反射型光学传感器及图像形成设备

    公开(公告)号:CN103676543A

    公开(公告)日:2014-03-26

    申请号:CN201310556618.1

    申请日:2013-09-11

    CPC classification number: G01N21/892 G01N21/55 G01N21/8903 G01N2201/0638

    Abstract: 一种反射型光学传感器及图像形成设备。该反射型光学传感器探测移动体的表面状况,并用于在记录介质上形成图像的图像形成设备,包括:光发射装置,其具有包括至少两个发光构件的多个光发射系统,和光发射光学系统,其具有相应于多个光发射系统并将光发射系统发射的光引导至移动体的多个光发射透镜;以及光接收装置,其具有包括至少两个光接收构件的光接收系统,和光接收光学系统,其具有相应于至少两个光接收构件并将移动体反射的光引导至光接收系统的光接收透镜。除反射型光学传感器外,图像形成设备还包括表面状况判断装置。

    표면 검사장치 및 표면 검사방법
    53.
    发明公开
    표면 검사장치 및 표면 검사방법 无效
    表面检查装置和表面检查方法

    公开(公告)号:KR1020160022962A

    公开(公告)日:2016-03-03

    申请号:KR1020140108153

    申请日:2014-08-20

    Abstract: 본발명은표면검사장치및 표면검사방법에관한것으로서, 더욱상세하게는표면의색깔이균일하지않은금속이나, 고분자재료등을포함하는불균일확산반사표면의이물검사가가능하도록하기위한표면검사장치및 표면검사방법에관한것이다.

    Abstract translation: 表面检查装置和表面检查方法技术领域本发明涉及表面检查装置和表面检查方法,更具体地涉及能够检测异物扩散反射面上的异物的表面检查装置和表面检查方法,所述异常扩散反射面包括金属,聚合物材料和 具有不规则表面颜色的类似物。 表面检查装置包括:照明部,其包括照亮目标的光源; 以及检测部,其包括由所述光源的光形成在所述靶的表面上的光传感器检测色。

    GASMESSSYSTEM
    54.
    发明公开
    GASMESSSYSTEM 审中-公开

    公开(公告)号:EP3401666A1

    公开(公告)日:2018-11-14

    申请号:EP17170667.4

    申请日:2017-05-11

    Abstract: Gasmesssystem, umfassend eine kohärente Lichtquelle (1, 201, 301, 401), welche einen Lichtstrahl aussendet; einen Detektor (8, 208, 308, 408); einen Strahlengang (2, 202, 302), der zwischen der Lichtquelle (1, 201, 301, 401) und dem Detektor (8, 208, 308, 408), ausgebildet ist; und eine Gas-Zelle (4, 204, 304, 404), welche im Strahlengang zwischen der Lichtquelle (1, 201, 301, 401) und dem Detektor (8, 208, 308, 408) angeordnet ist, so dass der Detektor (8, 208, 308, 408) das durch die Gas-Zelle (4, 204, 304, 404) transmittierte Licht empfängt; wobei die Gas-Zelle (4, 204, 304, 404) eine poröse Keramik (11, 211, 311, 411) umfasst; und wobei die Gas-Zelle (4, 204, 304, 404) eine optische Weglänge aufweist, welche ein Vielfaches der tatsächlichen Schichtdicke der Gas-Zelle (4, 204, 304, 404) ist; dadurch gekennzeichnet, dass ferner ein optisches Element (3, 203, 303, 403) im Strahlengang (2, 202, 302) zwischen der Lichtquelle (1, 201, 301, 401) und der Gas-Zelle (4, 204, 304, 404) angeordnet ist; dass der von der Lichtquelle (1, 201, 301, 401) ausgesandte Lichtstrahl beim Eintritt in die Gas-Zelle (4, 204, 304, 404) aufgeweitet und unfokussiert ist.

    ILLUMINATING DEVICE FOR INSPECTION, AND INSPECTION SYSTEM
    56.
    发明公开
    ILLUMINATING DEVICE FOR INSPECTION, AND INSPECTION SYSTEM 审中-公开
    照明设备检查和检查系统

    公开(公告)号:EP3249389A1

    公开(公告)日:2017-11-29

    申请号:EP15886429.8

    申请日:2015-08-04

    Inventor: MASUMURA Shigeki

    Abstract: [Object]
    To provide an inspection lighting device that allows identification of a light amount change within an observation solid angle of an imaging device under a constant condition even when a change in reflection, transmission, scattering occurring at a feature point on an inspection object is very small, thus allowing detection of a feature point providing only an extremely small change in the reflection, transmission, scattering.
    [Solution]
    In the inspection lighting device, between a surface light source 1 for emitting an inspection light and the inspection object W, at least one shielding mask M1 is disposed, and a lens 2 is disposed on a side closer to the inspection object W than the shielding mask M1 such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object W formed when the light emitted from the surface light source 1 is irradiated on to the inspection object W by the lens 2, the shielding mask M1 forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.

