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    Method and apparatus for simultaneously measuring a plurality of spectral wavelengths present in electromagnetic radiation
    22.
    发明授权
    Method and apparatus for simultaneously measuring a plurality of spectral wavelengths present in electromagnetic radiation 失效
    用于同时测量存在于电磁辐射中的多个光谱波长的方法和装置

    公开(公告)号：US4905169A

    公开(公告)日：1990-02-27

    申请号：US366348

    申请日：1989-06-15

    Applicant: Tudor N. Buican ,  John C. Martin

    Inventor： Tudor N. Buican ,  John C. Martin

    IPC: G01J3/447 ,  G01J3/453 ,  G01J9/02 ,  G01N15/10 ,  G01N15/14

    CPC classification number: G01J3/453 ,  G01J3/447 ,  G01J9/0246 ,  G01J2009/0249 ,  G01J2009/0265 ,  G01N15/14 ,  G01N2015/1006 ,  G01N2021/6439

    Abstract: An apparatus and method simultaneously measures a plurality of spectral wavelengths present in electromagnetic radiation. A modulatable birefringent optical element is employed to divide a polarized light beam into two components, thereby producing a phase difference in two resulting light beams such that the two beams can be made to interfere with one another when recombined, the interference pattern providing the wavelength information required for the analysis of the incident light. The interferometer thus created performs in a similar manner to a Michelson interferometer, but with no moving parts, and with a resolution dependent on the degree of phase shift introduced by the modulator.

    Abstract translation: 一种装置和方法同时测量电磁辐射中存在的多个光谱波长。 采用可调制的双折射光学元件将偏振光束分成两个分量，从而在两个产生的光束中产生相位差，使得当重新组合时可以使两个光束彼此干扰，提供波长信息的干涉图案 需要分析入射光。 这样创建的干涉仪以与迈克尔逊干涉仪类似的方式执行，但没有移动部件，并且具有取决于由调制器引入的相移程度的分辨率。

    IMAGING SYSTEMS
    24.
    发明公开
    IMAGING SYSTEMS 审中-公开
    PICTURE系统

    公开(公告)号：EP1554539A4

    公开(公告)日：2007-02-21

    申请号：EP03774782

    申请日：2003-10-08

    Applicant: BECHTEL BWXT IDAHO LLC

    Inventor： DEASON VANCE A ,  TELSCHOW KENNETH L

    IPC: A61B20060101 ,  G01B9/02 ,  G01B9/04 ,  G01B11/02 ,  G01H9/00 ,  G01J9/02

    CPC classification number: G01H9/002 ,  G01B9/04 ,  G01H9/00 ,  G01J2009/0265

    Abstract: An imaging system includes: an object wavefront source (12) and an optical microscope objective (4) all positioned to direct an object wavefront onto an area of a vibrating subject (6) surface encompassed by a field of view of the microscope objective (4), and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material (XTAL); and a reference wavefront source (12) and at least one phase modulator (MOD) all positioned to direct a reference wavefront through the phase modulator (MOD) and to direct a modulated reference wavefront from the phase modulator (MOD) through the photorefractive material (XTAL) to interfere with the modulated object wavefront. The photorefractive material (XTAL) has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, (XTAL) providing a full-field, real-time image signal of the encompassed surface area (6).

    IMAGING SYSTEMS
    26.
    发明公开
    IMAGING SYSTEMS 审中-公开
    PICTURE系统

    公开(公告)号：EP1554539A2

    公开(公告)日：2005-07-20

    申请号：EP03774782.1

    申请日：2003-10-08

    Applicant: Bechtel BWXT Idaho, LLC

    Inventor： DEASON, Vance, A. ,  TELSCHOW, Kenneth, L.

    IPC: G01B9/02

    CPC classification number: G01H9/002 ,  G01B9/04 ,  G01H9/00 ,  G01J2009/0265

    Abstract: An imaging system includes: an object wavefront source (12) and an optical microscope objective (4) all positioned to direct an object wavefront onto an area of a vibrating subject (6) surface encompassed by a field of view of the microscope objective (4), and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material (XTAL); and a reference wavefront source (12) and at least one phase modulator (MOD) all positioned to direct a reference wavefront through the phase modulator (MOD) and to direct a modulated reference wavefront from the phase modulator (MOD) through the photorefractive material (XTAL) to interfere with the modulated object wavefront. The photorefractive material (XTAL) has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, (XTAL) providing a full-field, real-time image signal of the encompassed surface area (6).

