Abstract:
A dynamic random access memory (DRAM) according to an embodiment of the present invention comprises a memory cell array, a data input/output circuit, and a data randomizer configured to randomize data to be stored in the memory cell array. The data randomizer includes an encoder configured to generate write data by encoding input data received from the data input/output circuit using a randomization code and to output the write data to the memory cell array; and a decoder configured to generate output data by decoding read data received from the memory cell array using the randomization code and to output the output data to the data input/output circuit.
Abstract:
PURPOSE: A pseudo open drain type output driver with a de-emphasis function, a semiconductor memory device, and a controlling method thereof are provided to prevent a leakage current by controlling the on and off of a de-emphasis block. CONSTITUTION: A semiconductor device(200) includes a control logic(210) and an output driver(220). The output driver has a pseudo open drain structure and outputs read data from a memory cell array with a de-emphasis mode. The control logic controls the output driver to activate the de-emphasis mode in response to a read command. The control logic activates the de-emphasis mode when the read data is outputted.
Abstract:
PURPOSE: A voltage controlled oscillator is provided to reduce current consumption by adaptively controlling an amount of bias currents according to a frequency of an output clock signal. CONSTITUTION: An oscillator outputs first and second output clock signals with a frequency which is varied in response to a control voltage. An active device(200) is connected to the oscillator and maintains the oscillation of the oscillator. A bias current generator(500) is connected to the active device at a bias node and adaptively controls an amount of bias currents provided to the bias node in response to the control code. First and second capacitor banks(300,400) are connected to the oscillator and the active device at a first output node and a second output node and provides first and second load capacitance to the first output node and the second output node in response to the control code.
Abstract:
PURPOSE: A laminate semiconductor memory device, a memory system including the same, and a method for repairing a penetration electrode defect are provided to improve yield by repairing the penetration electrode defect. CONSTITUTION: A plurality of memory chips(120-150) are laminated on the upper side of a processor chip(110). A plurality of penetration electrodes(161) pass through the memory chips. Input and output buffers are combined between the memory chips and the penetration electrodes and selectively activated based on the defective status of the penetration electrodes. The input and output buffers are included in the memory chips.
Abstract:
반도체 메모리 장치는 메모리 어레이, 어드레스 제어부 및 로직 회로를 포함한다. 상기 메모리 어레이는 제1 뱅크 블록과 제2 뱅크 블록으로 구분되는 복수의 뱅크들을 구비한다. 상기 어드레스 제어부는 상기 메모리 어레이를 액세스한다. 상기 로직 회로는 커맨드 및 어드레스 신호에 기초하여 제1 동작 모드에서는 상기 제1 뱅크 블록과 상기 제2 뱅크 블록이 공통으로 동작되도록 하고 제2 동작 모드에서는 상기 제1 뱅크 블록과 상기 제2 뱅크 블록이 개별적으로 동작되도록 상기 어드레스 제어부를 제어하는 로직 회로를 포함한다.
Abstract:
메모리 시스템은 메모리 컨트롤러 및 메모리 디바이스를 포함한다. 상기 메모리 디바이스는 상기 메모리 컨트롤러와 제1 채널을 통하여 데이터를 교환하고, 상기 제1 채널과는 별도의 제2 채널로 상기 메모리 컨트롤러와 상기 데이터에 관한 제1 순환 중복 체크(cyclic redundancy check; 이하 CRC) 코드를 교환하고, 상기 메모리 컨트롤러로부터 상기 제1 및 제2 채널들과는 별도의 제3 채널로 커맨드/어드레스에 관한 제2 CRC 코드가 포함된 커맨드/어드레스 패킷을 수신한다.