公开(公告)号：US20210172731A1

公开(公告)日：2021-06-10

申请号：US16610664

申请日：2018-08-14

Applicant: Korea Research Institute of Standards and Science

Inventor： Young-sik Ghim ,  The-mahn Nguyen ,  Hyug-gyo Rhee

IPC: G01B11/24 ,  G01B11/25 ,  H04N5/235

Abstract: The present disclosure is directed to a system and a method for compensating non-linear response characteristics in measuring the shape of an object using phase-shifting deflectometry. More particularly, the present disclosure is directed to a method for compensating non-linear response characteristics in phase-shifting deflectometry including steps of: generating a pattern by a pattern generating portion and projecting the same to a measurement object; obtaining an image of a deformed pattern reflected from the measurement object by a detector; linearizing non-linear responses on the basis of a look up table considering non-linear response characteristics of the pattern generating portion and the detector by a compensation means; and compensating phase-shifting amounts generated due to non-linear response characteristics by the compensation means.

公开(公告)号：US20210050509A1

公开(公告)日：2021-02-18

申请号：US16654647

申请日：2019-10-16

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Kyoung-Woong Moon ,  Chan Yong Hwang

IPC: H01L43/08

Abstract: Disclosed is a method of forming a doughnut-shaped skyrmion, the method including heating a local area of a vertical magnetic thin film magnetized in a first direction, which is any one of an upward direction and a downward direction, applying a magnetic field having a second direction, which is opposite the first direction, and having intensity higher than coercive force of the vertical magnetic thin film to the vertical magnetic thin film to form a first area magnetized in the second direction, applying a magnetic field having the second direction to the vertical magnetic thin film to form a second area, which is an extension of the first area, and applying a magnetic field having the first direction to the vertical magnetic thin film to form a third area magnetized in the first direction in the second area.

公开(公告)号：US20210025549A1

公开(公告)日：2021-01-28

申请号：US16477017

申请日：2018-01-16

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Nam Goo KANG ,  Sang Hyub OH

IPC: F17C13/02 ,  G01F1/34

Abstract: The present invention relates to a method for determining loss of gas in a gas container. According to an embodiment of the present invention, the method for determining the loss of gas in the gas container is characterized by including the steps of (a) filling a first container (10) with a component gas and a balance gas, (b) measuring a gas pressure inside the first gas container (11), (c) allowing the first gas container and a second gas container having an evacuated inside to communicate and performing a first-stage gas pressure split, and (d) measuring a gas pressure inside the second gas container, wherein an amount of the component gas adsorbed inside the gas container is calculated through a difference between a measured value of step (b) and a measured value of step (d) and is determined as an amount of gas loss.

公开(公告)号：US20200152368A1

公开(公告)日：2020-05-14

申请号：US16574591

申请日：2019-09-18

Applicant: Korea Research Institute of Standards and Science

Inventor： Seong Min HWANG ,  Jeong Hyun SHIM ,  Ingo HILSCHENZ ,  Seong-Joo LEE ,  Kiwoong KIM

IPC: H01F27/10 ,  H01F27/28 ,  G01R33/34

Abstract: A fluid-cooled electromagnet includes an upper housing, a lower housing vertically aligned with the upper housing, a plurality of pancake coils disposed between the upper housing and the lower housing to be spaced apart from each other and sequentially stacked to have a washer shape, and at least one spacer, disposed between the upper housing and the lower housing, accommodating the pancake coils at regular intervals.

公开(公告)号：US20200146631A1

公开(公告)日：2020-05-14

申请号：US16574573

申请日：2019-09-18

Applicant: Korea Research Institute of Standards and Science

Inventor： Kiwoong KIM

IPC: A61B5/00 ,  A61B5/04 ,  A61B5/0478

Abstract: A bioelectrical signal measuring apparatus includes a mucosa contact electrode brought into contact with a nasal cavity mucosa or an oral cavity mucosa to apply a negative pressure and to measure a bioelectrical signal, an insertion tube, having one end supporting the mucosa contact electrode, inserted into a nasal cavity and bent, and a lead wire, connected to the mucosa contact electrode and connected to an amplifier disposed outside, extending in the insertion tube.

