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    SYSTEM, METHOD AND FIXTURE FOR PERFORMING BOTH OPTICAL POWER AND WAVELENGTH MEASUREMENTS OF LIGHT EMITTED FROM A LASER DIODE
    42.
    发明申请
    SYSTEM, METHOD AND FIXTURE FOR PERFORMING BOTH OPTICAL POWER AND WAVELENGTH MEASUREMENTS OF LIGHT EMITTED FROM A LASER DIODE 有权
    用于实现激光二极管发出的光的两个光功率和波长测量的系统，方法和装置

    公开(公告)号：US20160197453A1

    公开(公告)日：2016-07-07

    申请号：US14588608

    申请日：2015-01-02

    Applicant: Applied Optoelectronics, Inc.

    Inventor： Guipeng Luo ,  Klaus Alexander Anselm ,  Hung-Lun Chang

    IPC: H01S5/00 ,  G01M11/00

    CPC classification number: H01S5/0014 ,  G01J1/0411 ,  G01J1/0451 ,  G01J1/4257

    Abstract: A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously detecting the light for performing a first test including the optical power measurement(s) and reflecting the light for performing a second test including the wavelength measurement(s). The testing fixture may include an angled photodetector and an optical coupling system such as a collimating lens, a focal lens and an optical waveguide. The testing fixture may be electrically connected to an optical power testing module, such as a light-current-voltage (LIV) testing module, for performing the optical power measurement(s) and may be optically coupled to a wavelength measurement module, such as an optical spectrum analyzer (OSA) for performing the wavelength measurement(s).

    Abstract translation: 双重测试系统和方法用于对激光二极管发射的激光进行光功率和波长测量，如激光二极管芯片（COS）激光二极管或激光二极管。 可以使用测试夹具来同时检测用于执行包括光功率测量的第一测试的光并反射用于进行包括波长测量的第二测试的光的测量。 测试夹具可以包括成角度的光电检测器和诸如准直透镜，聚焦透镜和光波导之类的光耦合系统。 测试夹具可以电连接到诸如光电压（LIV）测试模块的光功率测试模块，用于执行光功率测量，并且可以光学耦合到波长测量模块，例如 用于执行波长测量的光谱分析仪（OSA）。

    Optoelectronic-device wafer probe and method therefor
    43.
    发明授权
    Optoelectronic-device wafer probe and method therefor 有权
    光电器件晶圆探针及其方法

    公开(公告)号：US09040896B2

    公开(公告)日：2015-05-26

    申请号：US13539782

    申请日：2012-07-02

    Applicant: James Albert Walker

    Inventor： James Albert Walker

    IPC: G01J1/04 ,  G01J1/42

    CPC classification number: G01J1/0425 ,  G01J1/0411 ,  G01J1/0451 ,  G01J2001/4247

    Abstract: A probe card for wafer-level testing a plurality of optoelectronic devices on a wafer is provided. The probe card has both electrical and optical functionality. The probe card comprises a plurality of lenslets aligned with the plurality of optoelectronic devices to improve the optical coupling efficiency between each of the plurality of optoelectronic devices and a plurality of optical waveguides located on a probe head.

    Abstract translation: 提供了用于在晶片上晶圆级测试多个光电器件的探针卡。 探头卡具有电气和光学功能。 探针卡包括与多个光电子器件对准的多个小透镜，以改善多个光电器件中的每一个与位于探头上的多个光波导之间的光耦合效率。

    LASER BEAM MULTIPLEXER
    45.
    发明申请
    LASER BEAM MULTIPLEXER 失效
    激光束多路复用器

    公开(公告)号：US20090262432A1

    公开(公告)日：2009-10-22

    申请号：US12423316

    申请日：2009-04-14

    Applicant: Shoji Hirata

    Inventor： Shoji Hirata

    IPC: G02B27/10

    CPC classification number: G02B6/4296 ,  G01J1/0422 ,  G01J1/0451 ,  G01J1/08 ,  H01S5/4012 ,  H01S5/4087

    Abstract: A laser beam multiplexer capable of easily multiplexing a plurality of laser beams is provided. A laser beam multiplexer includes a multiplexing element having a hollow portion with a sectional elliptical shape, in which the multiplexing element includes: a plurality of light-incident apertures guiding laser beams from outside toward one of two focal points of the hollow portion, a reflective layer arranged on a wall surface of the hollow portion, and multiplexing a plurality of incident laser beams while reflecting the plurality of laser beams, and a light-emitting aperture guiding laser beams multiplexed by the reflective layer toward outside.

    Abstract translation: 提供能够容易地复用多个激光束的激光束多路复用器。 激光束多路复用器包括具有截面椭圆形状的中空部分的多路复用元件，其中多路复用元件包括：多个入射孔，其将来自外部的激光束引导到中空部分的两个焦点之一，反射 层叠在中空部的壁面上，并且多个入射的激光束同时反射多个激光束;以及发光孔，将由反射层多路复用的激光束引向外部。

    Systems and methods for aligning a laser beam with an optical fiber
    46.
    发明授权
    Systems and methods for aligning a laser beam with an optical fiber 失效
    将激光束与光纤对准的系统和方法

    公开(公告)号：US06493485B1

    公开(公告)日：2002-12-10

    申请号：US09368107

    申请日：1999-08-03

    Applicant: Eric Korevaar

    Inventor： Eric Korevaar

    IPC: G02B632

    CPC classification number: G02B6/4225 ,  G01J1/0266 ,  G01J1/0451 ,  G02B6/422 ,  G02B6/4227

    Abstract: A system for aligning a laser beam with the end of an optical fiber includes optics for focusing the laser beam toward the end of the optical fiber. A plurality of light receptors are positioned around the end of the optical fiber and, as intended for the present invention, each light receptor generates a light signal which is indicative of the light intensity from the laser beam that is incident on it. Connected with this plurality of light sensors is a comparator which creates an error signal that is proportional to a difference between selected light signals from the light receptors. The laser beam can then be moved relative to the end of the optical fiber in response to the error signal to align the laser beam with the end of the optical fiber. When alignment is achieved, the light signals will be substantially equal to each other and the error signal will be a null.

