Abstract:
A multi-energy polarization imaging method consisting of a multi-fusion, dual-rotating retarder / multiple-energy complete Mueller matrix-based polarimeter and dual-energy capabilities The system includes a light source (14) for illuminating a target (18) with a first quantity of light having a first wavelength and a second quantity of light having a second wavelength, the first and second wavelength being different. A polarization-state generator (22) generates a polarization state for each of the first and second quantities of light, and includes a first polarizer (26) through which the first and second quantities of light are transmitted before entering a first waveplate (32). A polarization-state receiver (44) evaluates a resulting polarization state of the first and second quantities of light following illumination of the target (18), the polarization-state receiver (44) including a second waveplate (48) through which the first and second quantities of light are transmitted before entering a second polarizer (51). An optical image-capture device captures a first image of the target illuminated by the first quantity of light and a second image of the target illuminated by the second quantity of light. A processing unit assigns a weighting factor to at least one of the first and second images and evaluates a weighted difference between the first and second images to generate a multi-energy image of the target (18).
Abstract:
Remotely sensing a target may include generating a first beam of optical radiation that is modulated at a first frequency and polarized at a first polarization. A second beam of optical radiation that is modulated at a second frequency and polarized at a second polarization may also be generated. The first and second beams of optical radiation may be transmitted to the target. Radiation at the first polarization and radiation at the second polarization may be detected from the target using a phase sensitive technique and the first and second frequencies.
Abstract:
An optical waveguide device formed on an integrated planar substrate and comprising at least two signal demultiplexers each arranged to demultiplex input light into a plurality of output channels, each of said two demultiplexers being arranged to demultiplex respective different polarisation modes, an input waveguide for receiving input light and providing an input path to a polarisation splitter arranged to supply light or different polarisation modes from the input light to said two demultiplexers, and a plurality of light output paths from each of said demultiplexers arranged to direct said output channels to a plurality of light output detecting locations.
Abstract:
The invention relates in general to systems dor finding profiles of topographical features of small dimensions, such as those of a silicon substrate (12), and in particular to such systems using optical spectrometer (60).
Abstract:
Plural electronic or optical images are provided in a streak optical system, as for instance by use of plural slits instead of the conventional single slit, to obtain a third, fourth, etc. dimension - rather than only the conventional two, namely range or time and azimuth. Such additional dimension or dimensions are thereby incorporated into the optical information that is to be streaked and thereby time resolved. The added dimensions may take any of an extremely broad range of forms, including wavelength, polarization state, or one or more spatial dimensions - or indeed virtually any optical parameter that can be impressed upon a probe beam. Resulting capabilities remarkably include several new forms of lidar spectroscopy, fluorescence analysis, polarimetry, spectropolarimetry, and combinations of these, as well as a gigahertz wavefront sensor.
Abstract:
A spectrometer for determining the concentration of a substance within a sample comprises a. a radiation source (11) for supplying radiation to the sample to be measured; b. a filter (15) for filtering radiation transmitted by the sample, the filter having a number of pass bands at wavelengths corresponding to absorption peaks in the absorption spectrum of the sample to be detected, the filter being responsive to an applied signal to modulate the wavelengths of the pass bands; and, c. a detector (16) for detecting the filtered radiation, the detector being responsive to the applied signal to determine the relative intensities of the maxima and minima in the absorption spectra of the substance, characterized in that the radiation source is selectively activated in response to the applied signal.
Abstract:
Digital signal processing (DSP) techniques for performing multiple modulation measurements with a polarization photoelastic modulator (PEM) in a step-scanning FT-IR spectrometer. The frequency and phase of the PEM drive signal are extracted from the digitized data collected for the actual measurement. This can then be used to perform the desired analysis of the polarization signals (e.g., CD, LD, DIRLD). This is accomplished by successively refining an initial estimate of the PEM frequency (typically starting at the nominal PEM frequency omega 0, or at the value determined from the previous step). This is done by using the current estimate of the PEM frequency to compute a phase error, and then using the computed phase error to refine the estimate of the PEM frequency. The phase errors are computed using different sets of samples in the sampling interval.
Abstract:
The polarization of fluorescent light or Raman scattering light which is emitted from a sample when light is applied to the sample is measured with high accuracy. Excitation light which is emitted from a pulse excitation light source (1) and is p-polarized by a polarizer (2) and a half-wave plate (3) is applied to a sample (7) and the p-polarization component intensity Ipp and s-polarization component intensity Ips of the emitted fluorescent light are measured by photodetectors (13 and 14). In the same way, s-polarized excitation light is applied to the sample (7) and the p-polarization component intensity Isp and s-polarization component intensity Iss of emitted fluorescent light are measured. The G-factor is obtained from those measured values by a following formula: G = [(Ipp.Isp)/(Ips.Iss)] . Polarization responsiveness correction is performed in accordance with the G-factor to obtain the polarization of the fluorescent light.
Abstract:
A polarization interferometer comprises a light source (1), a collimator (2), a first polarization element (3), a system of double-refracting elements (4, 5, 6) and a second polarizing element (7) which polarizes the light emerging from the double-refracting element (4, 5, 6) and directs it to a photon detector (8). The double-refractive element (4, 5, 6) consists of two optical wedges (5, 6) which together constitute a right parallepiped and which are arranged so as to slide relative to each other along opposed side surfaces, and a double-refracting plate (4) with parallel faces which acts as a compensator. The optical axis of the compensator (4) makes a finite angle with those of the two wedges (5, 6) in the plane perpendicular to the light beam, the optical axes of both wedges (5, 6) being coincident. The optical axes of the two polarizers (3, 7) are mutually perpendicular or parallel and are not aligned parallel to the axes of the two wedges (5, 6) of the double-refractive element (4, 5, 6).
Abstract:
A system for a high resolution optical spectrum analyzer (OSA) using various optical configurations to reduce polarization dependent loss (PDL) is disclosed. The system may include a birefringent element to receive an input optical beam. The birefringent element may then split the optical beam into at least two exit beams. The system may also include an optical configuration comprising at least one optical element. The optical configuration may receive the at least two exit beams from the birefringent element and transform at least one of the two exit beams using the at least one optical element to provide two parallel beams with parallel polarizations. The optical configuration may then output the two parallel beams with parallel polarizations to a downstream optical element, such as a diffraction grating, or other optical element.