresist, a solvent, a humectant, a surfactant, an adhesion promoter, and a basic solution. The adhesion promoter is operative to increase anisotropy of a wet etching process of a copper component on which said photosensitive ink is printed.

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