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公开(公告)号:SG118102A1
公开(公告)日:2006-01-27
申请号:SG200107602
申请日:2001-12-07
Applicant: IBM
Inventor: CABRAL CYRIL JR , ROY ARTHUR CARRUTHERS , JAMES MCKELL EDWIN HARPER , CHAO-KUN HU , KIM YANG LEE , ISMAIL CEVDET NOYAN , ROBERT ROSENBERG , THOMAS MCCARROLL SHAW
IPC: H01L21/28 , B32B15/01 , C22C27/02 , H01L21/768 , H01L23/532 , H01L23/485
Abstract: An electrical conductor for use in an electronic structure is disclosed which includes a conductor body that is formed of an alloy including between about 0.001 atomic % and about 2 atomic % of an element selected from the group consisting of Ti, Zr, In, Sn and Hf; and a liner abutting the conductor body which is formed of an alloy that includes Ta, W, Ti, Nb and V. The invention further discloses a liner for use in a semiconductor interconnect that is formed of a material selected from the group consisting of Ti, Hf, In, Sn, Zr and alloys thereof, TiCu3, Ta1-XTix, Ta1-X, Hfx, Ta1-X, Inxy, Ta1-XSnx, Ta1-XZrx.
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2.
公开(公告)号:SG106653A1
公开(公告)日:2004-10-29
申请号:SG200107687
申请日:2001-12-11
Applicant: IBM
Inventor: TIMOTHY JOSEPH DALTON , STEPHEN EDWARD GRECO , JEFFREY CURTIS HEDRICK , SATYANARAYANA V NITTA , SAMPATH PURUSHOTHAMAN , KENNETH PARKER RODBELL , ROBERT ROSENBERG
IPC: H01L21/316 , H01L21/768 , H01L21/31 , H01L23/532
Abstract: A method for forming a porous dielectric material layer in an electronic structure and the structure formed are disclosed. In the method, a porous dielectric layer in a semiconductor device can be formed by first forming a non-porous dielectric layer, then partially curing, patterning by reactive ion etching, and final curing the non-porous dielectric layer at a higher temperature than the partial curing temperature to transform the non-porous dielectric material into a porous dielectric material, thus forming a dielectric material that has a low dielectric constant, i.e. smaller than 2.6. The non-porous dielectric material may be formed by embedding a thermally stable dielectric material such as methyl silsesquioxane, hydrogen silsesquioxane, benzocyclobutene or aromatic thermoset polymers with a second phase polymeric material therein such that, at the higher curing temperature, the second phase polymeric material substantially volatilizes to leave voids behind forming a void-filled dielectric material.
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公开(公告)号:CH536557A
公开(公告)日:1973-04-30
申请号:CH804170
申请日:1970-05-29
Applicant: IBM
Inventor: ROBERT ROSENBERG
IPC: H01L21/768 , H01L21/00 , H01L21/28 , H01R3/00
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