Abstract:
Cost-efficient integration of a fully-featured EEPROM memory block in a FLASH-EPROM memory device, fabricated according to a low supply voltage and low consumption FLASH-EPROM process, is made possible by a special structure of the EEPROM cells whereby the capacitive coupling between the floating gate and the control gate of the cell is realized over the field oxide adjacent to the active area of the cell. The process of the invention permits an optimized modulation of the thicknesses of the different tunnel and gate oxides of the FLASH-EPROM and EEPROM cells as well as of the transistors of the peripheral circuitry of the two memory blocks destined to work with a relatively low supply voltage or with a boosted voltage.
Abstract:
A gain modulated sense amplifier, particularly for memory devices, that comprises a virtual ground latch structure (2) that has two output nodes (OUT-L, OUT-R) and has the particularity that it comprises an equalization transistor (7) of a first polarity that is adapted to equalize the two output nodes (OUT-L, OUT-R) and is connected between a first branch (8) and a second branch (9), in which the output nodes are arranged; the equalization transistor (7) is driven by an equalization signal (EQ) whose slope can be modulated as a function of the conductivity of the memory cell of the memory device involved in the reading operation.
Abstract:
A redundancy management method, particularly for non-volatile memories, having the particularity of comprising the steps of:
-- enabling, as a consequence of the presence of a pulsed read address transition signal of a memory line, and throughout the duration of the pulsed signal, the memory matrix line reading path, and blocking the selection of redundancy lines of the memory; and -- at the end of the pulsed signal, as a consequence of the absence/presence of a redundancy line read signal, confirming/disabling the selection of the lines of the memory matrix and blocking/releasing the selection of the redundancy lines.
A redundancy management architecture for a memory matrix, adapted to perform the above method, is also described.
Abstract:
A non-volatile memory device, having the particularity that it comprises an internal bus (3) for the transmission of data and other information of the memory to output pads (4); timer means (8); and means (5, 5') for enabling/disabling access to the internal bus; the timer means (8) time the internal bus to transmit information signals of the memory device that originate from local auxiliary lines (7) over the internal bus (3) when the bus is in an inactive period during a normal memory data reading cycle; the timer means (8) drive the enabling/disabling means (5, 5') to allow/deny access to the internal bus (3) on the part of the information signals or of the data from or to the memory.
Abstract:
A neural cellular network (10) for implementing a so-called Chua's circuit, and comprising at least first (11), second (12) and third (13) cells having respective first (I111, I121, I131) and second (I112, I122, I132) input terminals and respective state terminals (T11, T12, T13), the first (I111, II121, I131) and second (I112, I122, I132) input terminals being to receive a first (V1) and a second (V2) reference signal, respectively, and the first cell (11), and the second (12) and third (13) cells being of mutually different types.
Abstract:
The system described comprises various circuit units (10, 11, 12) each having a capacitor (C0, C1, C2) and charging means (G0, G1, G2) for defining a quantity depending upon the ratio (I/C) between the charging current and the capacitance of the capacitors. In order to compensate automatically for deviations of the actual capacitances from the nominal capacitances due to fluctuations in the parameters of the integrated-circuit manufacturing process, the system has a phase-locked loop (PLL) which uses one (10) of the circuit units as an adjustable oscillator, and current transducer means (17) which regulate the charging currents of the capacitors (C1, C2) of the circuit units (11, 12) in dependence on the regulated charging current of the capacitor (C0) of the oscillator (10) or the error current of the PLL loop.
Abstract:
A processing device for video signals comprising: a memory device (1) suitable to store discrete image elements of a video field; a filtering device (3) supplied by the memory device and suitable to recover errors introduced by the memory device. The filtering device (3) comprises: a filter (4) having an input supplied with digital signals representative of values of a plurality of discrete image elements (P1...P8,X) comprising an image element (X) to be examined and neighbouring image elements (P1...P8), the discrete image elements being stored in the memory device (1), and an output supplying digital signals (CO) representative of a filtered value of the image element to be examined (X); noise detector means (5) operating on fuzzy-logic rules having an input supplied with the digital signals representative of the plurality of values of the image elements (P1...P8,X) and an output supplying a weight signal (K) representative of a degree of erroneousness of the discrete image element to be examined (X), the noise detector circuit (5) determining the degree of erroneousness comparing the value of the image element to be examined (X) with the values of the neighbouring image elements (P1...P8); soft-switch means (7) having a first input supplied with the digital signals representative of the value of the image element to be examined (X), a second input supplied with the output (CO) of the filter (4), a third input supplied with the weight signal (K), and an output supplying digital signals (O) representative of a weighted average of the output of the filter (CO) and of the digital signals representative of the value of the image element to be examined (X) according to respective weights determined by the degree of erroneousness.
Abstract:
A device incorporating electrically programmable non-volatile memory cells for a small number of programming cycles, in which an individual cell is impressed, both during the write step and the erase step, a bias condition such that a charge flow can only occur between the drain region and the gate dielectric, and vice versa.
Abstract:
A process of fabricating a floating-gate memory device, the process including the steps of: forming a stack of superimposed layers including a floating gate region (20), a dielectric region (21), and a control gate region (22); and forming an insulating layer (35) of oxynitride to the side of the floating gate region to completely seal the floating gate region outwards and improve the retention characteristics of the memory device. The insulating layer (35) is formed during reoxidation of the sides of the floating gate region (20), after self-align etching the stack of layers (20-22) and implanting the source/drain of the cell.