24.
    发明专利
    未知

    公开(公告)号:DE102005053717A1

    公开(公告)日:2006-07-06

    申请号:DE102005053717

    申请日:2005-11-10

    Abstract: A current sense amplifier including clamping devices and a current mirror is configured to sense the resistance of an MTJ memory cell utilizing a bitline boost circuit to shorten the charging time for parasitic circuit capacitance. The bitline boost circuit includes a source follower coupled to a reference voltage and a switch coupled to another voltage source. The switch is enabled to conduct during an initial period of sensing the resistance of the memory cell. The source follower in the bitline boost circuit is configured to clamp the voltage of an input signal at substantially the same level as the clamping devices, and to provide additional current to shorten the period for charging parasitic capacitance. The resulting current sense amplifier can be used to implement a memory device with fast and reliable read times and low manufacturing cost.

    ARCHITECTURE FOR HIGH-SPEED MAGNETIC MEMORIES

    公开(公告)号:AU2003293828A1

    公开(公告)日:2004-07-09

    申请号:AU2003293828

    申请日:2003-12-10

    Abstract: A magnetic memory circuit comprises a plurality of memory cells and a plurality of bit lines coupled to the memory cells for selectively accessing one or more of the memory cells. The memory circuit comprises at least one bit line programming circuit, configurable as a current source for generating a programming current for writing a logical state of at least one memory cell and/or a current sink for returning the programming current, and a first set of switches. The first set of switches are disabled at least during a read operation of the memory cells and at least a portion of the first set of switches are selectively enabled during a write operation of the memory cells. Each switch in the first set of switches is configured to selectively couple the at least one bit line programming circuit to a corresponding one of the bit lines in response to a first control signal. The memory circuit further comprises at least one sense amplifier and a second set of switches. The second set of switches are disabled at least during a write operation of the memory cells and at least a portion of the second set of switches are selectively enabled during a read operation of the memory cells. Each switch in the second set of switches is configured to selectively couple the at least one sense amplifier to a corresponding one of the bit lines in response to a second control signal.

    26.
    发明专利
    未知

    公开(公告)号:DE10112281A1

    公开(公告)日:2002-09-26

    申请号:DE10112281

    申请日:2001-03-14

    Abstract: A memory sense amplifier (10) for a semiconductor memory device (1) is provided with a compensation current source device (30) which generates a compensation current (Icomp) and feeds it to an interconnected bit line (4). Said compensation current (Icomp) is selected in such a manner that during readout a potential gradient can be generated and/or maintained in cooperation with a compensation voltage source device (20) on the selected and interlinked bit line device (4) that is substantially constant over time.

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