Abstract:
A high density programmable logic device (PLD) having sense amplifiers and OR gates configured to increase operation speed and reduce transistor count from previous circuits as well as to provide a selectable power down mode on a macrocell-by-macrocell basis. The sense amplifiers include a single cascode in the data path connecting a product term of the OR gates. The OR gates utilize a plurality of source follower transistors followed by pass gates to provide logic allocation enabling the sense amplifier outputs to be reduced from the 0.0 V - 5.0 V CMOS rails to increase switching speed while reducing overall transistor count. Amplifying inverters normally provided in the sense amplifiers to provide the CMOS rail-to-rail switching and which would require complex feedback for providing power down on a macrocell-by-macrocell basis are moved forward into OR output circuits. Power down on a macrocell-by-macrocell basis is provided by selectively sizing the amplifying inverters in the OR output circuits.
Abstract:
A tungsten chemical-mechanical polishing slurry formulated from small median diameter abrasive particles having a very tight diameter variation and by thoroughly premixing the abrasive with a surfactant suspension agent before combining the oxidizer.
Abstract:
A user programmable motor control (PMC) for controlling a brushless D.C. motor is disclosed. In the PMC, an instructive program consisting of opcodes is inputted to a Micro Sequencer (1) which initiates and sequences the execution of the user's instruction. The user also inputs to Control Block (6) a desired motor speed and direction. The Control Block (6) generates a pulse width control value (PWC) to a PWM Generator (8). The PWM Generator (8) utilizes the PWC value to generate timing pulses, and through Programmalbe Commutation Logic/Driver Enable Logic (11), to control the motor speed. The motor performance information (15, 16) is fed back to user from Control Block (6). A Dead time Generator (18) sets the dead time internal (19) to insure that commutation switch overlap does not occur. The use of opcodes and the associated circuitry enables the PMC to perform various polling, branching and waiting logic to occur within one machine cycle.
Abstract:
A power controller for supplying separately a regulated power soux8e to a plurality of "S" (S0, S1, S2, S3) lines and for monitoring line-status conditions on the ''S'' line so that each "S" line is controlled independently includes an analog section (Vs, VCC, GND) for delivering power independently to each of the "S" lines and for detecting line-status conditions on "S" lines. The power controller also includes microprocessor interface section (14) for communicating with the microprocessor (11) and for controlling the analog section. The analog section is formed of a plurality of output drivers (26) for supplying individually the power to the plurality of "S" lines and line-status detector circuits (24) for sensing line-status conditions on the "S" lines to provide a set of status logic signals for each "S" line. The microprocessor interface section includes an address register (18) for storing a plurality of addresses corresponding to the line-status conditions to be monitored on the "S" lines. Decoder/multiplexers (20) are provided for selecting a particular one of the line-status conditions in response to the addresses so that the same line-status condition for all "S" line is readable simultaneously by the microprocessor. A data register (20) receives control signals from the microprocessor upon reading of the line status conditions so as to switch off independently each of the output drivers to control power to the "S" lines.
Abstract:
A page mode write system for an E PROM array including active latches (48) for storing loaded data on bit lines (14), independent bit line grounds (28) for isolating the cells (8) in a byte (40), and program gate lines (38) in each byte (40) for tagging those bytes (40) that will undergo a charge/discharge cycle during the write cycle.
Abstract:
An integrated circuit device (10 in Fig. 2; 105 in Fig. 5) containing internal logic and/or memory circuitry (19; 114, 115) is provided with means to receive multiple inputs at the voltage levels of different logic families (Pi-Pi) and with means to provide multiple outputs at the voltage levels of different logic families (Pj-Pn). On-chip input translators (15, 17; 106, 108, 110, 112) receive the inputs at the level of a given logic family and translate to the level required by the internal logic and/or memory circuitry. After performance of logic and/or memory functions, on-chip output translators (16, 18; 107, 109, 111, 113) translate the otput of the internal logic and/or memory circuitry and provide external outputs at the voltage levels of different logic families. The internal logic and/or memory circuitry may be of a single logic family or may be composed of several logic families. On-chip translators may also be added between internal logic and/or memory circuitry of different families (116, 117).
Abstract:
Process for the planarization of an integrated circuit structure (30) by a two stage planarization process which comprises: applying over a metallization layer (40, 42, 44), having one or more openings (46, 48) therein, a layer of insulation (50') sufficiently thin to avoid formation of voids in the portion of the insulation applied in the openings in the metallization layer; smoothing the insulation layer by removing the high portions of the insulation by, for example, dry etching the insulation; applying a further layer of insulation (70) over the first insulation layer; and smoothing the further layer of insulation by removing the high portions by, for example, dry etching; whereby the resultant smoothed insulation surface will be substantially planar and substantially void-free. In a preferred embodiment, a second material, such as a photoresist material (60, 80), is coated over the insulation layer prior to the smoothing step, particularly when an anisotropic dry etching process is used, to insure that only the high portions of the insulation layer are removed in the etching step.
Abstract:
A method for forming vertically spaced apart regions on an integrated circuit substrate (10). One or more recesses (28) are formed in inactive regions of the substrate, while the remaining surface of the substrate remains substantially flat. When an epitaxial layer (30) is deposited over the substrate, the recesses in the substrate cause the formation of corresponding recesses (32) in the exposed surface of the epitaxial layer. Such recesses are useful as alignment marks in properly locating the masks used in defining active regions on the surface of the epitaxial layer.
Abstract:
An improved integrated circuit structure characterized by enhanced step coverage and a method of making it. The structure comprises a base layer of silicon, a first oxide layer on the silicon layer, strips of poly silicon (10) having selected portions thereof reacted with a metal capable of forming a metal silicide (60) in situ on the surface of the poly silicon strips, a further oxide layer (62) over the metal silicide, and a metal layer (65) providing electrical contact to selected portions of the structure. The construction makes it possible to remove all of an intermediate oxide layer during manufacture except for an oxide layer (50a) above the poly load resistor (10d). This elimination of one oxide layer, together with the integration of the conductive metal silicide and underlying poly silicon into one layer and the rounding of the metal silicide edge with oxide spacers (58) via anisotropic etching of the intermediate oxide layer, permits better step coverage for the resulting structure .
Abstract:
An output voltage driver apparatus for an ECL circuit driving a capacitive load (CL) which comprises an emitter follower means (117) having an output emitter (118) and a reference emitter (120). The output emitter is connected to the capacitive load. A pull-down transistor means (123) is connected to the output emitter and provides a transient pull-down current for a capacitive load when the output voltage swings from a high level to a low level. A biasing means (125) is connected between the reference emitter of the emitter follower means and the pull-down transistor means so that the pull-down transistor means is biased to turn on when the voltage at the output emitter is higher than the voltage at the reference emitter by a turn-on voltage. Because the capacitive load will hold the voltage of the output emitter higher than that of the reference emitter until the capacitance of the load is discharged, the pull-down transistor means provides a transient pull-down current which speeds up the switching time of the emitter couple logic circuit.