Abstract:
The reading device (1) comprises an A/D converter (8) of n+m bits receiving an input signal (V1) correlated to the threshold voltage (VTH) of the memory cell (2), and supplying a binary output word (WT) of n+m bits. The A/D converter (8) is of a double conversion stage type (8), wherein a first A/D conversion stage (10) carries out a first analog/digital conversion of the input signal (V1), to supply at the output a first intermediate binary word (W1) of n bits, and the second A/D conversion stage (16) can be activated selectively to carry out a second analog/digital conversion of a difference signal (VD) correlated to the difference between the input signal (V1) and the value of the first intermediate binary word (W1). The second A/D conversion stage (16) generates at the output a second intermediate binary word (W2) of m bits supplied, with the first intermediate binary word (W1), to an adder (20) generating the binary output word (WT) of n+m bits.
Abstract:
The programming method comprises the steps of applying a programming pulse to a first cell (2) and simultaneously verifying the present threshold value of at least a second cell (2); then verifying the present threshold value of the first cell and simultaneously applying a programming pulse to the second cell. In practice, during the entire programming operation, the gate terminal of both the cells is biased to a same predetermined gate voltage (V PCX ) and the source terminal is connected to ground; the step of applying a programming pulse is carried out by biasing the drain terminal of the cell to a predetermined programming voltage (V P ) and the step OF verifying is carried out by biasing the drain terminal of the cell to a read voltage (V R ) different from the programming voltage. Thereby, switching between the step of applying a programming pulse and verifying is obtained simply by switching the drain voltage of the cells.
Abstract:
The invention relates to a communication system between a first and a second independently clocked devices (L,R), in particular chips, comprising, for each device, at least a transmitter (TXL,TXR) and a receiver (RXL,RXR) connected to each other in a crossed way in correspondence of an inter-chip communication channel (ICC). Advantageously according to the invention, the communication system further comprises a synchronizer (40) in turn including at least a first and a second synchronization block (20L,20R), having respective input terminals (INrL,INrR) connected to the receivers (RXL,RXR) and respective output terminals (OUTtL,OUTtR) connected to the transmitters (TXL,TXR) and comprising at least: - a test pattern generator (23); - comparison means (21,22) to check a matching between stored and received test pattern signals; and - a delay block (26) able to change the clock phases.
Abstract:
The present invention relates to a asynchronous interconnection system (10) comprising a transmitter circuit (11) and a receiver circuit (12) inserted between inserted between respective first and second voltage references (Vcctx, GNDtx - Vccrx, GNDrx) and having respective transmitter and receiver nodes (TX, RX) coupled in a capacitive manner. Advantageously according to the invention, the receiver circuit (12) comprises: - a recovery stage (13) inserted between the first and second voltage references (Vccrx, GNDrx) of the receiver circuit (12) and connected to the receiver node (RX); and - a state control stage (14), in turn inserted between the first and second voltage references (Vccrx, GNDrx) of the receiver circuit (12) connected to the recovery stage (13) correspondence with a first feedback node (X) providing a first control signal (Recovery Enable) and having a second feedback node (Z*) connected in a feedback manner to the recovery stage (13). The recovery stage (13) comprises a first feedback loop (Loop 1) connected to the first feedback node (X) and acting in such a way to recover a received voltage signal and a feedback loop (Loop2) connected to the second feedback node (Z*) of the state control stage (14) and acting in such a way to deactivate the recovery feedback on the receiver node (RX) and guarantee that the receiver node (RX) is let in a high impedance state.
Abstract:
The load pump booster device (1) with transfer and recovery of the charge comprises a charge pump circuit (2) with an output terminal (30.N) which is connected to a load capacitor (12) by means of a load node (50). In turn, the charge pump circuit (2) comprises a plurality of transfer transistors (15.0, ..., 15.j, ..., 15.N) which are connected to one another in series, and define a plurality of transfer nodes (30.0, ..., 30.j, ..., 30.N). Each transfer node (30.0, ..., 30.j, ..., 30.N) is connected to a storage capacitor (14.0, ..., 14.j, ..., 14.N). The booster device (1) also comprises a plurality of controlled switches (40.0, ..., 40.j, ..., 40.N) which are interposed between the said load node (50) and a respective transfer node (30.0, ..., 30.j, ..., 30.N), in order to connect to the said load node (50) a single one of the said transfer nodes (30.0, ..., 30.j, ..., 30.N). By this means, between the load capacitor (12) and the storage capacitors (14.0, ..., 14.j, ..., 14.N) there takes place a phase of transfer of charge followed by a phase of recovery of charge, from the storage capacitors (14.0, ..., 14.j, ..., 14.N) to the load capacitor (12).
Abstract:
The programming method comprises the steps of: a) determining (140) a current value (V eff ) of the threshold voltage (V th ); b) acquiring (100) a target value (V p ) of the threshold voltage; c) calculating (150) a first number of gate voltage pulses necessary to take the threshold voltage from the current value to the target value; d) applying (160) a second number (N2) of consecutive voltage pulses to the gate terminal of the cell, said second number being correlated to the first number and having a uniformly increasing amplitude; e) then measuring (170) a current value (V eff ) of the threshold voltage; and repeating steps c) to e) until a final threshold value is obtained.