    Abstract translation: 用于将激光束与光纤端部对准的系统包括用于将激光束朝向光纤的端部聚焦的光学器件。 多个光接收器位于光纤端部周围，并且如本发明所期望的那样，每个光接收器产生指示入射到其上的激光束的光强度的光信号。 与该多个光传感器连接的是比较器，其产生与来自光接收器的所选择的光信号之间的差成比例的误差信号。 然后可以响应于误差信号使激光束相对于光纤的端部移动，以将激光束与光纤的端部对准。 当实现对准时，光信号将彼此基本相等，并且误差信号将为零。

    Device for measuring the spatial characteristics of a light source
    47.
    发明授权
    Device for measuring the spatial characteristics of a light source 失效
    用于测量光源的空间特性的装置

    公开(公告)号：US5543913A

    公开(公告)日：1996-08-06

    申请号：US342559

    申请日：1994-11-21

    Applicant: Eric L. Fallet

    Inventor： Eric L. Fallet

    IPC: G01J1/04 ,  G01J1/42 ,  G01J1/00

    CPC classification number: G01J1/04 ,  G01J1/0411 ,  G01J1/0425 ,  G01J1/0451 ,  G01J1/0474 ,  G01J2001/4247

    Abstract: The device according to the invention concerns a device for measuring the spatial characteristics of a light source (2) by means of a light-processing apparatus. The device includes a deformable light guide (4) intended to receive, at one of its ends (4.sub.1), the light passing through a movable optical system (5) for examining the light source (2) and transmitting the light, at the other one of its ends (4.sub.2), to a fixed optical system (8) for gathering and transmitting the light to the processing apparatus (3).

    Abstract translation: 根据本发明的装置涉及一种通过光处理装置测量光源（2）的空间特性的装置。 该装置包括可变形的光导件（4），用于在其一端（41）处接收通过用于检查光源（2）并在另一端透射光的可移动光学系统（5）的光 一个端部（42）连接到固定光学系统（8），用于收集和传送光到处理设备（3）。

    Optoelectric detection device especially for laser radiation
    48.
    发明授权
    Optoelectric detection device especially for laser radiation 失效
    光电检测装置特别适用于激光辐射

    公开(公告)号：US4411521A

    公开(公告)日：1983-10-25

    申请号：US156087

    申请日：1980-06-03

    Applicant: Francis Jourdan ,  Patrice Marquet ,  Francois Ternant

    Inventor： Francis Jourdan ,  Patrice Marquet ,  Francois Ternant

    IPC: G01J1/04 ,  G01S3/783 ,  G01S7/483 ,  G01S7/495

    CPC classification number: G01J1/04 ,  G01J1/0414 ,  G01J1/0437 ,  G01J1/0451 ,  G01J1/0474 ,  G01S3/783 ,  G01S7/483 ,  G01S7/495

    Abstract: A device for radiation detection over a broad field, especially for laser radiation detection. The device comprises a photodetector associated with an optical receiver formed by two diaphragms which delimit the field, and an optical diffusing element. In a preferred embodiment, a diffusing paint is deposited on a flat surface of a mechanical part, and a mirror for reflecting the diffused radiation makes it possible to mount at the rear end of the device either the photodetector or an optical fiber terminal to which the photodetector is remotely coupled.

    Abstract translation: 用于宽场辐射检测的装置，尤其适用于激光辐射检测。 该装置包括与由限定场的两个隔膜形成的光接收器相关联的光电检测器和光学漫射元件。 在优选实施例中，漫射涂料沉积在机械部件的平坦表面上，并且用于反射漫射辐射的反射镜使得可以在装置的后端安装光电检测器或光纤端子 光电检测器远程耦合。

    Slit pattern projecting apparatus having alignment detecting means
    49.
    发明授权
    Slit pattern projecting apparatus having alignment detecting means 失效
    狭缝图案投影装置具有对准检测装置

    公开(公告)号：US4357079A

    公开(公告)日：1982-11-02

    申请号：US87238

    申请日：1979-10-22

    Applicant: Yukinori Karasawa

    Inventor： Yukinori Karasawa

    IPC: G01M11/00 ,  A61B3/12 ,  A61B3/135 ,  G01J1/02 ,  A61B3/14 ,  A61B3/10 ,  G03B29/00

    CPC classification number: G01J1/02 ,  A61B3/135 ,  G01J1/0266 ,  G01J1/0451

    Abstract: A slit lamp device having a slit pattern projecting optical system for projecting an illumination light in a pattern of a slit to a patient's eye. An alignment detecting device is provided for detecting the alignment between the optical axis of the projecting system and the axis of the patient's eye. The device comprises one or more light receiving elements such as phototransistors which are located at one or both sides of the projecting optical axis and in the slit plane.

    Abstract translation: 一种狭缝灯装置，其具有狭缝图案投影光学系统，用于将狭缝图案中的照明光投射到患者眼睛。 提供了一种对准检测装置，用于检测投影系统的光轴与患者眼睛的轴线之间的对准。 该装置包括一个或多个光接收元件，例如位于投影光轴的一侧或两侧以及狭缝平面中的光电晶体管。

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