公开(公告)号：EP3055657A1

公开(公告)日：2016-08-17

申请号：EP14793361.8

申请日：2014-10-09

Applicant: LI-COR, INC.

Inventor： KOULIKOV, Serguei

IPC: G01J3/42

CPC classification number: G01J3/027 ,  G01J3/42 ,  G01J3/45 ,  G01N21/41 ,  G01N2021/391 ,  G01N2021/399

Abstract: Systems and methods for controlling the optical path length between a feedback enabled laser and a cavity, and hence the optical feedback phase. A phasor element (20), positioned along an optical path (12) between the laser (1) and the cavity coupling mirror (5), includes a gas medium within a volume defined by the phasor element. The phasor element is configured to adjust or control an optical path length of the laser light between the laser and the cavity coupling mirror by adjusting or controlling a density of the gas medium within the phasor volume.

公开(公告)号：EP2943780A2

公开(公告)日：2015-11-18

申请号：EP14700112.7

申请日：2014-01-09

Applicant: International Moisture Analysers Limited

Inventor： STOCKWELL, Paul ,  WIDDUP, David ,  FOSTER, Michael ,  STOREY, Jonathan

IPC: G01N21/85

CPC classification number: G01N21/45 ,  G01J3/4412 ,  G01J3/45 ,  G01N21/65 ,  G01N21/85 ,  G01N21/8507

Abstract: An optical chemical analyser comprises a source of a first amount of radiation (46), an optics module configured to direct the first amount of radiation such that it is incident on or passes though a target (14) at a target location, the optics module further being configured to receive a second amount of Raman scattered radiation from the target and direct the second amount of radiation (206) to a Spatial Interference Fourier Transform (SIFT) module, the SIFT module including a first dispersive element (216) and a second dispersive element (218), the SIFT module being configured such that a portion of the second amount of radiation is received by the first dispersive element and interferes with a portion of the second amount of radiation received by the second dispersive element to form an interference pattern; the SIFT module further comprising a detector (48) configured to capture an image of at least a portion of the interference pattern and produce a detector signal (226) based on the captured image; and a processor configured to receive the detector signal from the detector and perform a Fourier transform on the detector signal to thereby obtain a frequency spectrum of the second amount of radiation.

公开(公告)号：EP2676109A4

公开(公告)日：2015-04-29

申请号：EP12747871

申请日：2012-02-14

Applicant: LUXMUX TECHNOLOGY CORP

Inventor： DATTNER YONATHAN ,  YADID-PECHT ORLY

IPC: G01J3/12 ,  G01J3/433 ,  G01J3/44 ,  G02B6/12 ,  G02B27/10 ,  H01L31/16

CPC classification number: G01J3/45 ,  C08L79/08 ,  G01J3/0259 ,  G01J3/44 ,  G01J3/4531 ,  G02B6/125 ,  G02B6/13 ,  G02B6/29344 ,  G02B6/2935

公开(公告)号：EP2843382A1

公开(公告)日：2015-03-04

申请号：EP13781106.3

申请日：2013-04-23

Applicant: Inter-University Research Institute Corporation, National Institutes of Natural Sciences

Inventor： FUJI, Takao ,  NOMURA, Yutaka

IPC: G01J11/00 ,  G01J9/00

CPC classification number: G01J11/00 ,  G01J3/2823 ,  G01J3/45 ,  G01J9/00 ,  G01J9/02 ,  G01J9/0246

Abstract: Provided are a method and an apparatus for measuring the spectral intensity and phase of a light pulse having an arbitrary time duration. The apparatus is characterized in that it includes: a nonlinear mixing means for generating a signal light pulse expressed by the following Formula (★ denotes an operator representing general nonlinear mixing, and α denotes a coefficient which is proportional to a nonlinear susceptibility in the nonlinear mixing) by nonlinearly mixing a reference light pulse having an electric field E r (t-τ) delayed by an optical delay means and a measurement target light pulse having an electric field E 0 (t); and E r ⁢ t - τ + αE r ⁢ t - τ * E 0 t an imaging spectrum device for spectrally splitting the signal light pulse and outputting a Fourier transform signal expressed by the following Formula (F denotes a symbol indicating Fourier transform, * denotes a complex conjugate, and R denotes a symbol indicating a real part), F ⁢ E r ⁢ t - τ 2 + αF ⁢ E r ⁢ t - τ * E 0 t 2 + 2 ⁢ R αF ⁢ E r ⁢ t - τ * ⋅ F ⁢ E r ⁢ t - τ * E 0 t wherein the intensity and phase of the measurement target light pulse are obtained from a signal (frequency resolved optical gate signal) of the second term of the Fourier transform signal and a signal (electro-optical sampling signal) of the third term of the Fourier transform signal.

Abstract translation: 提供了一种用于测量具有任意持续时间的光脉冲的光谱强度和相位的方法和装置。 该装置的特征在于它包括：用于产生由下列公式表示的信号光脉冲的非线性混合装置（〜表示一般非线性混合的运算符，±表示与非线性混合中的非线性磁化率成正比的系数 ）通过非线性地混合具有由光延迟装置延迟的电场E r（t-Ä）的参考光脉冲和具有电场E 0（t）的测量目标光脉冲; 和用于频谱分割信号光脉冲并输出由以下公式表示的傅立叶变换信号的成像光谱装置（F表示表示傅里叶变换的符号）的成像光谱装置，以及E r ¢t-Ä+±E r ¢ 变换，*表示复共轭，R表示表示实部的符号），F ¢E r ¢t - Ä2 +±F ¢E r ¢t - Ä* E 0 t 2 + 2 ¢R±F ¢E r ¢tÄ*

公开(公告)号：EP1649244B1

公开(公告)日：2014-10-22

申请号：EP04777419.5

申请日：2004-06-29

Applicant: Cymer, Inc.

