公开(公告)号：EP3516630B1

公开(公告)日：2024-09-18

申请号：EP17854031.6

申请日：2017-09-22

IPC: G06T19/00 ,  G02B27/01 ,  G06F3/01 ,  A61B5/00 ,  A61B5/1455 ,  A61B5/11 ,  G01J3/02 ,  G01J3/10 ,  G01J3/42 ,  G01J3/427 ,  G01N21/359 ,  G01N33/483 ,  G02B27/00 ,  G06F3/03 ,  G01J3/28

CPC classification number: G01J3/0248 ,  A61B5/0075 ,  A61B5/14551 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/10 ,  G01J3/42 ,  A61B5/1114 ,  A61B5/1121 ,  A61B5/6803 ,  G06F3/011 ,  G06F3/0304 ,  G02B27/017 ,  G02B2027/018720130101 ,  G02B27/0093 ,  G01J3/108 ,  G01J3/427 ,  G01J2003/10620130101 ,  G01J2003/282620130101 ,  G01N21/359 ,  G01N33/483 ,  G02B2027/013820130101 ,  G02B2027/01420130101 ,  G06F3/012 ,  G06F3/013 ,  A61B5/14555 ,  A61B5/0077 ,  A61B2090/36520160201 ,  A61B2017/0021620130101 ,  A61B2090/30920160201

公开(公告)号：EP4426185A1

公开(公告)日：2024-09-11

申请号：EP22813187.6

申请日：2022-10-31

Applicant: trinamiX GmbH

Inventor： HANKE, Michael ,  LOVRINCIC, Robert ,  PROELL, Florian

IPC: A61B5/00 ,  G16H20/10 ,  G16H20/30 ,  G16H20/70 ,  G16H40/63 ,  G16H50/20 ,  G16H50/30 ,  G16H50/70

CPC classification number: A61B5/441 ,  A61B5/0075 ,  A61B5/7267 ,  A61B5/7239 ,  A61B5/725 ,  G16H50/30 ,  G16H40/63 ,  G16H50/20 ,  G16H50/70 ,  G16H20/10 ,  G16H20/30 ,  G16H20/70 ,  A61B5/0022 ,  G01J3/108 ,  G01J2003/283320130101 ,  G01J3/28

公开(公告)号：EP4411831A1

公开(公告)日：2024-08-07

申请号：EP23305143.2

申请日：2023-02-03

Applicant: Centre national de la recherche scientifique ,  Ecole Normale Supérieure de Paris ,  SORBONNE UNIVERSITE ,  Université Paris Cité

Inventor： PALOMO, José ,  MICICA, Martin ,  DHILLON, Sukhdeep

IPC: H01L31/0224 ,  G01J3/10 ,  G01N21/3586 ,  H01L31/0232 ,  H01L31/08 ,  H01L31/09 ,  H01L33/00

CPC classification number: G01J3/108 ,  G01N21/3586 ,  H01L31/0224 ,  H01L31/02327 ,  H01L31/08 ,  H01L31/09

Abstract: A digitated photoconductive antenna (10) to generate and/or detect terahertz radiation, the photoconductive antenna comprising a substrate (SB) made of a compound semiconductor, and comprising a plurality of digitated electrodes (DE) and two contact pads (CP) on the front face of the substrate (SB), characterized in that :
- it comprises a metallization layer (ML) being made on said front surface of the substrate (SB) for said digitated electrodes (DE) and said contact pads (CP),
- said digitated electrodes (DE) are equally spaced by a distance Δ, each digitated electrode being linked to another digitated electrode by a portion of said metallization layer called integrated resistance (IR) and presenting an intrinsic electrical resistance
- each contact pad is linked to a respective digitated electrode by a part (MP) of said metallization layer such that said contact pads are adapted to apply a voltage across said digitated electrodes.

