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公开(公告)号:DE10333280B4
公开(公告)日:2007-10-25
申请号:DE10333280
申请日:2003-07-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN
IPC: G11C8/18 , G06F12/00 , G11C7/10 , G11C7/22 , G11C8/12 , G11C11/4076 , G11C11/4093 , G11C11/4096
Abstract: The invention relates to a semi-conductor memory component and process for operating a semi-conductor memory component, including activating the memory cells of a memory cell array, when one or several memory cell(s) included in the first set of memory cells need(s) to be accessed, accessing the corresponding memory cell or memory cells, deactivating the memory cells contained in a first set of memory cells, when one or several further memory cells that are not included in the first set of memory cells need(s) to be accessed, and prematurely deactivating the memory cells included in the first set of memory cells, when a predetermined time period or number of pulses after one or several memory cells included in the first set of memory cells have last been accessed first no further accessing of one or several of the memory cells included in the first set of memory cells takes place.
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公开(公告)号:DE102006019749A1
公开(公告)日:2007-07-19
申请号:DE102006019749
申请日:2006-04-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHAEFER ANDRE , BROX MARTIN
IPC: G11C11/406
Abstract: The method involves determining a temperature level of a memory module. The determined temperature level is compared with a reference temperature level of the module. Temporal distance of a refresh command transmitted from a control device e.g. memory controller (23), to another control device e.g. internal refresh controller (24), is changed during a variation between the temperature values to adjust cyclic refreshing of the cell to temperature of the memory module. The transmission of the command is stopped during the determined temperature level. Independent claims are also included for the following: (1) a device for adjustment of cyclic reconditioning of memory cells of a memory module to temperature of the memory module (2) a memory comprising a memory module.
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公开(公告)号:DE10249016B4
公开(公告)日:2006-10-19
申请号:DE10249016
申请日:2002-10-21
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN
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公开(公告)号:DE102004043050B4
公开(公告)日:2006-08-17
申请号:DE102004043050
申请日:2004-09-06
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SPIRKL WOLFGANG , KILIAN VOLKER , KAISER ROBERT , BROX MARTIN
IPC: G01R31/3183 , G01R31/319 , G11C29/48
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公开(公告)号:DE10261409B4
公开(公告)日:2006-05-11
申请号:DE10261409
申请日:2002-12-30
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN , MINZONI ALESSANDRO
Abstract: The delay locked loop includes an additional delay element (102) connected in series with a first delay element (101). A frequency detector unit (110) detects the frequency of the input signal (103). The second delay element is adjustable based on the detected frequency of the input signal. Independent claims are included for a frequency detector unit and a method of providing clock signals in circuit units.
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公开(公告)号:DE10339894A1
公开(公告)日:2005-03-31
申请号:DE10339894
申请日:2003-08-29
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN , SCHNEIDER HELMUT
IPC: G11C7/06 , G11C11/4091
Abstract: The apparatus includes a switch unit for connecting a reader amplifier unit to a bit line or a cell field region and for disconnecting the amplifier from the bit line or cell field region in dependence on the state of a control signal on a control line. The apparatus also has a driver to drive the control signal. An additional switch is provided which can cause a change in state of the control signal applied to the control line. Independent claims also cover a method of operating the apparatus.
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公开(公告)号:DE10241982B4
公开(公告)日:2004-10-07
申请号:DE10241982
申请日:2002-09-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN
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公开(公告)号:DE10230168A1
公开(公告)日:2004-01-22
申请号:DE10230168
申请日:2002-07-04
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN , MINZONI ALESSANDRO
Abstract: The invention involves a voltage converter device ( 101 a , 101 b) for converting a signal (in) at an initial voltage level (vint) into a signal (DatoV) at a second voltage level (vint) differing from the first, in which voltage converter device ( 101 a , 101 b) has an amplifier device ( 102 ), and where the amplifier device ( 102 ) uses a second amplifier device output signal (bout) to generate signals (DatoV) at the second voltage level (vddq).
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公开(公告)号:DE10102000A1
公开(公告)日:2002-08-01
申请号:DE10102000
申请日:2001-01-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN , SCHNEIDER HELMUT
IPC: H01L23/50 , H01L23/544 , H01L23/58
Abstract: A description is given of an integrated circuit having components and a method for checking a connection configuration of bonding pads. The integrated circuit has an identification circuit that identifies a connection of the bonding pads to external circuits. After the identification of the connected bonding pads, the data width of the input/output circuit is preferably programmed accordingly. In this way, self-detection and automatic programming are possible without data inputting from the outside.
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公开(公告)号:DE19944738A1
公开(公告)日:2001-03-29
申请号:DE19944738
申请日:1999-09-17
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BROX MARTIN , PFEFFERL KARL-PETER
IPC: G11C11/407 , G11C8/08 , G11C8/12 , G11C8/14 , G11C11/401 , G11C7/00
Abstract: The master word line (WL0)is assigned an additional master word line (MWL1), to form master word line pairs in a memory cell field. The additional master word line can be decoded into several sub-word lines, as can the master word line. One master word line is connected via its sub-word lines (SWL) with memory banks of one logic state and the other master word line is connected via its sub-word lines with memory bands of the other logic state. Hence in word line direction, the memory banks of each logic state can be alternately accommodated. Between the master word lines and the sub word line a single address unit (5) is switched. Both master word lines have several sections of the sub word line assigned to them.
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