    Phase Shifting Interferometry With Multiple Accumulation
    28.
    发明申请
    Phase Shifting Interferometry With Multiple Accumulation 失效
    具有多次累积的相移干涉测量

    公开(公告)号：US20070206201A1

    公开(公告)日：2007-09-06

    申请号：US11680968

    申请日：2007-03-01

    Applicant: Peter de Groot ,  Leslie Deck

    Inventor： Peter de Groot ,  Leslie Deck

    IPC: G01B11/02

    CPC classification number: G01B9/02011 ,  G01B9/02002 ,  G01B9/02004 ,  G01B9/02007 ,  G01B9/02012 ,  G01B9/02057 ,  G01B2290/45 ,  G01B2290/70 ,  G01J2009/0234 ,  G01J2009/0265

    Abstract: An interferometer system is disclosed which is configured to combine measurement light with reference light to form an optical interference pattern, where the interferometer system includes a modulator configured to repetitively introduce a sequence of phase shifts between the measurement and reference light; and a camera system positioned to measure the optical interference pattern, where the camera system is configured to separately accumulate time-integrated images of the optical interference pattern corresponding to the different phase shifts in the sequence during the repetitions of the sequence.

    Abstract translation: 公开了一种干涉仪系统，其被配置为将测量光与参考光结合以形成光学干涉图案，其中所述干涉仪系统包括被配置为在所述测量参考光和所述参考光之间重复地引入相移序列的调制器; 以及定位成测量光学干涉图案的相机系统，其中相机系统被配置为在序列的重复期间分别累积对应于序列中的不同相移的光学干涉图案的时间集成图像。

    Ultra high frequency imaging acoustic microscope
    29.
    发明授权
    Ultra high frequency imaging acoustic microscope 失效
    超高频成像声学显微镜

    公开(公告)号：US07050174B2

    公开(公告)日：2006-05-23

    申请号：US11146576

    申请日：2005-06-06

    Applicant: Vance A. Deason ,  Kenneth L. Telschow

    Inventor： Vance A. Deason ,  Kenneth L. Telschow

    IPC: G01B9/02

    CPC classification number: G01H9/002 ,  G01B9/04 ,  G01H9/00 ,  G01J2009/0265

    Abstract: An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

    Abstract translation: 一种成像系统包括：物体波前源和光学显微镜物镜，其全部定位成将物体波前引导到由显微镜物镜的视场所包围的振动对象表面的区域上，并且引导从 通过光折射材料包围的表面积; 以及参考波前源和至少一个相位调制器，其全部定位成将参考波前引导通过相位调制器，并且通过光折射材料引导来自相位调制器的调制参考波阵面以干扰调制对象波前。 光折射材料具有组成和位置，使得调制对象波前和调制参考波阵面的干涉发生在光折射材料内，从而提供包围的表面区域的全场实时图像信号。

    Common-path point-diffraction phase-shifting interferometer incorporating a birefringent polymer membrane
    30.
    发明授权
    Common-path point-diffraction phase-shifting interferometer incorporating a birefringent polymer membrane 失效
    掺有双折射聚合物膜的共通点点衍射移相干涉仪

    公开(公告)号：US07006234B1

    公开(公告)日：2006-02-28

    申请号：US10888465

    申请日：2004-07-09

    Applicant: William Jude Cottrell ,  Thomas George Ference

    Inventor： William Jude Cottrell ,  Thomas George Ference

    IPC: G01B9/02

    CPC classification number: G01B9/02024 ,  G01B9/02057 ,  G01B2290/70 ,  G01J9/02 ,  G01J2009/0223 ,  G01J2009/0265

    Abstract: A common-path, point-diffraction, phase-shifting interferometer uses a half wave plate having a diffractive element, such as pin hole. A coherent, polarized light source simultaneously generates a reference beam from the diffractive element and an object beam from remaining portions of the light going through the half wave plate. The reference beam has a nearly spherical wavefront. Each of the two beams possesses a different polarization state. The object and reference beams are then independently phase modulated by a polarization sensitive phase modulator that shifts phase an amount depending on applied voltage and depending on polarization state of the incident light. A polarizer is then used to provide the object and reference beams in the same polarization state with equal intensities so they can interfere to create an interferogram with near unity contrast.

    Abstract translation: 公共路径，点衍射，相移干涉仪使用具有诸如针孔的衍射元件的半波片。 相干偏振光源同时从衍射元件产生参考光束，并且从通过半波片的光的剩余部分产生物体光束。 参考光束具有近似球面的波前。 两个光束中的每一个具有不同的偏振状态。 物体和参考光束然后通过偏振敏感相位调制器独立相位调制，偏振相位调制器根据施加的电压和取决于入射光的偏振状态移相量。 然后使用偏振器以相同的强度在相同的极化状态下提供物体和参考光束，因此它们可以干扰以产生具有近乎一致的对比度的干涉图。

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