Method and apparatus for inspection of multi-junction solar cells
    1.
    发明授权
    Method and apparatus for inspection of multi-junction solar cells 有权
    多结太阳能电池检查方法和装置

    公开(公告)号:US07705978B2

    公开(公告)日:2010-04-27

    申请号:US11348019

    申请日:2006-02-06

    Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.

    Abstract translation: 通过用宽带红外辐射照射被检查的每个细胞,然后形成从细胞长期反射的辐射图像,提供太阳能电池和太阳能电池板中的缺陷的高对比度图像的技术。 多结太阳能电池具有金属背衬层,其将照明反射回适当定位和对准的相机中,其被选择为对于太阳能电池材料相对透明的红外波长敏感。

    APPARATUS AND METHOD FOR OPTICAL EXAMINATION OF DOCUMENTS
    2.
    发明申请
    APPARATUS AND METHOD FOR OPTICAL EXAMINATION OF DOCUMENTS 有权
    用于光学检查文件的装置和方法

    公开(公告)号:US20090294693A1

    公开(公告)日:2009-12-03

    申请号:US12475666

    申请日:2009-06-01

    Applicant: Günther Nath

    Inventor: Günther Nath

    Abstract: An apparatus for optical examination of documents. The apparatus includes a light source, a viewing unit having a window through which light emitted from the light source exits for examination of documents by an observer. A method for optical examination of a document. The method steps include: providing a light source; emitting light from the light source into a viewing unit; emitting light from the viewing unit through a window; applying fluid to a document to be viewed; and, bringing the document into contact with the window such that an observer can examine the document.

    Abstract translation: 一种用于光学检查文件的设备。 该装置包括光源,具有窗口的观察单元,通过该窗口从光源射出的光从出口观察观察者检查文件。 一种用于光学检查文件的方法。 方法步骤包括:提供光源; 将光从光源发射到观察单元; 通过窗口从观察单元发射光; 将流体施加到待查看的文件上; 并且使文档与窗口接触,使得观察者可以检查该文档。

    Method and apparatus for inspection of semiconductor devices
    3.
    发明申请
    Method and apparatus for inspection of semiconductor devices 失效
    用于半导体器件检查的方法和装置

    公开(公告)号:US20070181809A1

    公开(公告)日:2007-08-09

    申请号:US11348029

    申请日:2006-02-06

    Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.

    Abstract translation: 通过用宽带红外辐射照射被检查的每个半导体器件,然后形成从半导体器件镜面反射的辐射的图像,提供半导体器件和这种器件的阵列中的缺陷的高对比度图像的技术。 许多这样的器件的半导体器件和阵列具有金属背衬层,其将照明反射回适当定位和对准的相机中,该相机被选择为对半导体器件材料相对透明的红外波长敏感。

    Methods and apparatus for inspection of multi-junction solar cells
    4.
    发明申请
    Methods and apparatus for inspection of multi-junction solar cells 有权
    多结太阳能电池检查方法和装置

    公开(公告)号:US20070181180A1

    公开(公告)日:2007-08-09

    申请号:US11348019

    申请日:2006-02-06

    Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.

    Abstract translation: 通过用宽带红外辐射照射被检查的每个细胞,然后形成从细胞长期反射的辐射图像,提供太阳能电池和太阳能电池板中的缺陷的高对比度图像的技术。 多结太阳能电池具有金属背衬层,其将照明反射回适当定位和对准的相机中,其被选择为对于太阳能电池材料相对透明的红外波长敏感。

    Apparatus for measuring opaque medium coverage of a translucent sheet
    5.
    发明授权
    Apparatus for measuring opaque medium coverage of a translucent sheet 失效
    用于测量半透明片的不透明介质覆盖的装置

    公开(公告)号:US4832495A

    公开(公告)日:1989-05-23

    申请号:US107962

    申请日:1987-10-13

    Abstract: An apparatus for measuring the relative coverage of a predetermined portion of a sheet of translucent material with an opaque medium such as ink or photographic emulsion, comprising: a light source for providing a relatively constant intensity source of light over a predetermined measuring area; a positioning device for positioning the predetermined portion of the sheet of material to be measured over the predetermined measuring area of the light source; a light measuring device for measuring the relative amount of light from the light source which is transmitted through the predetermined portion of the sheet of material to be measured, whereby the relative amount of opaque medium coverage of the portion of the sheet to be measured is readily determinable by comparison of the measured amount of light transmitted through the predetermined portion of the sheet to be measured with predetermined calibration values.

    Abstract translation: 一种用于用不透明介质如油墨或照相乳剂测量半透明材料片的预定部分的相对覆盖度的装置,包括:用于在预定测量区域上提供相对恒定的强度光源的光源; 定位装置,用于将待测量的材料片的预定部分定位在光源的预定测量区域上; 光测量装置,用于测量透射通过待测量材料片的预定部分的来自光源的光的相对量,由此待测量的片的部分的不透明介质覆盖的相对量容易 可以通过将测量的被测量的光的透射量与预定的校准值进行比较来确定。

    Backlight apparatus with remote light source
    8.
    发明授权
    Backlight apparatus with remote light source 有权
    带远程光源的背光装置

    公开(公告)号:US08308330B2

    公开(公告)日:2012-11-13

    申请号:US12475666

    申请日:2009-06-01

    Applicant: Günther Nath

    Inventor: Günther Nath

    Abstract: An apparatus for optical examination of documents. The apparatus includes a light source, a plurality of panels which are exchangeable with each other, a viewing unit having a window formed by at least one of the plurality of exchangeable panels through which window light emitted from the light source exits for examination of documents by an observer. Further included is a coupling unit configured to supply the light emitted from the light source into the viewing unit. The light source and the viewing unit are coupled together by a light guide and the light guide is adapted to supply the light from the light source to the coupling unit. At least one of the plurality of exchangeable panels is a fluorescent panel including a fluorescent substance. The fluorescent panel is fluorescent in the yellow-red-infrared wavelength range when being illuminated with light in the ultraviolet-blue-green wavelength range.

    Abstract translation: 一种用于光学检查文件的设备。 该装置包括光源,可彼此交换的多个面板,观察单元,其具有由多个可更换面板中的至少一个形成的窗口,通过该窗口从光源发射的窗光通过该窗口离开以便通过 观察员 进一步包括被配置为将从光源发射的光提供到观察单元中的耦合单元。 光源和观察单元通过光导耦合在一起,并且光导适合于将来自光源的光提供给耦合单元。 多个可更换面板中的至少一个是包括荧光物质的荧光板。 当以紫外 - 蓝 - 绿色波长范围的光照射时,荧光板在黄 - 红 - 红外波长范围内是荧光的。

    Method and apparatus for inspection of semiconductor devices
    9.
    发明授权
    Method and apparatus for inspection of semiconductor devices 失效
    用于半导体器件检查的方法和装置

    公开(公告)号:US07326929B2

    公开(公告)日:2008-02-05

    申请号:US11348029

    申请日:2006-02-06

    Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.

    Abstract translation: 通过用宽带红外辐射照射被检查的每个半导体器件,然后形成从半导体器件镜面反射的辐射的图像,提供半导体器件和这种器件的阵列中的缺陷的高对比度图像的技术。 许多这样的器件的半导体器件和阵列具有金属背衬层,其将照明反射回适当定位和对准的相机中,该相机被选择为对半导体器件材料相对透明的红外波长敏感。

Patent Agency Ranking