公开(公告)号：EP4388296A1

公开(公告)日：2024-06-26

申请号：EP22858934.7

申请日：2022-07-27

Applicant: SPECTRONIX LTD.

Inventor： BEN-ADERET, Yossi ,  SHEINTOP, Uzziel

IPC: G01N21/25 ,  G01N21/31 ,  G01N21/33 ,  G01N21/3504 ,  G01N21/359

CPC classification number: G01N33/241 ,  G01N33/0063 ,  G01N21/3504 ,  G01N2021/351320130101 ,  G01J3/42 ,  G01J3/108 ,  G01J5/0014

公开(公告)号：EP4139642B1

公开(公告)日：2024-05-08

申请号：EP21722385.8

申请日：2021-04-21

IPC: G01J3/10 ,  H01L33/50 ,  G01J3/02

CPC classification number: G01J3/10 ,  G01J3/108 ,  H01L33/504 ,  G01J3/0256 ,  H01L33/502

公开(公告)号：EP3112844B1

公开(公告)日：2018-09-19

申请号：EP16176083.0

申请日：2016-06-24

Applicant: Agilent Technologies, Inc.

Inventor： Ghetler, Andrew ,  Kleczewski, Adam ,  Tella, Richard P.

IPC: G01N21/27 ,  G01J3/42 ,  G01N21/3563 ,  G01N21/55 ,  G01J3/02 ,  G01J3/10 ,  G01J3/28 ,  G01N21/47

CPC classification number: G01J3/0297 ,  G01J3/10 ,  G01J3/108 ,  G01J3/2823 ,  G01J3/42 ,  G01N21/274 ,  G01N21/276 ,  G01N21/3563 ,  G01N21/4785 ,  G01N21/55 ,  G01N2201/101 ,  G01N2201/1042 ,  G01N2201/127

Abstract: A method and apparatus for obtaining reference samples, i.e. measuring reference targets (62) on a reference stage (61) during the generation of a mid-infrared (MIR) image without requiring that a sample specimen (16), being placed on a specimen stage (57) and imaged, be removed is disclosed. A tunable MIR laser (11) generates a light beam (18) that is focused onto the sample specimen on the specimen stage that moves the specimen in a first direction (33). An optical assembly includes a scanning assembly (31) having a focusing lens (55) and a mirror (56) that moves in a second direction (32), different from the first direction, relative to the specimen stage. A light detector (13) measures an intensity of light leaving the point on the specimen. A controller (39) forms an image from the measured intensity. The reference stage (61) is positioned such that the scanning assembly moves over the reference stage in response to a command so that the controller can also make a reference measurement.

公开(公告)号：EP3315929A1

公开(公告)日：2018-05-02

申请号：EP17198638.3

申请日：2017-10-26

Applicant: Teknologian Tutkimuskeskus VTT Oy

Inventor： BLOMBERG, Martti ,  KATTELUS, Hannu

IPC: G01J5/04 ,  G01J3/02 ,  G01J3/10 ,  G01J5/02 ,  G01J5/06 ,  G01J5/52

CPC classification number: G01J3/108 ,  G01J3/0256 ,  G01J3/0286 ,  G01J5/024 ,  G01J5/046 ,  G01J5/061 ,  G01J5/522 ,  G01J2005/063 ,  G01N21/35 ,  H01L51/529 ,  H05B3/20

Abstract: A layered infrared emitter structure includes only semi-transparent metal layers, preferably one semi-transparent metal layer (15), and one or more dielectric layers (11, 12, 13, 14, 16, 17) on both sides of the semi-transparent metal layer (15). Further, an electric heating wiring (20) is arranged in or between any of the dielectric layers (11) to heat the semi-transparent metal layer (15) up to a required infrared emission temperature, preferably to a temperature within a range from 400°C to 1000 °C.