Inventor： RAFAC, Robert, J.

IPC: G01J1/42 ,  G02B9/02

CPC classification number: G01J1/4257 ,  G01J1/0228 ,  G01J3/02 ,  G01J3/027 ,  G01J3/28 ,  G01J3/45

公开(公告)号：EP2764348A1

公开(公告)日：2014-08-13

申请号：EP12775800.1

申请日：2012-10-01

Applicant: Aircelle

Inventor： GAY, Lionel ,  CHOPARD, Thibaud ,  LEFEU, Odile ,  JOUBERT, Frédéric

IPC: G01N21/95

CPC classification number: G01J3/45 ,  G01N21/3563 ,  G01N21/95 ,  G01N29/041 ,  G01N29/12 ,  G01N2021/3595 ,  G01N2021/8472 ,  G01N2201/0221 ,  G01N2291/0231 ,  G01N2291/2694

Abstract: This method for the non-destructive inspection of a part (1) made from an organic-matrix composite material (CMO), comprises steps consisting of: a) carrying out a surface inspection of said part (1) by Fourier transform infrared spectroscopy (FTIR) (15), b) if step a) reveals a fault, carrying out in-depth inspections of said material according to two additional ultrasound techniques (21, 25).

公开(公告)号：EP2702376A1

公开(公告)日：2014-03-05

申请号：EP12718601.3

申请日：2012-04-27

Applicant: Menlo Systems GmbH ,  Ecole Polytechnique Fédérale de Lausanne (EPFL)

Inventor： KIPPENBERG, Tobias ,  HOLZWARTH, Ronald

IPC: G01J3/42 ,  G01J3/453 ,  G02B6/12 ,  G01J3/457

CPC classification number: G01J3/45 ,  G01J3/42 ,  G01J3/4531 ,  G01J3/4532 ,  G01J3/457 ,  G02B6/12007 ,  G02B6/29338 ,  G02B6/29353

Abstract: The invention relates to a spectroscopy array having a first and a second optical ring resonator (1, 3), each provided with a material having an intensity-dependent refraction index. The spectroscopy array further comprises at least one waveguide (2, 4, 7, 8), which is guided along the optical ring resonator at a distance such that the light of a continuous beam laser (2b, 4b, 20) guided in the waveguide (2, 4, 7) can be coupled into the optical ring resonator (1, 3), and a frequency comb generated from the light of the continuous beam laser in the optical ring resonator can be coupled out of the waveguide (2, 4, 8). The optical ring resonators (1, 3) and the at least one waveguide (2, 4, 7, 8) are provided on a shared substrate (9).

公开(公告)号：EP2606324A1

公开(公告)日：2013-06-26

申请号：EP11817586.8

申请日：2011-08-19

Applicant: NewSouth Innovations Pty Limited

Inventor： HARB, Charles, Charbel ,  SPENCE, Thomas, Gary ,  BOYSON, Toby, Kristian

IPC: G01J3/42 ,  G01J3/433 ,  G01N21/00

CPC classification number: G01N21/59 ,  G01J3/42 ,  G01J3/4338 ,  G01J3/45 ,  G01N21/31 ,  G01N21/39 ,  G01N2021/3595 ,  G06F17/00

Abstract: Systems and methods for analysing a time-domain signal are described. The method comprising: in a mixer (150), mixing the time-decay signal (115) with a local oscillator signal (122) generated by a local oscillator (120), resulting in a mixed signal from which a Fourier transformed time-decay signal is generated comprising a fundamental transformed time decay signal at the fundamental frequency of the local oscillator signal (122) and a plurality of transformed time-decay signals at a plurality of frequencies; and determining the magnitude of each of the transformed time-decay signals at the fundamental frequency and at a frequency other than the fundamental frequency.

公开(公告)号：EP2598851A2

公开(公告)日：2013-06-05

申请号：EP11813160.6

申请日：2011-07-28

Applicant: Aidi Corporation ,  Gunma University

Inventor： OKAMOTO, Katsunari ,  TAKADA, Kazumasa

IPC: G01J3/02 ,  G06F17/14

CPC classification number: G01J3/4531 ,  G01J3/45 ,  G01J3/4532

Abstract: A transform spectrometer measurement apparatus and method for a planar waveguide circuit (PLC). The spectrometer typically includes an input optical signal waveguide carrying an input optical signal; a plurality of couplers, each connected to the input optical signal waveguide, and each including a coupler output for carrying a coupled optical signal related to the input optical signal; and an array of interleaved, waveguide Mach-Zehnder interferometers (MZI), each having at least one input MZI waveguide, each MZI input waveguide receiving a coupled optical signal from a respective coupler output. A phase shifting circuit is applied to at least one arm of the MZIs to induce an active phase shift on the arm to thereby measure phase error in the MZIs. Light output from the MZIs is measured under intrinsic phase error conditions and after an active phase shift by the phase shifting circuit.

公开(公告)号：EP2591389A1

公开(公告)日：2013-05-15

申请号：EP11738662.3

申请日：2011-07-08

Applicant: LLtech Management

Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

IPC: G02B21/00 ,  G02B9/02

CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B2562/046 ,  G01B9/02048 ,  G01B9/02057 ,  G01B11/2441 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/10 ,  G01J3/2823 ,  G01J3/45 ,  G02B21/14

Abstract: A device for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample includes an imaging interferometer of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample. The invention also relates to a processing unit that processes the interferometric images, a unit for axially displacing the interferometer relative to the sample for the acquisition of tomographic images for slices at different depths of the sample, and a unit for varying the magnification of the imaging interferometer for the acquisition of interferometric images of a slice for different magnification values.