SUB-WAVELENGTH EXTREME ULTRAVIOLET METAL TRANSMISSION GRATING AND MANUFACTURING METHOD THEREOF
    41.
    发明申请
    SUB-WAVELENGTH EXTREME ULTRAVIOLET METAL TRANSMISSION GRATING AND MANUFACTURING METHOD THEREOF 有权
    亚波长极限超紫外线金属传输光栅及其制造方法

    公开(公告)号:US20140177039A1

    公开(公告)日:2014-06-26

    申请号:US14144222

    申请日:2013-12-30

    Abstract: A method of manufacturing a sub-wavelength extreme ultraviolet metal transmission grating is disclosed. In one aspect, the method comprises forming a silicon nitride self-supporting film window on a back surface of a silicon-based substrate having both surfaces polished, then spin-coating a silicon nitride film on a front surface of the substrate with an electron beam resist HSQ. Then, performing electron beam direct writing exposure on the HSQ, developing and fixing to form a plurality of grating line patterns and a ring pattern surrounding the grating line patterns. Then depositing a chrome material on the front surface of the substrate through magnetron sputtering. Then, removing the chrome material inside the ring pattern. Then, growing a gold material on the front surface of the substrate through atomic layer deposition. Lastly, removing the gold material on the chrome material outside the ring pattern as well as on and between the grating line patterns, thereby only retaining the gold material on sidewalls of the grating line patterns.

    Abstract translation: 公开了一种制造亚波长极紫外金属透射光栅的方法。 在一个方面,该方法包括在硅衬底的背表面上形成氮化硅自支撑膜窗,其两面被抛光,然后用电子束在衬底的前表面上旋涂氮化硅膜 抵制HSQ。 然后,在HSQ上执行电子束直接写入曝光,显影和固定以形成围绕光栅线图案的多个光栅线图案和环形图案。 然后通过磁控溅射在基板的前表面上沉积铬材料。 然后,移除环形图案内的铬材料。 然后,通过原子层沉积在基板的前表面上生长金材料。 最后,除去环形图案之外的铬材料上的金材料以及光栅线图案之间和之间的金材料,从而仅将金材料保留在光栅线图案的侧壁上。

    Three-state spintronic device, memory cell, memory array and read-write circuit

    公开(公告)号:US12293781B2

    公开(公告)日:2025-05-06

    申请号:US18261716

    申请日:2021-01-21

    Abstract: The three-state spintronic device includes: a bottom electrode, a magnetic tunnel junction and a top electrode from bottom to top. The magnetic tunnel junction includes: a spin-orbit coupling layer, a ferromagnetic free layer, a barrier tunneling layer, a ferromagnetic reference layer, three local magnetic domain wall pinning centers and domain wall nucleation centers. An antisymmetric exchange interaction is modulated, and the magnetic domain wall pinning centers are embedded in an interface between a heavy metal and the ferromagnetic free layer. The magnetic domain wall nucleation centers are at two ends of the ferromagnetic free layer. A current pulse flows through the spin-orbit coupling layer to generate a spin current and the spin current is injected into the ferromagnetic free layer. Under a control of all-electrical controlled, an effective field of a spin-orbit torque drives domain wall to move and displace.

    Symmetric memory cell and BNN circuit

    公开(公告)号:US12205630B2

    公开(公告)日:2025-01-21

    申请号:US18005101

    申请日:2020-08-24

    Abstract: Provided are a symmetric memory cell and a BNN circuit. The symmetric memory cell includes a first complementary structure and a second complementary structure, the second complementary structure being symmetrically connected to the first complementary structure in a first direction, wherein the first complementary structure includes a first control transistor configured to be connected to the second complementary structure, the second complementary structure includes a second control transistor, a drain electrode of the second control transistor and a drain electrode of the first control transistor being symmetrically arranged in the first direction and connected to a bit line, and the symmetric memory cell is configured to store a weight value 1 or 0.

    METHOD OF DESIGNING THIN FILM TRANSISTOR
    46.
    发明公开

    公开(公告)号:US20240005077A1

    公开(公告)日:2024-01-04

    申请号:US18250461

    申请日:2020-10-30

    CPC classification number: G06F30/39 G16C60/00 H01L29/786

    Abstract: A method of designing a thin film transistor device, including: calculating characteristic parameters of searched materials; screening the materials according to a characteristic parameter threshold to obtain first active layer materials; simulating the first active layer material as an active layer material in a thin film transistor device model to obtain a device characteristic of the thin film transistor device; screening the first active layer materials according to a device characteristic threshold to obtain second active layer materials; taking the second active layer material as the active layer material of the thin film transistor device to perform an experiment; and selecting another second active layer material to perform the experiment once again when an experiment result does not meet a preset requirement, and a design of the thin film transistor device is completed until the experiment result meets the preset requirement.

