公开(公告)号：EP2883290A2

公开(公告)日：2015-06-17

申请号：EP13759452.9

申请日：2013-08-07

Applicant: FAZ Technology Limited

Inventor： IBRAHIM, Selwan ,  O'DOWD, John ,  FARNAN, Martin ,  MAHER, Roger ,  FARRELL, Tom ,  DUNNE, John

IPC: H01S5/0687 ,  G01K11/32 ,  G01L1/24 ,  G01D5/353 ,  G01B11/16 ,  H01S5/06 ,  H01S5/12 ,  H01S5/00

CPC classification number: G01J3/027 ,  G01B11/18 ,  G01D5/35335 ,  G01J3/1895 ,  G01J3/45 ,  G01K11/3206 ,  G01L1/246 ,  H01S5/0014 ,  H01S5/0617 ,  H01S5/0687 ,  H01S5/1209

Abstract: The invention provides a dynamically swept tunable laser system and method for measuring sensor characteristics obtained from an array of optical sensors comprising means for dividing the total wavelength sweep of the laser into different regions in any particular order where each region contains single or multiple contiguous sweep segments and where each sweep segment is referenced by a start and a stop reference and can have different lengths compared to the other sweep segments. The sensor characteristics are determined from each region swept by the tunable laser. The invention provides for the tunable laser to be adapted to operate in a quasi-continuous mode to select segments in any order. The relative sweep rates of regions can be changed such that some regions can be swept more times than other regions.

公开(公告)号：EP2870442A1

公开(公告)日：2015-05-13

申请号：EP13826108.6

申请日：2013-08-01

Applicant: Institut National De La Recherche Scientifique

Inventor： SHARMA, Gargi ,  SINGH, Kanwarpal ,  MORANDOTTI, Roberto ,  OZAKI, Tsuneyuki

IPC: G01J3/45

CPC classification number: G01J3/45 ,  G01J3/108 ,  G01J3/453 ,  G01J11/00

Abstract: A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately
8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (
π/2 ).

公开(公告)号：EP2793329A1

公开(公告)日：2014-10-22

申请号：EP12856468.9

申请日：2012-11-27

Applicant: Konica Minolta, Inc.

Inventor： HIRAO, Yusuke

IPC: H01S5/022 ,  G01J3/10 ,  G01J3/45 ,  H01S5/024 ,  H01S5/183

CPC classification number: H01S5/024 ,  G01B9/02001 ,  G01J3/10 ,  G01J3/45 ,  G01J5/061 ,  H01S5/02212 ,  H01S5/02248 ,  H01S5/02415 ,  H01S5/06804 ,  H01S5/183

Abstract: An optical semiconductor package includes an optical semiconductor device, a temperature detection unit, and a temperature control unit (46) including a support member (46S), the optical semiconductor device and the temperature detection unit being arranged such that a temperature of a portion (P44) of a surface of the support member (46S) where the optical semiconductor device is arranged and a temperature of a portion (P45) of the surface of the support member (46S) where the temperature detection unit is arranged are substantially in thermal equilibrium with each other.

Abstract translation: 光学半导体封装包括光学半导体器件，温度检测单元和包括支撑构件（46S）的温度控制单元（46），所述光学半导体器件和温度检测单元被布置成使得部分 P44），其中配置有光学半导体器件的支撑部件（46S）的表面的温度和布置有温度检测单元的支撑部件（46S）的表面的部分（P45）的温度基本上处于热平衡 与对方

公开(公告)号：EP2748587A1

公开(公告)日：2014-07-02

申请号：EP12826303.5

申请日：2012-08-27

Applicant: The General Hospital Corporation ,  The UAB Research Foundation

Inventor： ROWE, Steven, M. ,  TEARNEY, Guillermo, J. ,  BOUMA, Brett, Eugene ,  LIU, Linbo ,  SORSCHER, Eric, J. ,  CHU, Kengyeh, Ken ,  DIEPHUIS, Bradford, James ,  WILSTERMAN JR., Eric, James ,  DIERKSEN, Gregory, Andrew

IPC: G01N21/63 ,  A61B6/03 ,  G01N33/483

CPC classification number: G01N21/17 ,  G01B9/02044 ,  G01B9/0205 ,  G01B9/02091 ,  G01J3/45 ,  G01J9/02 ,  G01N15/0205 ,  G01N15/14 ,  G01N21/35 ,  G01N21/45 ,  G01N21/4788 ,  G01N21/4795 ,  G01N21/6458 ,  G01N21/6486 ,  G01N29/00 ,  G01N2021/653 ,  G01N2021/655

Abstract: Exemplary apparatus and method can be provided for obtaining data regarding a plurality of samples. For example, using at least one arrangement, it is possible to receive interferometric information that is based on radiations provided from a reference and the samples that are provided in respective chambers. Alternatively and/or in addition, based on the interferometric information, it is possible to discriminate between agents to identify a particular agent that affects a particular function within at least one of the samples.

