System and method for characterizing polarimetric response of a remote sensing instrument
    21.
    发明授权
    System and method for characterizing polarimetric response of a remote sensing instrument 有权
    用于表征遥感仪器的偏振响应的系统和方法

    公开(公告)号:US09360368B1

    公开(公告)日:2016-06-07

    申请号:US14306521

    申请日:2014-06-17

    Applicant: EXELIS, INC.

    Inventor: Kenneth K. Ellis

    Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.

    Abstract translation: 测量光学仪器的偏振响应包括以下步骤:沿光轴发射光; 通过第一和第二偏振器接收光; 以及使用滤波器和检测器检测通过第一和第二偏振器接收的光。 通过测量通过第一和第二偏振器接收的光的强度来获得第一组测量。 通过沿着光轴放置光学仪器来代替滤光器和检测器来获得第二组测量; 并且在去除了第二偏振器之后测量通过第一偏振器接收的光的强度。 使用光学仪器获得第三组测量值,但是具有第二偏振器来代替第一偏振器。 可以使用第一,第二和第三组测量来表征光学仪器。 表征完成,而不必知道偏振器的消光比和透射率参数。

    METHODS AND SYSTEMS FOR CALIBRATING IRRADIANCE SENSORS
    22.
    发明申请
    METHODS AND SYSTEMS FOR CALIBRATING IRRADIANCE SENSORS 审中-公开
    用于校准辐射传感器的方法和系统

    公开(公告)号:US20150355017A1

    公开(公告)日:2015-12-10

    申请号:US14297348

    申请日:2014-06-05

    Applicant: SunEdison Inc.

    Abstract: A method for calibrating irradiance sensors is performed by an irradiance analysis computing device in communication with a memory. The method includes receiving an irradiance estimate representing an expected amount of irradiance, receiving a first irradiance value associated with at least one irradiance sensor, processing the irradiance estimate and the first irradiance value to generate at least one irradiance metric, and determining a condition of said irradiance sensor based at least in part on the at least one irradiance metric.

    Abstract translation: 用于校准辐照传感器的方法由与存储器通信的辐照度分析计算装置执行。 该方法包括接收表示辐射度的预期量的辐照度估计,接收与至少一个辐照传感器相关联的第一辐照度值,处理辐照度估计值和第一辐照度值以产生至少一个辐照度量度,以及确定所述 辐射传感器至少部分地基于至少一个辐照度量度。

    Wafer level testing of optical devices
    23.
    发明授权
    Wafer level testing of optical devices 有权
    光器件晶圆级测试

    公开(公告)号:US08724100B1

    公开(公告)日:2014-05-13

    申请号:US13694047

    申请日:2012-10-22

    Abstract: A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components.

    Abstract translation: 晶片包括多个光学器件,每个光学器件包括一个或多个光学部件。 光学部件包括发光部件,每个发光部件响应于从晶片外部的电子器件向发光部件施加电能而产生光信号。 光学部件还包括响应于光的接收而输出电信号的接收器部件。 晶片还包括测试波导,每个波导从光学器件中的一个光学器件的边界内延伸穿过光学器件的边界,并且还提供光学部件的第一部分和光学部件的第二部分之间的光学连通。 光学部件的第一部分包括一个或多个发光部件,并且光学部件的第二部分包括一个或多个接收器部件。

    Self-checking photoelectric sensor and method of operation

    公开(公告)号:US11754438B2

    公开(公告)日:2023-09-12

    申请号:US17651308

    申请日:2022-02-16

    Applicant: Alcon Inc.

    Abstract: Certain embodiments provide a self-checking photoelectric sensor that is configured to determine a characteristic (e.g., an amount of blockage and/or wellness/decay) of an optical pathway (e.g., an electro-optical pathway). An example method generally includes increasing, over a time period that starts at a first time, a current input to a light emitting element (LEE). The method generally includes receiving, by a light detection element, an output of the LEE via the optical pathway during the time period. The method generally includes converting, during the time period, the LEE output to a voltage output. The method generally includes determining a second time in the time period when the voltage output crosses a threshold. The method generally includes determining the characteristic of the optical pathway between the LEE and the light detection element based on a difference between the second time and the first time.

    OPTOELECTRONIC SENSOR
    26.
    发明申请
    OPTOELECTRONIC SENSOR 审中-公开
    光电传感器

    公开(公告)号:US20170016763A1

    公开(公告)日:2017-01-19

    申请号:US15209156

    申请日:2016-07-13

    Applicant: SICK AG

    Abstract: An optoelectronic sensor for recognizing objects or object properties comprises a light transmitter for transmitting transmitted light into a detection zone, a light receiver for receiving received light and an evaluation unit which is configured to detect an object located in or projecting into a detection zone and/or to determine a property of such an object with reference to the received light received by the light receiver. The light transmitter comprises a monolithic semi-conductor component having a first light emitting layer and a second light emitting layer, with the first light emitting layer being configured for emitting red light and the second light emitting layer being configured for emitting infrared light, and with the second light emitting layer defining a central light emitting surface and the first light emitting layer defining an outer light emitting surface surrounding the central light emitting surface.

