Abstract:
Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.
Abstract:
A method for calibrating irradiance sensors is performed by an irradiance analysis computing device in communication with a memory. The method includes receiving an irradiance estimate representing an expected amount of irradiance, receiving a first irradiance value associated with at least one irradiance sensor, processing the irradiance estimate and the first irradiance value to generate at least one irradiance metric, and determining a condition of said irradiance sensor based at least in part on the at least one irradiance metric.
Abstract:
A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components.
Abstract:
Certain embodiments provide a self-checking photoelectric sensor that is configured to determine a characteristic (e.g., an amount of blockage and/or wellness/decay) of an optical pathway (e.g., an electro-optical pathway). An example method generally includes increasing, over a time period that starts at a first time, a current input to a light emitting element (LEE). The method generally includes receiving, by a light detection element, an output of the LEE via the optical pathway during the time period. The method generally includes converting, during the time period, the LEE output to a voltage output. The method generally includes determining a second time in the time period when the voltage output crosses a threshold. The method generally includes determining the characteristic of the optical pathway between the LEE and the light detection element based on a difference between the second time and the first time.
Abstract:
A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.
Abstract:
An optoelectronic sensor for recognizing objects or object properties comprises a light transmitter for transmitting transmitted light into a detection zone, a light receiver for receiving received light and an evaluation unit which is configured to detect an object located in or projecting into a detection zone and/or to determine a property of such an object with reference to the received light received by the light receiver. The light transmitter comprises a monolithic semi-conductor component having a first light emitting layer and a second light emitting layer, with the first light emitting layer being configured for emitting red light and the second light emitting layer being configured for emitting infrared light, and with the second light emitting layer defining a central light emitting surface and the first light emitting layer defining an outer light emitting surface surrounding the central light emitting surface.
Abstract:
A system (102) for determining properties of a sample (114) comprises a LIBS detector (104,106) and an infra-red absorption detector (108,110) for interrogating a sample (114) to generate LIBS spectral data and infra-red absorption spectral data respectively; and a data processor (112) adapted to apply at least one chemometric prediction model, each constructed to link, preferably quantitatively link, features of both LIBS and absorption spectral data to a different specific property of the sample, to a combined dataset derived from at least portions of both the LIBS and the absorption data to generate therefrom a determination, preferably a quantitative determination, of the specific property linked by that model.
Abstract:
A photonics system includes a transmit photonics module and a receive photonics module. The photonics system also includes a transmit waveguide coupled to the transmit photonics module, a first optical switch integrated with the transmit waveguide, and a diagnostics waveguide optically coupled to the first optical switch. The photonics system further includes a receive waveguide coupled to the receive photonics module and a second optical switch integrated with the receive waveguide and optically coupled to the diagnostics waveguide.