Abstract:
PROBLEM TO BE SOLVED: To provide a scanning microscope which allows the inspection of a sample at various wavelengths and (or) in wavelength ranges and does not require the post adjustment of wavelength intrinsic component elements in an optical path at this time. SOLUTION: This scanning microscope is provided with an optical element 4 which produces at least partially spectrally diffusing illumination light within its illumination optical path 8. A beam splitter 11 which does not substantially depend upon polarized light and wavelength is positioned, fixed and arranged within the illumination optical path 8 and a detecting optical path 15.
Abstract:
PROBLEM TO BE SOLVED: To avoid illumination undesirable to a specimen in a scanning microscope. SOLUTION: A restricting means (16) to restrict the beam of a first wavelength is provided in a beam (15) whose wavelength is changed.
Abstract:
PROBLEM TO BE SOLVED: To form a low output power laser beam source which can be utilized especially as a light source for a confocal scanning type microscopic method. SOLUTION: In this device for coupling beams from at least two laser beam sources 1 and 2 related to the confocal scanning type microscopic method, the beams from the laser beam sources 1 and 2 at least have nearly the same wavelength. The device is provided with at least a beam coupling device 11 coupling light beams by a system hardly having loss.
Abstract:
PROBLEM TO BE SOLVED: To simplify the structure of a known device and to enable expansion of detection variation which has been possible thus far. SOLUTION: This device is equipped with at least one spectrum selective element (2), which projects an exciting light (3) of a light source (1) onto a microscope (4), cuts off at least part of the exciting light scattered and reflected by an object from a detection optical path (5) and will not cut off detection light originating from the object, and can be matched with the wavelength of the exciting light of the light source (1). An optical device on the optical path of a laser scanning microscope has another optical member (8) arranged following the element (2) and is featured by the detection of dispersing and/or refracting properties of the detection light.
Abstract:
A device for the production of a light beam having several wavelengths, particularly an illuminating light beam for a preferably confocal scan microscope, comprising a beam combining arrangement (1) used to combine laser light beams (19) of different wavelengths, wherein said arrangement combines individual beam combining devices (2), characterized in that the beam combining devices (2) are arranged in a row or according to groups parallel to each other and are respectively configured in order to inject a laser light beam (19) having a wavelength of a defined wavelength range.
Abstract:
Separating different emission wavelengths in a scanning microscope, is new. Separating different emission wavelengths in a scanning microscope comprises: (a) scanning a specimen with an illuminating light beam by passing the illuminating light beam over the specimen using a beam deflector; (b) selectively applying each of excitation wavelengths (1, 2, 3) to the illuminating light beam during the scanning according to a pre-definable illumination scheme; (c) detecting emission light coming from the specimen using detector(s), where the detector is read out upon each selective applying of a respective excitation wavelength to provide respective corresponding detected signals; and (d) associating the detected signals with the respective excitation wavelength using the illumination scheme. The emission light includes emission wavelengths corresponding to the excitation wavelengths. An independent claim is also included for an apparatus for separating different emission wavelengths in a scanning microscope, comprising: (a) light source(s) configured to generate an illuminating light beam; (b) a beam deflector configured to scan a specimen with the illuminating light beam by passing the illuminating light beam over the specimen; (c) a light control device configured to selectively apply each of excitation wavelengths to the illuminating light beam during a scanning according to a pre-definable illumination scheme; (d) detector(s) configured to pick up emission light coming from the specimen; and (e) a processing device configured to associate the detected signals with the respective excitation wavelengths using the illumination scheme.
Abstract:
The scanning microscope (1) has an incoupling apparatus (31) with which light (33) other than the light (17) proceeding from the sample (7) is coupled into the detection beam path and conveyed to the detector (21). A closure apparatus automatically closes off the incoupling apparatus from the outside, in largely light-tight fashion, when the light guide (37) guiding the other light to the incoupling apparatus is removed. An independent claim is also included for confocal scanning microscope.