公开(公告)号：TW200912267A

公开(公告)日：2009-03-16

申请号：TW096143067

申请日：2007-11-14

Applicant: 韓國標準科學研究院 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： 洪承秀 HONG, SEUNG-SOO ,  金珍泰 KIM, JIN-TAE ,  尹周榮 YUN, JU-YOUNG

IPC: G01L

CPC classification number: G01L27/005

Abstract: 一種無移動可校正與試驗之真空儀器裝置,其中一被校正用真空儀器連結於一真空裝置,以進行校正與試驗。該真空儀器裝置係由一真空遮斷用閥及一移動用真空儀器校正裝置所構成。該真空遮斷用閥係開關連結該真空裝置與被校正用真空儀器之管路,且該移動用真空儀器校正裝置連結在該被校正用真空儀器;該移動用真空儀器校正裝置在該被校正用真空儀器之一側,該移動用真空儀器校正裝置設有依序連結的一基準用真空儀器、一真空連結用閥、一真空室、一閘閥及一排氣裝置;且該移動用真空儀器校正裝置另包含一瓦斯供給源、一洩漏閥及一室用真空儀器,該瓦斯供給源與該真空室連結,以使該真空室產生壓力;該洩漏閥控制該瓦斯供給源內供給至該真空室之瓦斯流動;及該室用真空儀器量測該真空室內之真空度。

Abstract in simplified Chinese: 一种无移动可校正与试验之真空仪器设备,其中一被校正用真空仪器链接于一真空设备,以进行校正与试验。该真空仪器设备系由一真空遮断用阀及一移动用真空仪器校正设备所构成。该真空遮断用阀系开关链接该真空设备与被校正用真空仪器之管路,且该移动用真空仪器校正设备链接在该被校正用真空仪器;该移动用真空仪器校正设备在该被校正用真空仪器之一侧,该移动用真空仪器校正设备设有依序链接的一基准用真空仪器、一真空链接用阀、一真空室、一闸阀及一排气设备;且该移动用真空仪器校正设备另包含一瓦斯供给源、一泄漏阀及一室用真空仪器,该瓦斯供给源与该真空室链接,以使该真空室产生压力;该泄漏阀控制该瓦斯供给源内供给至该真空室之瓦斯流动;及该室用真空仪器量测该真空室内之真空度。

公开(公告)号：US20250130477A1

公开(公告)日：2025-04-24

申请号：US18688451

申请日：2023-09-21

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： In Ho BAE ,  Dong Hoon LEE

IPC: G02F1/365 ,  G02F1/355

Abstract: A wavelength conversion device includes a nonlinear optical crystal, a guide light source configured to provide a guide light traveling in a first direction within the nonlinear optical crystal such that a thermal waveguide penetrating the nonlinear optical crystal is formed, a signal light source configured to provide a signal light having a first wavelength (λ1) and traveling in a second direction opposite to the first direction through the thermal waveguide, and a pump light source configured to provide a pump light having a second wavelength (λ2) and traveling in the second direction through the thermal waveguide, wherein an output light including a wavelength component corresponding to a sum of energies of the first wavelength (λ1) and the second wavelength (λ2) is provided from the thermal waveguide.

公开(公告)号：US20250095944A1

公开(公告)日：2025-03-20

申请号：US18884943

申请日：2024-09-13

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： In Yong Park ,  Takashi Ogawa ,  Ha Rim Lee ,  Junhyeok Hwang

IPC: H01J1/148 ,  H01J1/46

Abstract: Provided is an electron gun using a virtual source method that may have a high angular current density, a narrow energy distribution, and stable electron emission characteristics by forming a virtual source inside a thermal electron source (LaB6, CeB6)-based emitter emitting an electron beam.

公开(公告)号：US12245857B2

公开(公告)日：2025-03-11

申请号：US17853769

申请日：2022-06-29

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Kwon-Kyu Yu ,  Yong-Ho Lee ,  Hyukchan Kwon ,  Jin-Mok Kim ,  Sang-Kil Lee ,  Bokyung Kim ,  Min-Young Kim ,  Kiwong Kim

IPC: A61B5/245 ,  A61B5/00 ,  G01R33/00 ,  G01R33/035

Abstract: A dual-helmet magnetoencephalography measuring apparatus includes: an internal container storing a liquid refrigerant; an external container disposed to surround the internal container and including a first external helmet and a second external helmet disposed to be spaced apart from each other; a first sensor-mounted helmet disposed to surround the first external helmet between the external container and the internal container; a second sensor-mounted helmet disposed to surround the second external helmet between the externa container and the internal container; a plurality of first SQUID sensor module disposed on the first sensor-mounted helmet; and a plurality of second SQUID sensor module disposed on the second sensor-mounted helmet.

公开(公告)号：US20250046562A1

公开(公告)日：2025-02-06

申请号：US18519865

申请日：2023-11-27

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Takashi OGAWA ,  In Yong PARK ,  Jeong Woong LEE

IPC: H01J37/12 ,  H01J37/244 ,  H01J37/28

Abstract: An objective lens for a charged particle beam apparatus that provides a charged particle beam to a sample, includes: a first electrode exposed to face a sample; a second electrode configured to focus a charged particle beam to the sample; a third electrode comprising a conical tip and a body extending from the tip; and a fourth electrode located in the body of the third electrode. Each of the first electrode, the second electrode, the third electrode, and the fourth electrode has a through-hole, and the charged particle beam is provided to the sample through the through-hole in response to a voltage applied.