Abstract translation: 层状红外发射器结构仅包括半透明金属层，优选一个半透明金属层（15），以及在半透明金属层（15）的两侧上的一个或多个介电层（11,12,13,14,16,17） 透明金属层（15）。 此外，在任何介电层（11）中或任何介电层（11）之间布置电加热布线（20），以将半透明金属层（15）加热至所需的红外发射温度，优选加热至400 °C至1000°C。

公开(公告)号：EP3285053A1

公开(公告)日：2018-02-21

申请号：EP15889210.9

申请日：2015-04-16

Applicant: Shimadzu Corporation

Inventor： KAMIKAKE, Tadafumi

IPC: G01J3/45

CPC classification number: G01J3/4535 ,  G01J3/108 ,  G01J3/45 ,  G01J2003/2866 ,  G01N2021/3595

Abstract: Disclosed is a Fourier transform spectroscope having a control interferometer capable of facilitating optical axis adjustment and miniaturization by reducing the number of optical elements. Using a first reflection mirror 131 provided with a reflection surface 131a configured to reflect measurement light emitted from a measurement light source 110 toward a beam splitter 140 and a first through-hole 131b extending along an optical axis direction of the measurement light reflected on the reflection surface 131a and a laser light source holding portion configured to hold a laser light source 120 such that laser light emitted from the laser light source 120 is incident to the beam splitter 140 through the first through-hole 131b, optical axes of the measurement light and the laser light are aligned with each other. Since a laser reflection mirror for aligning the optical axes of the measurement light and the laser light of the related art is not necessary, it is possible to reduce the number of parts and facilitate optical axis adjustment and miniaturization.

Abstract translation: 公开了一种具有控制干涉仪的傅立叶变换分光镜，该控制干涉仪能够通过减少光学元件的数量来促进光轴调整和小型化。 使用第一反射镜131，该第一反射镜131设置有反射表面131a，该反射表面131a被配置为将从测量光源110发射的测量光反射向分束器140;以及第一通孔131b，沿着在反射处反射的测量光的光轴方向 表面131a和激光光源保持部分，激光光源保持部分被配置为保持激光光源120，使得从激光光源120发射的激光通过第一通孔131b入射到光束分离器140，测量光的光轴和 激光彼此对齐。 由于不需要用于对准现有技术的测量光和激光的光轴的激光反射镜，所以可以减少部件的数量并且有助于光轴调整和小型化。

公开(公告)号：EP3274674A2

公开(公告)日：2018-01-31

申请号：EP16704535.0

申请日：2016-01-29

Applicant: SI-Ware Systems

Inventor： KHALIL, Diaa ,  SAADANY, Bassam, A. ,  SABRY, Yasser, M. ,  FATHY REZK THABET MOHAMED, Alaa Eldeen

IPC: G01J3/453 ,  G01J3/02 ,  G01J3/26

CPC classification number: G01J3/45 ,  G01J3/0256 ,  G01J3/108 ,  G01J3/26 ,  G01J3/453 ,  G01J3/4531 ,  G01J3/4532 ,  G01J3/4535

Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.

公开(公告)号：EP3106858A4

公开(公告)日：2017-10-18

申请号：EP15748745

申请日：2015-01-07

Applicant: HITACHI HIGH-TECHNOLOGIES CORP

Inventor： SHIMURA KEI

IPC: G01N21/3581

CPC classification number: G01N21/3581 ,  G01J1/4228 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0224 ,  G01J3/108 ,  G01J3/2803 ,  G01J3/42 ,  G01J3/4338

Abstract: Provided are an imaging method and device for imaging using far infrared light that make it possible to quickly image a subject without producing damage or a non-linear phenomenon in the subject. A variable-frequency coherent light source is used, illumination light from the light source is irradiated onto a linear area on an imaging subject, transmitted or reflected light is used to form an image of the imaging subject, a non-linear optical crystal is used for wavelength conversion, and a one-dimensional or two-dimensional array sensor is used to image the imaging subject while the imaging subject is moved in at least one direction.