公开(公告)号：US10585151B2

公开(公告)日：2020-03-10

申请号：US15097912

申请日：2016-04-13

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Kwon-Kyu Yu ,  Yong-Ho Lee ,  Kiwoong Kim ,  Jin-Mok Kim ,  Hyukchan Kwon ,  Sang-Kil Lee

IPC: A61B5/00 ,  G01R33/035 ,  A61B5/04 ,  G01R33/00 ,  G01R33/022

Abstract: Superconducting quantum interference device (SQUID) sensor module and a magnetoencephalography (MEG) measuring apparatus. The SQUID sensor module includes a fixed block having one end fixed to the sensor-mounted helmet, a bobbin having one end combined with the other end of the fixed block and having a groove in which a pick-up coil is wound, a bobbin fixing or attachment structure or material fixed to the other end of the fixed block via a through-hole formed in the center of the bobbin, a SQUID printed circuit board (PCB) disposed one an upper side surface of the bobbin and including a SQUID sensor, and a signal line connection PCB inserted into an outer circumferential surface of the fixed block and adapted to transmit a signal detected in the SQUID sensor to an external circuit.

公开(公告)号：US10466031B2

公开(公告)日：2019-11-05

申请号：US15538846

申请日：2016-08-26

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Young-Sik Ghim ,  Hyug-Gyo Rhee ,  Yun Woo Lee

IPC: G01B9/02 ,  G01B11/06 ,  G06F17/16 ,  G06F17/17 ,  G01B11/24

Abstract: The present disclosure relates to an apparatus for measuring a thickness and a surface profile of a multilayered film structure using an imaging spectral optical system and a measuring method. More specifically, the present disclosure relates to a method and an apparatus which measure a thickness and a surface profile of a multilayered thin film structure by applying a method for obtaining an absolute reflectance value for an object to be measured having a multilayered thin film using a reflected light measuring method and extracting a phase from an interference signal with a reference mirror using a phase shift algorithm.

公开(公告)号：US20190250013A1

公开(公告)日：2019-08-15

申请号：US16242788

申请日：2019-01-08

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Jong-Ahn KIM ,  Jae-Wan KIM ,  Jae-Yong LEE ,  Jonghan JIN ,  Jae-Heun WOO

IPC: G01D5/347

Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.

公开(公告)号：US20190235000A1

公开(公告)日：2019-08-01

申请号：US16332349

申请日：2016-10-27

Applicant: Korea Research Institute of Standards and Science

Inventor： Young-Pyo HONG ,  Hyunji KOO ,  No-Weon KANG ,  Dong-Joon LEE

IPC: G01R27/28 ,  G01R29/08 ,  G01R31/319 ,  H01L23/498 ,  G01R31/28

Abstract: An electromagnetic wave impedance measuring apparatus includes a network analyzer, configured to measure scattering parameters according to a frequency, including a first port and a second port; and a multilayer substrate, connected to the first port and the second port by a coaxial cable, having a via connecting conductive layers to each other and including three or more conductive layers including at least an uppermost layer, a lowermost layer, and an intermediate layer. The multilayer substrate includes a test sample disposed between the uppermost layer and the lowermost layer; a through calibration standard disposed between the uppermost layer and the lowermost layer; a reflect calibration standard disposed between the uppermost layer and the lowermost layer; and a line calibration standard disposed between the uppermost layer and the lowermost layer. Each of the test sample, the through calibration standard, the reflect calibration standard, and the line calibration standard is connected by a first error box, having the via, and a second error box having the via of the same structure as the via of the first error box.

公开(公告)号：US10312049B2

公开(公告)日：2019-06-04

申请号：US15576686

申请日：2016-08-11

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Bok Lae Cho ,  Sang Jung Ahn ,  Inho Sul

IPC: H01J37/16 ,  H01J37/20 ,  H01J37/26 ,  G02B21/00 ,  G02B21/02 ,  G02B21/06 ,  G02B21/36 ,  H01J37/18 ,  H01J37/22 ,  H01J37/244 ,  H01J37/285

Abstract: A vacuum sample chamber for a particle and optical device includes on one surface thereof, an aperture through which a particle beam to be focused along an optical axis of particles such as electrons, ions and neutral particles is incident; and on the opposite surface thereof, a detachable sample holder through which light penetrates, thereby enabling a sample to be observed and analyzed by means of the particle beam and light. A sample chamber is capable of reducing observation time by maintaining a vacuum therein even when a sample is put into or taken out from a sample chamber of an electron microscope or focused ion beam observation equipment, and capable of obtaining an optical image on the outside thereof without inserting a light source or an optical barrel into the sample chamber. A light-electron fusion microscope comprising the sample chamber.