公开(公告)号：US20250027908A1

公开(公告)日：2025-01-23

申请号：US18704855

申请日：2022-10-28

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Dong Jin YOON ,  Choon Su PARK ,  Sun Ho LEE

IPC: G01N29/12 ,  G01N29/07

Abstract: A third-party interference monitoring system is provided. The third-party interference monitoring system, according to one embodiment of the present invention, is for detecting third-party interference in advance before a buried pipeline buried underground is damaged by the third-party interference. The third-party interference monitoring system comprises: a sensor unit which is installed on a buried pipeline so as to detect an impact signal which is propagated along the ground or the buried pipeline when heavy equipment strikes the ground; and a control unit which acquires a time domain value of the impact signal by receiving data from the sensor unit, converts the time domain value to a frequency domain value, and then detects the third-party interference on the basis of frequency response characteristics of the impact signal.

公开(公告)号：US20250020445A1

公开(公告)日：2025-01-16

申请号：US18771012

申请日：2024-07-12

Applicant: Korea Research Institute of Standards and Science

Inventor： Chan Yong HWANG ,  Kyoung Woong MOON ,  Chang Soo KIM ,  Sang Sun LEE ,  Seung Mo YANG

IPC: G01B7/34 ,  G01B11/30

Abstract: Proposed are a wafer inspection apparatus and a method of inspecting a wafer using the wafer inspection apparatus. The proposed wafer inspection apparatus includes a horizontal magnetic field generation unit arranged proximate to a lateral surface of a wafer and forming a magnetic field in such a manner that lines of magnetic force propagate in a horizontal direction, a vertical magnetic field generation unit arranged under the wafer and generating a magnetic field in such a manner that lines of magnetic force propagate in a direction vertical to the wafer, an image measurement unit arranged over the wafer and measuring an image of the wafer, and a wafer movement stage moving the wafer in a first direction and a second direction.

公开(公告)号：US20240426950A1

公开(公告)日：2024-12-26

申请号：US18684777

申请日：2021-11-08

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： In Ho BAE ,  Seong Chong PARK ,  Jae Keun YOO ,  Seon Do LIM ,  Young Pyo HONG ,  No Weon KANG

IPC: G01R33/00 ,  G01R33/26

Abstract: The present disclosure relates to a vapor cell and a vapor cell temperature control system, and more specifically, to a vapor cell and a vapor cell temperature control system which use a laser to control the temperature of the vapor cell without distortion of an electromagnetic field. The vapor cell according to an embodiment of the present disclosure may include a body provided with a penetration part, which is a space in which a reactive material is accommodated, and a black material provided on a part of an outer surface of the body. According to an embodiment of the present disclosure, there is an advantage in that the intensity and phase of electromagnetic waves in the micromagnetic field and millimeter wave band can be measured by minimizing distortion and removing noise caused by a temperature control device when measuring electromagnetic fields using an atomic system.

公开(公告)号：US20240414929A1

公开(公告)日：2024-12-12

申请号：US18397073

申请日：2023-12-27

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE ,  KOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY

Inventor： Won Suk SHIN ,  Hang Ken LEE ,  Chang Eun SONG ,  Kyung Geun LIM ,  Su Hyeon LEE

IPC: H10K30/82 ,  H10K30/40

Abstract: The present invention relates to a semiconductor device and a semiconductor material, and more specifically, to an organic semiconductor thin film transistor having a vertical structure, a fusion device of an optical semiconductor material, and a method of manufacturing the same, provides a vertical organic transistor including a substrate, a first electrode layer formed on the substrate, a lower charge transport layer formed on the first electrode layer, a photosensitive layer formed on the lower charge transport layer, an upper charge transport layer formed on the photosensitive layer, a second electrode layer including a base electrode formed on the upper charge transport layer, a plurality of pinholes formed in the base electrode and configured to provide a movement path of charges, and a metal oxide layer surrounding a surface of the base electrode and the pinholes, an organic active layer formed on the second electrode layer, and a third electrode layer formed on the organic active layer.

公开(公告)号：US12152982B2

公开(公告)日：2024-11-26

申请号：US17921706

申请日：2020-09-21

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Hyun Mo Cho ,  Dong Hyung Kim ,  Won Chegal ,  Yong Jai Cho

IPC: G01N21/21 ,  G01N21/11 ,  G01N21/75

Abstract: An embodiment of the present disclosure provides a multi-reflection silicon-based liquid immersion micro-channel measurement device and measurement method capable of improving measurement sensitivity by completely separating, through multi-reflection, first reflective light reflected by a sample detection layer and a second reflective light by a prism-buffer solution interface and by allowing the light to enter multiple times through the multi-reflection. The multi-reflection silicon-based liquid immersion micro-channel measurement device according to the embodiment of the present disclosure includes a micro-channel structure including a support, and one or more micro-channels formed on the support and each having a sample detection layer with a fixed bioadhesive material for detecting a sample, a sample injection unit configured to inject a buffer solution containing the sample into the micro-channel, a prism unit including a prism, and a reflection structure formed by coating a bottom surface of the prism with a mirror reflection material, the polarized light generating unit configured to generate polarized light, and the polarized light detecting unit configured to detect a polarization change of reflected light.