公开(公告)号：CA2120557A1

公开(公告)日：1994-12-12

申请号：CA2120557

申请日：1994-04-05

Applicant: IBM

Inventor： ANSCHEL MORRIS ,  INGRAHAM ANTHONY P ,  LAMB CHARLES R ,  LOWELL MICHAEL D ,  MARKOVICH VOYA R ,  MAYR WOLFGANG ,  MURPHY RICHARD G ,  PIERSON MARK V ,  POWERS TAMAR A ,  RENY TIMOTHY S ,  REYNOLDS SCOTT D ,  SAMMAKIA BAHGAT G ,  STORR WAYNE R

IPC: G01R31/26 ,  G01R31/28 ,  H01L21/66 ,  H01R13/02

Abstract: METHOD AND APPARATUS FOR TESTING OF INTEGRATED CIRCUIT CHIPS A method of testing semi-conductor chips is disclosed. The individual semiconductor chips have I/O, power, and ground contacts. In the method of the invention a chip test fixture system is provided. The chip test fixture system has contacts corresponding to the contacts on the semiconductor chip. The carrier contacts have dendritic surfaces. The chip contacts are brought into electrically conductive contact with the conductor pads on the chip test fixture system. Test signal input vectors are applied to the inputs of the semiconductor chip, and output signal vectors are recovered from the semiconductor chip. After testing the chip is removed from the substrate.

公开(公告)号：DE69115106D1

公开(公告)日：1996-01-18

申请号：DE69115106

申请日：1991-02-07

Applicant: IBM

Inventor： BEAMAN BRIAN SAMUEL ,  FOGEL KEITH EDWARD ,  KIM JUNGIHL ,  MAYR WOLFGANG ,  SHAW JANE MARGARET ,  WALKER GEORGE FREDERICK

IPC: G01R1/067 ,  G01R1/04 ,  G01R1/073 ,  G01R31/26 ,  H01R4/26 ,  H01R13/24 ,  H01R23/72

Abstract: An electrical connector is described for making contact with a plurality of convex and deformable contacts (40, 46) on an electronic device (38). The electrical connector comprises a substrate having a plurality of conductors (10, 12, 14) which extend above its surface. A polymeric material (20) is disposed on the surface of the substrate and has openings which expose the conductors, each opening sized to receive one of the convex, deformable contacts, and to enable electrical connection between the exposed conductors and the deformable contacts. A mechanism is provided for urging the deformable contacts on the electronic device against the exposed conductors. The mechanism exerts sufficient force between the device and the conductors to cause some deformation of the convex contact areas by the conductors.