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公开(公告)号：WO2016153599A2
公开(公告)日：2016-09-29
申请号：PCT/US2016/015819
申请日：2016-01-29
Applicant: SI-WARE SYSTEMS
Inventor： KHALIL, Diaa , SAADANY, Bassam, A. , SABRY, Yasser, M.
CPC classification number: G01J3/45 , G01J3/0256 , G01J3/108 , G01J3/26 , G01J3/453 , G01J3/4531 , G01J3/4532 , G01J3/4535
Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.
Abstract translation: 具有增加的光学吞吐量和/或光谱分辨率的光谱仪包括并联耦合的多个干涉仪。 光分路器将源光束分成多个输入光束，并将每个输入光束引导到多个干涉仪中的相应一个。 一个或多个检测器被光学耦合以从多个干涉仪中的每一个接收相应的输出，并且被配置为检测作为输出结果产生的干涉图。
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公开(公告)号：WO2017011269A2
公开(公告)日：2017-01-19
申请号：PCT/US2016/041357
申请日：2016-07-07
Applicant: SI-WARE SYSTEMS
Inventor： SABRY, Yasser, M. , KHALIL, Diaa , BOUROUINA, Tarik, E. , ANWAR, Momen
CPC classification number: H01L49/00 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0237 , G01J3/0245 , G01J3/108 , G01J3/26 , G01J3/42 , H01K1/04 , H01K1/14
Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.
Abstract translation: 提供由诸如黑色硅的无序半导体材料产生的光辐射源。 光辐射源包括半导体衬底，在半导体衬底中蚀刻的无序半导体结构和设置在无序半导体结构附近的加热元件，并且被配置为将无序半导体结构加热到无序半导体结构发射热红外辐射的温度 。
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公开(公告)号：WO2023009840A1
公开(公告)日：2023-02-02
申请号：PCT/US2022/038912
申请日：2022-07-29
Applicant: SI-WARE SYSTEMS
Inventor： SABRY, Yasser M. , AL HARON, Mohamed H. , MORTADA, Bassem , OTHMAN, Ahmed , KHALIL, Diaa , SAADANY, Bassam , SHEBL, Ahmed , SHENOUDA, Botros George Iskander
Abstract: Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (Al) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.
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公开(公告)号：WO2022177940A1
公开(公告)日：2022-08-25
申请号：PCT/US2022/016532
申请日：2022-02-16
Applicant: SI-WARE SYSTEMS
Inventor： SABRY, Yasser M. , GHONAME, Amr O. , ANWAR, Momen , KHALIL, Diaa
IPC: G01N21/552 , G01J3/453 , G01N21/35 , G01N21/3577
Abstract: Aspects relate to an integrated and compact attenuated total internal reflection (ATR) spectral sensing device (200). The spectral sensing device (200) includes a substrate (202), a spectrometer (204), and a detector (206). The substrate (202) includes an ATR element (214), a microfluidic channel (208), and a channel interface at a boundary (216) between the ATR element (214) and the microfluidic channel (208) formed therein. The ATR element (214) is configured to receive input light (220) and to direct the input light (220) to the channel interface for total internal reflection of the input light (220) at the channel interface. An evanescent wave produced by a sample contained within the microfluidic channel based on the total internal reflection of the input light (220) attenuates the light output from the ATR element (214) and the resulting output light (222) may be analyzed using the spectrometer (204) and the detector (206).
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公开(公告)号：EP3274674A2
公开(公告)日：2018-01-31
申请号：EP16704535.0
申请日：2016-01-29
Applicant: SI-Ware Systems
Inventor： KHALIL, Diaa , SAADANY, Bassam, A. , SABRY, Yasser, M. , FATHY REZK THABET MOHAMED, Alaa Eldeen
CPC classification number: G01J3/45 , G01J3/0256 , G01J3/108 , G01J3/26 , G01J3/453 , G01J3/4531 , G01J3/4532 , G01J3/4535
Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.
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Patent Agency Ranking
公开(公告)号：WO2022266349A2
公开(公告)日：2022-12-22
申请号：PCT/US2022/033833
申请日：2022-06-16
Applicant: SI-WARE SYSTEMS
Inventor： SABRY, Yasser M. , ANWAR, Momen , OSAMA, Amr , AL HARON, Mohamed H. , MOHAMED, Moustafa , KILANY, Mohamed , ERFAN, Mazen , SAADANY, Bassam , KHALIL, Diaa , MORTADA, Bassem , DEUTSCH, Erik R.
IPC: G01N21/35 , G01N21/552 , G01J3/45 , G01J3/28 , G01J3/4532 , G01N2021/3595
Abstract: Aspects relate to a spectroscopic analyzer device that can be used for biological sample detection, and specifically for virus infection detection. The spectroscopic analyzer device includes a spectrometer, such as a micro-electro-mechanical systems (MEMS) based infrared spectrometer, and an artificial intelligence (AI) for screening of viral samples. In addition, the spectroscopic analyzer device includes a light source and a disposable optical component configured to receive a sample and to facilitate light interaction with the sample.
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公开(公告)号：WO2022169814A1
公开(公告)日：2022-08-11
申请号：PCT/US2022/014866
申请日：2022-02-02
Applicant: SI-WARE SYSTEMS
Inventor： SABRY, Yasser, M. , MORTADA, Bassem, A. , HASSAN, Khaled , SALEM, Abdelrahman Ahmed, Maher Mohamed Eisayed , KHALIL, Diaa , AL HARON, Mohamed, H. , ELSHEIKH, Mohammed, Ahmed , SHEBL, Ahmed , SAADANY, Bassam , MEDHAT, Mostafa , SHENOUDA, Botros George, Iskander
IPC: G01N21/25 , G01N21/3563 , G01N21/35
Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.
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8.发明公开
公开(公告)号：EP4533188A1
公开(公告)日：2025-04-09
申请号：EP23735901.3
申请日：2023-06-02
Applicant: SI-Ware Systems
Inventor： ZEINAH, Tarek Mohamed , MORTADA, Bassem , ANWAR, Momen , RAMADAN, Mohamed , HAMOUDA, Mohamed , SABRY, Yasser M. , KHALIL, Diaa , SHEBL, Ahmed , SAADANY, Bassam , EMAD, Ahmed , BADR, Mohamed , ELMASSRY, Moez
IPC: G05B19/402 , G01R31/26
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公开(公告)号：EP3320313A2
公开(公告)日：2018-05-16
申请号：EP16751047.8
申请日：2016-07-07
Applicant: SI-Ware Systems
Inventor： SABRY, Yasser, M. , KHALIL, Diaa , BOUROUINA, Tarik, E. , ANWAR, Momen
CPC classification number: H01L49/00 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0237 , G01J3/0245 , G01J3/108 , G01J3/26 , G01J3/42 , H01K1/04 , H01K1/14
Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.
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公开(公告)号：EP4295139A1
公开(公告)日：2023-12-27
申请号：EP22706493.8
申请日：2022-02-16
Applicant: SI-Ware Systems
Inventor： SABRY, Yasser M. , GHONAME, Amr O. , ANWAR, Momen , KHALIL, Diaa
IPC: G01N21/552 , G01J3/453 , G01N21/35 , G01N21/3577
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