    Abstract translation: 本发明的目的在于提供一种检查用照明装置,即使在检查对象物的特征点产生的反射,透射,散射的变化为一定的情况下,也能够在一定的条件下识别摄像装置的观察立体角内的光量变化 非常小,因此允许检测仅提供反射,透射,散射的极小改变的特征点。 [解决方案]在检查照明装置中,在用于射出检查光的面光源1与检查对象W之间配置至少一个遮蔽掩模M1,在靠近检查对象W的一侧配置透镜2 与屏蔽罩M1相比,屏蔽罩以该透镜的焦点位置为中心定位。 在从面光源1发出的光被透镜2照射到检查对象W时形成的检查对象W的检查光的照射立体角中,遮挡掩模M1形成暗区域。 因此,根据在检查对象上的特征点发生的反射,透射,散射的变化,可以改变检查光的照射立体角的形状,大小,倾斜。

    VERFAHREN UND VORRICHTUNG ZUR ERMITTLUNG DER WIRKUNG VON WIRKSTOFFEN AN NEMATODEN UND ANDEREN ORGANISMEN IN WÄSSRIGEN TESTS
    57.
    发明公开
    VERFAHREN UND VORRICHTUNG ZUR ERMITTLUNG DER WIRKUNG VON WIRKSTOFFEN AN NEMATODEN UND ANDEREN ORGANISMEN IN WÄSSRIGEN TESTS 审中-公开
    用于测定活性物质对水溶液中线虫和其他生物体的影响的方法和装置

    公开(公告)号:EP3247990A1

    公开(公告)日:2017-11-29

    申请号:EP16700534.7

    申请日:2016-01-06

    Abstract: The invention relates to an apparatus (1) and a method for determining the effect of active ingredients on nematodes and other organisms in aqueous tests. The apparatus (1) according to the invention comprises a holder (13) for a cell culture plate (30) having a plurality of cavities (31) into which the nematodes can be filled with the active ingredients, wherein the cell culture plate (30) comprises an underside (33), an upper side (32) and side walls extending between the underside (33) and upper side (32), a camera (11) used to capture images of preferably the underside (33) of the cell culture plate (30), a lighting device (14) having at least one first light source (15), which illuminates the cell culture plate (30), wherein a first optical unit is arranged between the first light source (15) and a first side wall (34) of the cell culture plate (30) in the assembled state, said optical unit guiding the light of the first light source (15) through the first side wall (34) in the direction of the underside (33) of the cell culture plate (30). The method according to the invention enables many active ingredients to be investigated simultaneously in a very short time.

    INVERSE PHOTOELECTRON SPECTROSCOPY DEVICE
    58.
    发明公开
    INVERSE PHOTOELECTRON SPECTROSCOPY DEVICE 审中-公开
    反向FOTOELEKTRONENSPEKTROSKOPIEVORRICHTUNG

    公开(公告)号:EP3150992A1

    公开(公告)日:2017-04-05

    申请号:EP15798968.2

    申请日:2015-05-27

    Abstract: An inverse photoemission spectroscopy apparatus is configured to detect a light generated by the relaxation of electrons to an unoccupied state of a sample.The apparatus includes an electron source for generating electrons with which a sample is irradiated, a wavelength selector for extracting a light having a certain wavelength from the light generated in the sample, a photodetector for detecting the light extracted by the wavelength selector; and a focusing optics disposed between the sample and the photodetector. The electron source contains yttrium oxide as a thermionic emission material.

    Abstract translation: 反射光电子发射光谱装置被配置为检测由电子弛豫产生的光到样品的未占据状态。该装置包括用于产生照射样品的电子的电子源,用于提取具有 从样品中产生的光的一定波长,用于检测由波长选择器提取的光的光电检测器; 以及设置在样品和光电检测器之间的聚焦光学元件。 电子源包含氧化钇作为热离子发射材料。

    SERIES ABSORBANCE GLASS AND INTERFERENCE FILTERS
    59.
    发明公开
    SERIES ABSORBANCE GLASS AND INTERFERENCE FILTERS 审中-公开
    系列吸收玻璃和干涉滤光片

    公开(公告)号:EP2986957A4

    公开(公告)日:2017-03-15

    申请号:EP15785338

    申请日:2015-04-29

    Abstract: An imaging assembly and processing system that includes a sample platform having a target region which can hold a sample, where the sample can be marked with fluorescent or phosphorescent markers. The imaging assembly can have an excitation light module proximate to the sample platform that emits light to excite the markers, and a lens module positioned to receive emission light from excited markers in target region. At least one series filter assembly or interference filter can be arranged in front of, behind, or both in front of and behind the lens module. The assembly includes a light sensor and a processor and imaging module configured to process data captured by the light sensor. Images of the sample are generated based on the emission light from the sample that transmit through and are filtered by the lens assembly and series filter assembly or interference filter.

Patent Agency Ranking