    ALL-ELECTRICALLY-CONTROLLED SPINTRONIC NEURON DEVICE, NEURON CIRCUIT AND NEURAL NETWORK

    公开(公告)号:US20230397504A1

    公开(公告)日:2023-12-07

    申请号:US18249805

    申请日:2021-05-17

    CPC classification number: H10N52/101 H10N52/85 H10N59/00 G06N3/063

    Abstract: Provided is an all-electrically-controlled spintronic neuron device, a neuron circuit and a neural network. The neuron device includes: a bottom antiferromagnetic pinning layer; a synthetic antiferromagnetic layer formed on the bottom antiferromagnetic pinning layer; a potential barrier layer formed on the ferromagnetic free layer, wherein a region of the ferromagnetic free layer directly opposite to the potential barrier layer forms a threshold region; a ferromagnetic reference layer formed on the potential barrier layer; wherein the potential barrier layer, the ferromagnetic reference layer and the ferromagnetic free layer form a magnetic tunnel junction; a first antiferromagnetic pinning layer and a second antiferromagnetic pinning layer formed on an exposed region of the ferromagnetic free layer except the region directly opposite the potential barrier layer, and located on two sides of the potential barrier layer; and a first electrode formed on the ferromagnetic reference layer.

    SPIN ORBIT TORQUE MAGNETIC RANDOM ACCESS MEMORY CELL, MEMORY ARRAY, AND MEMORY

    公开(公告)号:US20230276637A1

    公开(公告)日:2023-08-31

    申请号:US18003038

    申请日:2020-06-24

    CPC classification number: H10B61/10 H10N52/85

    Abstract: Provided are a spin orbit torque magnetic random access memory cell, a memory array and a memory, wherein the spin orbit torque magnetic random access memory cell includes: a magnetic tunnel and a selector; the selector is a two-dimensional material based selector; the magnetic tunnel junction is arranged above or below the selector; the magnetic tunnel junction includes an antiferromagnetic layer and a free layer; the free layer is adjacent to the antiferromagnetic layer; when the selector is turned on, the memory cell is conducted, a current generates a spin current which is injected into the free layer, and a magnetization direction of the free layer is switched by the exchange bias effect between the free layer and the antiferromagnetic layer. A deterministic magnetization switching of SOT-MRAM memory cell under zero magnetic field at room temperature may be implemented without an external magnetic field by using the exchange bias effect and applying an optimized bias voltage of the magnetic tunnel junction, so as to achieve a purpose of data writing and implement SOT-MRAM memory cell with double terminal structure.

    Apparatus and method for configuring or updating programmable logic device

    公开(公告)号:US11294660B2

    公开(公告)日:2022-04-05

    申请号:US16337978

    申请日:2017-04-21

    Abstract: An apparatus and a method for configuring or updating a programmable logic device are provided. The apparatus includes a control module and a storage module connected to the control module. The control module includes: a JTAG interface for connecting the control module to a JTAG host, and a configuration interface compatible with a to-be-configured programmable logic device. The control module is configured to: after receiving a first control instruction including configuration information via the JTAG interface, store the configuration information into the storage module; and after receiving a configuration instruction, read the configuration information to configure the to-be-configured programmable logic device. A configuration clock used in a process that the control module configures the to-be-configured programmable logic device is generated from the to-be-configured programmable logic device, the control module or an external clock source.

    Method for obtaining a contact resistance of a planar device

    公开(公告)号:US11215652B2

    公开(公告)日:2022-01-04

    申请号:US16065582

    申请日:2015-12-25

    Abstract: A method for obtaining a contact resistance of a planar device includes: obtaining a contact resistance of a planar device by using a potential measurement method, in the measurement of the surface potential distribution, the planar device is in a state of current flowing, a certain voltage drop is formed at a junction area of the device; extracting the voltage drop measured through the Kelvin microscope by using a linear fitting method; and dividing the measured voltage drop by the current flowing through the device, thereby accurately calculating the magnitude of the contact resistance at the junction area of the planar device. With the present invention, the contact resistance of the planar device can be precisely measured, which is suitable for the contact resistance measurement experiments of devices such as thin film transistors and diodes. The invention has the advantages of reasonable theory, accurate result, simple and easy operation, and is favorable for optimizing the device performance and establishing a complete electrical model of the device.

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