Abstract:
Vorrichtung für die korrelative Raster-Transmissionselektronenmikroskopie (STEM) und Lichtmikroskopie Die Erfindung betrifft eine Vorrichtung für die korrelative Raster-Transmissionselektronenmikroskopie (STEM) und Lichtmikroskopie. Um eine Vorrichtung für das korrelative Mikroskopieren zu schaffen, die eine verbesserte Kombination von lichtmikroskopischem und STEM-Verfahren ermöglicht, wird im Rahmen der Erfindung vorgeschlagen, daß ein STEM-Detektor (7) mit einer lichtoptischen Linse (8) kombiniert ist. Diese Detektionsvorrichtung kombiniert die effiziente Detektion mittels STEM-Mikroskopie von Materialien mit hoher Atomzahl, beispielsweise spezifischen Nanopartikel-Markern in einer Probe in einer Flüssigkeit, wie einer Zelle, mit gleichzeitiger Lichtmikroskopie.
Abstract:
An inspection apparatus is provided comprising in combination at least an optical microscope (2, 3, 4) and an ion- or electron microscope (7, 8) equipped with a source (7) for emitting a primary beam (9) of radiation to a sample (10) in a sample holder. The apparatus may comprise a detector (8) for detection of secondary radiation (11) backscattered from the sample and induced by the primary beam. The optical microscope is equipped with an light collecting device (2) to receive in use luminescence light (12) emitted by the sample and to focus it on a photon-detector (4).
Abstract:
A multibeam system in which a charged particle beam and one or more additional beams can be directed to the target within a single vacuum chamber. A first beam column preferably produces a beam for rapid processing, and a second beam column produces a beam for more precise processing. A third beam column can be used to produce a beam useful for forming an image of the sample while producing little or no change in the sample.
Abstract:
The invention concerns a column for producing a focused particle beam comprising: a device (100) focusing particles including an output electrode (130) with an output hole (131) for allowing through a particle beam (A); an optical focusing device (200) for simultaneously focusing an optical beam (F) including an output aperture (230). The invention is characterised in that said output aperture (230) is transparent to the optical beam (F), while said output electrode (130) is formed by a metallic insert (130) maintained in said aperture (230) and bored with a central hole (131) forming said output orifice.
Abstract:
An electron microscope and electron microscopy for observing the magnetization of samples with high resolution. The microscope comprises an electron beam projecting means including a scanning coil (3) and objectives lens (4) to irradiate a desired part of a sample (51) with an electron beam (2) emitted from an electron source (1); and a detector means including a quarter wave plate (8), polarizer (9), and photodetector (11) to detect circular-polarized light from the irradiated part of the sample. Since the intensity of the circular-polarized light generated from the sample irradiated with the electron beam varies depending upon the direction of magnetization of the irradiated part and detecting direction of the light, the distribution of magnetization can be measured when the scanned images are observed by using the intensity of the circular-polarized light as luminance signals while scanning the irradiated part on the surface of the sample (51).
Abstract:
Systém využívající množství analytických zařízení, jako jsou elektronový mikroskop (4), Ramanův mikroskop (6), iontový tubus (20) a mikroskop se skenovací sondou (24) pro analýzu vzorku (3) současnou, na sebe navazující nebo se vzájemnou korelací analýz provedených různými zařízeními ve stejném místěči oblasti vzorku (3). Systém využívá spojení optického objektivu (11) Ramanova mikroskopu (6) s manipulátorem (17) objektivu čímž podstatně zkracuje dobu potřebnou na provedení analýz Ramanovým mikroskopem (6) spolu s dalšími přístroji a to při zachování vysoké kvality snímaných signálů srovnatelné se samostatně stojícími analytickými zařízení.