    Abstract translation: 用于识别物体或物体属性的光电传感器包括用于将透射光传输到检测区域的光发射器,用于接收接收光的光接收器和被配置为检测位于或突出到检测区域中的物体的评估单元和/ 或者参照由光接收机接收到的接收光来确定这样的物体的特性。 光发射机包括具有第一发光层和第二发光层的单片半导体部件,第一发光层被配置为发射红光,第二发光层被配置为发射红外光,并且与 所述第二发光层限定中心发光表面,所述第一发光层限定围绕所述中心发光表面的外部发光表面。

    SYSTEM FOR AND METHOD OF COMBINED LIBS AND IR ABSORPTION SPECTROSCOPY INVESTIGATIONS
    27.
    发明申请
    SYSTEM FOR AND METHOD OF COMBINED LIBS AND IR ABSORPTION SPECTROSCOPY INVESTIGATIONS 有权
    组合LIBS和红外吸收光谱研究的系统和方法

    公开(公告)号:US20160018325A1

    公开(公告)日:2016-01-21

    申请号:US14772555

    申请日:2013-03-22

    Abstract: A system (102) for determining properties of a sample (114) comprises a LIBS detector (104,106) and an infra-red absorption detector (108,110) for interrogating a sample (114) to generate LIBS spectral data and infra-red absorption spectral data respectively; and a data processor (112) adapted to apply at least one chemometric prediction model, each constructed to link, preferably quantitatively link, features of both LIBS and absorption spectral data to a different specific property of the sample, to a combined dataset derived from at least portions of both the LIBS and the absorption data to generate therefrom a determination, preferably a quantitative determination, of the specific property linked by that model.

    Abstract translation: 用于确定样品(114)的性质的系统(102)包括用于询问样品(114)以产生LIBS光谱数据和红外吸收光谱数据的LIBS检测器(104,106)和红外吸收检测器(108,110) 分别; 以及适于应用至少一个化学计量预测模型的数据处理器(112),每个化学计量预测模型被构造为将LIBS和吸收光谱数据两者的特征优选地定量地链接到样本的不同特定属性, LIBS和吸收数据的最少部分由此产生由该模型链接的特定属性的确定,优选定量确定。

    Method and system for performing testing of photonic devices
    28.
    发明授权
    Method and system for performing testing of photonic devices 有权
    用于执行光子器件测试的方法和系统

    公开(公告)号:US09236958B2

    公开(公告)日:2016-01-12

    申请号:US13959166

    申请日:2013-08-05

    Abstract: A photonics system includes a transmit photonics module and a receive photonics module. The photonics system also includes a transmit waveguide coupled to the transmit photonics module, a first optical switch integrated with the transmit waveguide, and a diagnostics waveguide optically coupled to the first optical switch. The photonics system further includes a receive waveguide coupled to the receive photonics module and a second optical switch integrated with the receive waveguide and optically coupled to the diagnostics waveguide.

    Abstract translation: 光子系统包括发射光子模块和接收光子模块。 光子系统还包括耦合到发射光子模块的发射波导,与发射波导集成的第一光开关,以及光耦合到第一光开关的诊断波导。 光子系统还包括耦合到接收光子模块的接收波导和与接收波导集成并与光学耦合到诊断波导的第二光开关。

    光電センサ
    30.
    发明专利
    光電センサ 有权
    光电传感器

    公开(公告)号:JP2017021017A

    公开(公告)日:2017-01-26

    申请号:JP2016133161

    申请日:2016-07-05

    Abstract: 【課題】 位置調整が容易であり、高い感度を有し、必要な設置スペースが小さく、安価に製造できる光電センサを提供する。 【解決手段】 本発明に係る物体又はその特性を認識するための光電センサは、対象領域へ発射光線を送出する発光器と、受光光線を受光するための受光器と、該受光器により受光した受光光線に基づいて対象領域内に存在する又は該領域内へ突出する物体を検出する及び/又はそのような物体の特性を調べるように構成された評価ユニットを含む光電センサにおいて、前記発光器が、第1の発光層と第2の発光層を有するモノリシックな半導体素子を含み、第1の発光層は赤色光を発するように構成され、第2の発光層は赤外光を発するように構成され、該第2の発光層は中心の発光面を画定し、第1の発光層は中心の発光面を囲む外側の発光面を画定していることを特徴としている。 【選択図】 図2

    Abstract translation: A是易于调整的位置,有很高的灵敏度,所需的安装空间小,提供一种能够以低成本来制造的光电传感器。 根据本发明,或用于识别光烧成光递送到目标区域的发光器件的特性的光电传感器,和用于接收光线的光接收器对象是由光接收单元接收 光电传感器,其包括一个被配置评估单元以检查用于检测突出到或存在于目标区域和/或这样的对象的基于光的特性区域内接收光,其中所述光发射器的对象 包括具有第一发光层和第二发光层的单片半导体装置中,第一发光层被配置为发射红光,用于发射红外光的第二发光层 是,第二发光层限定所述中心的发光表面,所述第一发光层的特征在于限定环绕发光中心的表面外的发光表面。 .The

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