公开(公告)号：EP2589940A1

公开(公告)日：2013-05-08

申请号：EP11801209.5

申请日：2011-06-07

Applicant: Stroganov, Alexander Anatolyevich ,  Belash, Alexandr Olegovich ,  Bogachev, Dmitrii Lvovich ,  Senichenkov, Vasilii Andreevich

Inventor： Stroganov, Alexander Anatolyevich ,  Belash, Alexandr Olegovich ,  Bogachev, Dmitrii Lvovich ,  Senichenkov, Vasilii Andreevich

IPC: G01J3/26

CPC classification number: G01J3/45 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/4531 ,  G01J3/4532

Abstract: The reported invention belongs to spectral interference devices and can be used for spectral research in various fields of technology.
The objective of the present invention is to improve the optical characteristics of the spectrometer in which reduced loss of light from the radiation object on aberration is attained with a minimum number of optical elements produced at lower costs.
The objective is achieved by the fact that the static Fourier spectrometer contains an input collimator optically coupled with the interferometric unit consisting of a beam splitter and at least two mirrors installed with the ability to create an interference image localized in the plane of the mirrors, and an image recording device optically coupled with the interferometric unit by means of the projective system with the ability to project the figure of the indicated interference image on the image recording device. Besides, the projective system includes a spherical mirror and an objective lens centered against the normal line to the optical surface of the mirror. The mirror and the objective lens are produced to enable optical radiation to pass through the objective lens from the interferometric unit to the spherical mirror, being reflected from it and passing through the same objective lens to the recording device. 4IL.

Abstract translation: 报道的发明属于光谱干扰装置，可用于各种技术领域的光谱研究。 本发明的目的是提高光谱仪的光学特性，其中以较低的成本产生最小数量的光学元件来获得来自辐射物体的像差的光的损失。 目的是通过静态傅立叶光谱仪包含与由分束器组成的干涉测量单元光学耦合的输入准直器和至少两个安装有能够产生位于反射镜平面中的干涉图像的反射镜的输入准直器来实现的，以及 借助于投影系统与干涉测量单元光学耦合的图像记录装置，其能够将所指示的干涉图像的图形投影到图像记录装置上。 此外，投影系统包括球面镜和以镜子的光学表面的法线为中心的物镜。 产生镜子和物镜，以使得光学辐射能够从干涉测量单元通过物镜从球面镜反射并通过相同的物镜到达记录装置。 4IL。

公开(公告)号：EP2526374A1

公开(公告)日：2012-11-28

申请号：EP11735315.1

申请日：2011-01-24

Applicant: Duke University

Inventor： WAX, Adam ,  GRAF, Robert, N. ,  ROBLES, Francisco, E.

IPC: G01B9/02

CPC classification number: G01J3/453 ,  G01B9/02044 ,  G01B9/02084 ,  G01B9/02087 ,  G01B9/02091 ,  G01J3/45 ,  G01J2003/4538 ,  G01N21/49

Abstract: Current apparatuses and methods for analysis of spectroscopic optical coherence tomography (SOCT) signals suffer from an inherent tradeoff between time (depth) and frequency (wavelength) resolution. In one non-limiting embodiment, multiple or dual window (DW) apparatuses and methods for reconstructing time-frequency distributions (TFDs) that applies two windows that independently determine the optical and temporal resolution is provided. For example, optical resolution may relate to scattering information about a sample, and temporal resolution may be related to absorption or depth related information. The effectiveness of the apparatuses and methods is demonstrated in simulations and in processing of measured OCT signals that contain fields which vary in time and frequency. The DW technique may yield TFDs that maintain high spectral and temporal resolution and are free from the artifacts and limitations commonly observed with other processing methods.

公开(公告)号：EP2475970A1

公开(公告)日：2012-07-18

申请号：EP10755038.6

申请日：2010-09-08

Applicant: SI-Ware Systems

Inventor： KHALIL, Diaa A. ,  MORTADA, Bassem ,  NABIL, Mohamed ,  MEDHAT, Mostafa ,  SAADANY, Bassam A.

