公开(公告)号：JPH0323867B2

公开(公告)日：1991-03-29

申请号：JP3157986

申请日：1986-02-14

Applicant: TORAY INDUSTRIES

Inventor： HIRATA HAJIME ,  YAMAZAKI CHIKAYASU

IPC: G01N33/497 ,  A61B5/08 ,  A61B5/083 ,  A61B5/087 ,  G01F1/00

公开(公告)号：JP2002277217A

公开(公告)日：2002-09-25

申请号：JP2001075994

申请日：2001-03-16

Applicant: TORAY INDUSTRIES

Inventor： HIRATA HAJIME ,  ISHIKAWA KOJI ,  TORIKAI JUN

IPC: G01B11/06 ,  B29C47/08 ,  B29C48/92 ,  B29C47/92

Abstract: PROBLEM TO BE SOLVED: To provide a thickness measuring device in which accuracy in the measurement of web thickness is improved and a web manufacturing method in which variations in the thickness of a web is substantially reduced. SOLUTION: A measuring part 7 of a light-interference thickness gauge is made to scan the traveling web W in the widthwise direction of the web to detect wavelengths which indicate a maximum value and a minimum value in a wavelength intensity distribution by the interference between two types of reflected lights I and II at the surface and back surface of the web. The thickness of the web is computed from the wavelengths and the refractive index of the web in the device. The refractive index distribution of the widthwise direction of the web is stored in an operation part 8 of the light- interference thickness gauge, a refractive index corresponding to the scanning location of the measuring part 7 in the widthwise direction of the web is specified from the refractive index distribution, and the thickness of the web is computed through the use of the refractive index.

公开(公告)号：JP2002225116A

公开(公告)日：2002-08-14

申请号：JP2001029379

申请日：2001-02-06

Applicant: TORAY INDUSTRIES

Inventor： NAKAI YASUHIRO ,  UEHARA MASATSUGU ,  HIRATA HAJIME

IPC: B29C48/92 ,  B29C47/92

Abstract: PROBLEM TO BE SOLVED: To provide a method for producing a sheet which can control the thickness of the sheet quickly and precisely to a desired thickness profile and a device for controlling the thickness of the sheet. SOLUTION: In the method for producing the sheet, a raw material is extruded by using a die having N (natural number of 2 or more) thickness adjusting means and molded into the sheet, an operation quantity to be output to the thickness adjusting means is calculated, the means are controlled based on the calculated operation quantity, and the thickness of the sheet is controlled. When the difference between the calculated operation quantity of the i-th (i=1-N) thickness adjusting means and an operation quantity to be output to the adjacent means is a prescribed value T or above, an operation quantity to be output to the i-th means is corrected to reduce the difference, an operation quantity to be output to the adjacent means is corrected based on a process model expressing the relationship between an operation quantity to be output and the thickness of the sheet to be obtained, and each corrected operation quantity is output to each thickness adjusting means.

公开(公告)号：JP2001226870A

公开(公告)日：2001-08-21

申请号：JP2000037905

申请日：2000-02-16

Applicant: TORAY INDUSTRIES

Inventor： UCHINO YOSHITAKA ,  TANAKA HIDEHARU ,  HIRATA HAJIME

IPC: D06H3/08 ,  G01B11/24 ,  G01J3/46 ,  G01N21/952

Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for measuring a yarn, by which the dyed degree and shape characteristics of the yarn can automatically be detected in response to the change in the shape of the yarn, even when the yarn is a largely shape-changed yarn such as an interlaced yarn, a partially untwisted yarn, a partially drawn yarn, or a napped yarn, to provide a device for producing a yarn, characterized by controlling the quality of the yarn under the automatically detected result. SOLUTION: This method for measuring the dyed degree and/or shape characteristic of the yarn, comprising allowing the dyed yarn Y to travel, simultaneously irradiating light L containing visible light and infrared light on the yarn Y from a light-irradiating means 5, receiving the visible light component and the infrared light component contained in the light R scattered from the travelling yarn Y, detecting a dyed degree evaluation value and a shape characteristic evaluation value responded to the change in the shape of the yarn, judging a difference between the dyed degrees in response to the change in the shape of the yarn, and controlling the quality of the yarn on the judged result.

公开(公告)号：JP2000337998A

公开(公告)日：2000-12-08

申请号：JP15338099

申请日：1999-06-01

Applicant: TORAY INDUSTRIES

Inventor： KIMURA KATSUMI ,  SASAMOTO HIROKATA ,  HIRATA HAJIME ,  TAKEDA SHUZO ,  TSUDA TAKAHARU

IPC: H01J9/42 ,  G01M11/00 ,  G09F9/00 ,  G09F9/313 ,  H01J9/227 ,  H01J9/50 ,  H01J11/12 ,  H01J11/22 ,  H01J11/24 ,  H01J11/26 ,  H01J11/34 ,  H01J11/42 ,  H04N17/04 ,  H01J11/02

Abstract: PROBLEM TO BE SOLVED: To provide an inspection apparatus for a phosphor formed on the back plate of a plasma display panel in which even a micro defect, e.g. a point defect, of a phosphor can be detected with high accuracy and highly reliable inspection can be ensured by processing detected information optimally, and a method for manufacturing the back plate of a plasma display panel employing the inspection apparatus. SOLUTION: An apparatus for inspecting the coating state of an RGB phosphor on the back plate of a plasma display panel comprises means 5 for irradiating a specified coating position of an RGB phosphor with UV-rays, an image pickup means 6 including light receiving elements arranged one-dimensionally while having a pixel resolution finer than the RGB arranging interval of a plurality of phosphor layers arranged in parallel on the back plate of a plasma display panel and producing an image signal by detecting emission of light from each specified coating position of an RGB phosphor, and a processing means 8 for determining the coating state of RGB phosphor by operating the image signal from the image pickup means 6 for each pixel and comparing it with a specified reference value.

