Abstract:
A device for tunable optical filter includes a substrate, one or more piezos, a bottom mirror, and a top mirror. The one or more piezos are placed on the substrate. The one or more piezos have a piezo thickness. The bottom mirror is placed on the substrate. The bottom mirror has a bottom mirror thickness greater than the piezo thickness. The top mirror is placed on the bottom mirror. The top mirror is attached to the one or more piezos.
Abstract:
Disclosed is a Fourier transform spectroscope having a control interferometer capable of facilitating optical axis adjustment and miniaturization by reducing the number of optical elements. Using a first reflection mirror 131 provided with a reflection surface 131a configured to reflect measurement light emitted from a measurement light source 110 toward a beam splitter 140 and a first through-hole 131b extending along an optical axis direction of the measurement light reflected on the reflection surface 131a and a laser light source holding portion configured to hold a laser light source 120 such that laser light emitted from the laser light source 120 is incident to the beam splitter 140 through the first through-hole 131b, optical axes of the measurement light and the laser light are aligned with each other. Since a laser reflection mirror for aligning the optical axes of the measurement light and the laser light of the related art is not necessary, it is possible to reduce the number of parts and facilitate optical axis adjustment and miniaturization.
Abstract:
A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.
Abstract:
A method for producing a mirror plate (100) for a Fabry-Perot interferometer (300) comprises: - providing a substrate (50), which comprises silicon (Si), - implementing a semi-transparent reflective coating (110) on the substrate (50), - forming a passivated region (70a) in and/or on the substrate (50) by etching a plurality of voids (E1) in the substrate (50), and by passivating the surfaces of the voids (E1), - forming a first sensor electrode (G1a) on top of the passivated region (70a), and - forming a second sensor electrode (G1b) supported by the substrate (50).
Abstract:
A method for estimating an input spectrum from sensor data acquired by an optical sensor assembly, having an aperture, a Fabry-Perot interferometer, and an optical sensor element, the method including: obtaining first calibration data representative of a spectral response function of the optical sensor assembly for a first setting of the aperture; computing second calibration data from the first calibration data, the second calibration data being representative of a spectral response function of the optical sensor assembly for a second setting of the aperture, where the second setting corresponds to a setting applied during the acquiring of the sensor data; and estimating the input spectrum as a function of the second calibration data and the sensor data. Additionally, a corresponding system for estimating an input spectrum
Abstract:
The invention relates to an interferometer, comprising a first interferometer arm and a second interferometer arm, wherein the first interferometer arm and the second interferometer arm are arranged in such a way that a first central beam, originating from a central pixel of an original image to be imaged, passes through the first interferometer arm, a second central beam, originating from the central pixel of the original image to be imaged, passes through the second interferometer arm, wherein, after passing through the first or second interferometer arm, the first central beam and the second central beam are superimposed and generate a k perpendicular =0-interference at a superposition point of the first central beam and the second central beam, a first light beam, originating from a pixel of the original image to be imaged, passes through the first interferometer arm, and a second light beam, originating from a pixel of the original image to be imaged, passes through the second interferometer arm, wherein, after passing through the first or second interferometer arm, the first light beam and the second light beam overlap at the superposition point of the first central beam and the second central beam, and wherein, at the superposition point, a wave vector component of the first light beam, which is perpendicular to the first central beam, and a wave vector component of the second light beam, which is perpendicular to the second central beam, are arranged in an opposing manner. The invention also relates to a method for reconstructing an original image from an image measured using an interferometer according to the invention. The invention further relates to a method for calibrating an interferometer according to the invention.
Abstract:
A method for determining spectral calibration data (λcal(Sd), Sd,cal(λ)) of a Fabry-Perot interferometer (100) comprises: forming a spectral notch (NC2) by filtering input light (LB1) with a notch filter (60) such that the spectral notch (NC2) corresponds to a transmittance notch (NC1) of the notch filter (60), measuring a spectral intensity distribution (M(Sd)) of the spectral notch (NC2) by varying the mirror gap (dFP) of the Fabry-Perot interferometer (100), and by providing a control signal (Sd) indicative of the mirror gap (dFP), and determining the spectral calibration data (λcal(Sd), Sd,cal(λ)) by matching the measured spectral intensity distribution (M(Sd)) with the spectral transmittance (TN(λ)) of the notch filter (60).
Abstract:
A spectrometer configurable for field analyses of chemical properties of a material is provided. The spectrometer includes: at least one sensor adapted for providing Fourier transform infrared spectroscopy (FTIR) surveillance and at least another sensor for providing Raman spectroscopy surveillance. The spectrometer can be provided with a user accessible instruction set for modifying a sampling configuration of the spectrometer. A method of determining the most likely composition of a sample by at least two technologies using the spectrometer is also provided.