IPC: G01J3/02 ,  G01J3/45 ,  G01J3/453

CPC classification number: G01J3/4532 ,  G01J3/02 ,  G01J3/021 ,  G01J3/45

Abstract: A Micro Electro-Mechanical System (MEMS) spectrometer architecture compensates for verticality and dispersion problems using balancing interfaces. A MEMS spectrometer/interferometer includes a beam splitter formed on a first surface of a first medium at an interface between the first medium and a second medium, a first mirror formed on a second surface of the first medium, a second mirror formed on a third surface of the first medium and balancing interfaces designed to minimize both a difference in tilt angles between the surfaces and a difference in phase errors between beams reflected from the first and second mirrors.

公开(公告)号：EP2284510B1

公开(公告)日：2012-03-14

申请号：EP10170621.6

申请日：2010-07-23

Applicant: Thales

Inventor： Buisson, Christophe ,  Simeoni, Denis ,  Astruc, Patrick ,  Degrelle, Cyril

IPC: G01J3/45 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/4531

公开(公告)号：EP2399098A1

公开(公告)日：2011-12-28

申请号：EP09840534.3

申请日：2009-02-23

Applicant: Dimensional Photonics International, Inc.

Inventor： DILLON, Robert F. ,  JUDELL, Neil H. K. ,  FILLION, Timothy I. ,  SINGH, Gurpreet ,  WALLACE, Nathan E.

IPC: G01B11/25 ,  G01B11/24

CPC classification number: G02B26/06 ,  G01B11/2441 ,  G01B11/2527 ,  G01J3/0229 ,  G01J3/26 ,  G01J3/45 ,  G02B5/32 ,  G02B21/361 ,  G02B27/0068 ,  G02B27/0087 ,  G02B2207/117 ,  G06T2200/04 ,  G06T2200/08

Abstract: Described are a method and apparatus for high-speed phase shifting of an optical beam. A transparent plate having regions of different optical thickness is illuminated by an optical beam along a path of incidence that extends through the regions. The transparent plate can be moved or the optical beam can be steered to generate the path of incidence. The optical beam exiting the transparent plate has an instantaneous phase value according to the region in which the optical beam is incident. Advantageously, the phase values are repeatable and stable regardless of the location of incidence of the optical beam within the respective regions, and phase changes at high modulation rates are possible. The method and apparatus can be used to modulate a phase difference of a pair of coherent optical beams such as in an interferometric fringe projection system.

Abstract translation: 描述了用于光束的高速相移的方法和装置。 具有不同光学厚度的区域的透明板被沿着穿过该区域的入射路径的光束照射。 可以移动透明板，或者使光束转向以产生入射路径。 离开透明板的光束根据光束入射的区域具有瞬时相位值。 有利地，无论光束在各个区域内的入射位置如何，相位值是可重复和稳定的，并且在高调制速率下的相位变化是可能的。 该方法和装置可用于调制一对相干光束的相位差，例如在干涉条纹投影系统中。

公开(公告)号：EP2284510A1

公开(公告)日：2011-02-16

申请号：EP10170621.6

申请日：2010-07-23

Applicant: Thales

Inventor： Buisson, Christophe ,  Simeoni, Denis ,  Astruc, Patrick ,  Degrelle, Cyril

IPC: G01J3/45 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/4531

Abstract: L'interféromètre statique comporte une pupille d'entrée, une lame séparatrice, un premier miroir et un second miroir agencés de façon à ce que des faisceaux lumineux provenant d'une source collimatée se divisent sur la lame séparatrice, se réfléchissent sur chacun des miroirs et se recomposent en interférant en sortie de l'interféromètre.
L'interféromètre comporte une lame prismatique d'indice n comportant une épaisseur e j variable, le premier faisceau traversant la lame prismatique avant de se réfléchir sur une surface réfléchissante du premier miroir, la surface réfléchissante comportant une pluralité de zones, chaque zone j étant située à une distance moyenne Δ j d'un plan de référence. Le plan de référence étant perpendiculaire à un axe optique et correspondant à une position d'un miroir plan pour laquelle la différence de marche entre les deux faisceaux réfléchis interférant est nulle, chaque épaisseur e j étant sensiblement égale à Δ j · n/(n-1).

Abstract translation: 干涉仪具有可变厚度的折射率棱镜板（40），以及在反射到楼梯反射镜（M1）的反射表面之前通过该板的光束。 表面具有位于距基准平面（5）的平均距离（DELTAj）的区域。 平面垂直于光轴，并且对应于干涉反射光束之间的光程差为零的平面镜的位置。 反射镜和板被定位成使得厚度等于距离和折射率与折射率乘积之比减去1。