公开(公告)号：JPH11326238A

公开(公告)日：1999-11-26

申请号：JP6844299

申请日：1999-03-15

Applicant: TORAY INDUSTRIES

Inventor： NAKAI YASUHIRO ,  UKAWA SHUICHI ,  HIRATA HAJIME ,  ITO TETSUYA

IPC: D06H3/08 ,  D04H17/00 ,  G01N21/88 ,  G01N21/89 ,  G01N21/892

Abstract: PROBLEM TO BE SOLVED: To highly accurately detect defects of even a sheet woven irregularly, by arranging sheet polarizers between the sheet to be measured and a light source, a photodetecting part with specific angles in direction of polarization and detecting bright, dark defects on the basis of binarized data of image signals. SOLUTION: This apparatus has a light source 1 and a photodetecting part 3 with a non-woven cloth 4 held therebetween. Sheet polarizers 2a, 2b are arranged between the non-woven cloth 4 and the light source 1 and between the non-woven cloth 4 and the photodetecting part 3 with approximately 70-110 deg. of directions of polarization. A light from the light source 1 passes the sheet polarizer 2a, non-woven cloth 4 and sheet polarizer 2b to be detected at the photodetecting part 3. The detected light is binarized by a binarization process means 6a to larger, smaller signal values (a), (b) (a>b) than a first threshold value, and larger, smaller signals than a second threshold value smaller than the first threshold value are binarized at a binarization process means 6b to values (b), (c) (b>c). The binarized signals are detected by a defect detection means 7 as bright defects if showing the value (a) to an input signal or as dark defects is showing the value (c). The detected defect is marked by 11 at an end part of the non-woven cloth 4.

公开(公告)号：JPH02213767A

公开(公告)日：1990-08-24

申请号：JP3456189

申请日：1989-02-14

Applicant: TORAY INDUSTRIES

Inventor： HIRATA HAJIME ,  NAKAJIMA HIROKI

IPC: G01P5/12 ,  G01F1/68 ,  G01F1/696

Abstract: PURPOSE:To obtain the sensor of a low electric power type which consumes less electric power by impressing a pulse voltage from a power source to a bridge circuit only when a flow velocity is to be measured and detecting a bridge deviation upon lapse of the prescribed time from the point of the time when the impression ends. CONSTITUTION:The sensor 10 has the bridge circuit 11 contg. a heating resistor RH the resistance value of which is the function of temp. The bridge deviation of this bridge circuit 11 is intermittently detected to intermittently measure the flow velocity of fluid. The pulse voltage for heating is impressed from a power source part 12 to the bridge circuit 11 and the bridge deviation is detected by using a detecting means having a differential amplifier 17 and a hold circuit 20. The pulse voltage is impressed from the power source part 12 to the bridge circuit 11 to heat the heating resistor RH only at the time of measuring the flow velocity and the bridge deviation is held and taken in by the hold circuit 20 upon lapse of the prescribed time from the point of the time when the impression of the pulse voltage ends. The taken in bridge deviation is fed to an arithmetic circuit 21, by which the computation is executed and the flow velocity is measured.

公开(公告)号：JPS60263683A

公开(公告)日：1985-12-27

申请号：JP12027484

申请日：1984-06-12

Applicant: TORAY INDUSTRIES

Inventor： HIRATA HAJIME ,  TORIKAI JIYUN ,  YAMAZAKI CHIKAYASU

IPC: B25J9/16 ,  B25J13/08 ,  B25J15/02

公开(公告)号：JP2002365225A

公开(公告)日：2002-12-18

申请号：JP2002065206

申请日：2002-03-11

Applicant: TORAY INDUSTRIES

Inventor： TAKAMURA RYOJI ,  NAKAI YASUHIRO ,  HIRATA HAJIME

IPC: G01B11/30 ,  B65H26/02 ,  G01N21/892 ,  G06T1/00

Abstract: PROBLEM TO BE SOLVED: To provide an inspection method and apparatus of a sheet material for easily detecting wrinkles without any need for patrolling work by a human when detecting the wrinkles being generated when winding up the sheet material in a roll. SOLUTION: As the method for detecting wrinkles S being generated when winding up the sheet material 2 in a roll, light is applied to a roll 3 of the sheet material 2 from either of light sources 4A and 4B, and at the same time the image of the roll 3 is picked up by using a camera 5 where visual field width has been set to a range of 50-500 mm, and the wrinkles S are detected based on the reflection light from the roll 3.

公开(公告)号：JP2002243415A

公开(公告)日：2002-08-28

申请号：JP2001039928

申请日：2001-02-16

Applicant: TORAY INDUSTRIES

Inventor： HIRATA HAJIME ,  ISHIKAWA KOJI

IPC: G01B11/06

Abstract: PROBLEM TO BE SOLVED: To provide a film thickness measuring method by optical interference that can execute measurement with high accuracy even when a measured object has double refraction and an interference spectral spectrum is distorted. SOLUTION: An optical spectrum at a measuring point on a sheet is measured and a wavelength that gives an extreme value of this optical spectrum is then determined. An estimated film thickness is determined and an interference order of the wavelength that gives the extreme value of the optical spectrum is then determined. A film thickness of a sheet is calculated based on the wavelength that gives the extreme value and the interference order.