Abstract:
A process for the manufacture of a synthetic silica product by vapour-phase oxidation of a silica precursor material in a flame not less than 60 % of the silica in the deposited product being derived by oxidation of: (A) one or more straight chain volatile silicon compounds of the general formula: R3Si.O(SiR2O)n.SiR3 and/or (B) one or more cyclic volatile silicon compounds of the general formula: SinOn(R)2n. Doped or undoped fume powder, porous silica soot or fully densified bodies made by the process are also claimed.
Abstract:
Incorporation of fluorine into a porous silica body, such as an unsintered body produced by a sol-gel method, by VAD or OVPO, reduces or eliminates bubble or pore formation upon re-heating of the glass formed by sintering of the porous material. Effective fluorine concentrations are between 0.01 and 5% by weight. The invention can be used advantageously in producing preforms and optical fiber.
Abstract:
불꽃 중에서의 실리카 전구 물질의 기상 산화에 의한 합성 실리카 제품 제조 방법은 (A) 일반식 R 3 SiO(SiR 2 O) n SiR 3 로 표시되는 1종 또는 그 이상의 직쇄 휘발성 실리콘 화합물 및/또는 (B)일반식 Si n O n (R) 2n 으로 표시되는 1종 또는 그 이상의 환식 휘발성 실리콘 화합물의 산화로 이루어지고 증착무룽의 실리카는 60% 이상으로 되 전기한 방법에 의하여 제조된 혼이 또는 비혼입 연무 분말, 다공성 실리카 매연 또는 밀집체로 청구 되었음.
Abstract:
PROBLEM TO BE SOLVED: To provide an optical element having glass not containing alkali metal oxides as essential components and ensuring a small change in light path due to temperature changes as a component. SOLUTION: The optical element is used for light of 450-1,700 nm wavelength and has glass through which the light should propagate as a component or comprises glass through which the light should propagate, wherein dS/dT(=dn/dT+nα) expressed using the refractive index n of the glass to light of 1,550 nm wavelength, the rate dn/dT of temperature change of n at 25°C and the coefficient α of linear expansion at 25°C is ≤8.9×10 -6 /°C and the glass contains ≤1 mass% alkali metal oxides. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a substrate which is excellent in flatness and suitable for an EUV mask or an EUV mask blanks.SOLUTION: In a substrate for an EUV mask, material of the substrate is silica glass containing 1 to 12 mass% of TiO, surface roughness (rms) of the substrate is 2 nm or less in a surface quality region, and maximum stress variation (PV) of the substrate is 0.2 MPa or less in the surface quality region.
Abstract translation:要解决的问题:提供一种平面度优异且适用于EUV掩模或EUV掩模坯料的基板。解决方案:在用于EUV掩模的基板中,基板的材料是含有1〜12质量% TiO 2,表面质量区域的基板的表面粗糙度(rms)为2nm以下,表面质量区域的基板的最大应力变化(PV)为0.2MPa以下。