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    APPARATUS AND PROCESS FOR DETECTING AND COUNTING FLUORESCENT PARTICLES CARRIED ON A SOLID SUPPORT
    71.
    发明申请
    APPARATUS AND PROCESS FOR DETECTING AND COUNTING FLUORESCENT PARTICLES CARRIED ON A SOLID SUPPORT 审中-公开
    用于检测和计数支持固体支持的荧光颗粒的装置和方法

    公开(公告)号：WO1989008834A1

    公开(公告)日：1989-09-21

    申请号：PCT/FR1989000095

    申请日：1989-03-08

    Applicant: CHEMUNEX ,  VAN HOEGAERDEN, Michel

    Inventor： CHEMUNEX

    IPC: G01N21/64

    CPC classification number: G01N21/6456 ,  G01N15/1468 ,  G01N15/1475 ,  G01N21/6428 ,  G01N2021/0162 ,  G01N2201/1053 ,  G01N2201/1087

    Abstract: Device for detecting and counting particles which are fluorescent or made fluorescent, carried by a solid support, and a process for detecting said particles by means of said device. The device for detecting and counting particles which are normally present or may be contained in the form of contaminants in a liquid or gas fluid, or in a product in particular a food or hygenic product, by fluorimetry, comprises a light source (10), means for focusing(12) a beam from said light source and at least one means for detecting (40) the fluorescent light emitted by the particles present (60), and also comprises: a support (50) suitable for collecting particles which are naturally fluorescent or have been made fluorescent by means of at least one suitable stain chosen from the group which comprises the vital stains, the stains with a positive viability and fluorescent substances carried by antibodies and/or nucleic probes; means for scanning (21, 31, 35) the totality of the support surface to be analysed by said light beam; and a microprocessor (45) provided with at least one means for recording and counting simultaneously electrical signals transmitted by the detection device(s) (40) and the scanning system (21, 31, 35).

    Dynamic wafer stress management system
    73.
    发明专利
    Dynamic wafer stress management system 审中-公开
    动态应变管理系统

    公开(公告)号：JP2008177579A

    公开(公告)日：2008-07-31

    申请号：JP2008010257

    申请日：2008-01-21

    Applicant: Wafermasters Inc ,  ウェーハマスターズ・インコーポレイテッドWafermasters,Inc.

    Inventor： YOO WOO SIK ,  KANG KITAEK

    IPC: H01L21/66 ,  G01N21/956

    CPC classification number: G01B11/306 ,  G01B11/2513 ,  G01N21/4788 ,  G01N21/94 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G01N2021/95615 ,  G01N2201/1053

    Abstract: PROBLEM TO BE SOLVED: To provide systems and techniques for measuring the characteristics such as the stress or the like of a sample by using optical techniques.
    SOLUTION: In sample characteristics measuring systems, light may be incident on a sample 110 in the form of a pre-defined pattern which impinges on the surface of a wafer, and the reflection of the pattern is detected at a detector 115. The information indicating a change in the pattern after reflection can be used for determining one or more sample characteristics and/or one or more pattern characteristics such as stress, warpage, and curvature. A probe beam 108 can be coherent light with a single wavelength or light with multiple wavelengths. The pattern can be generated by the transmission of light through a diffraction grating or hologram. A light source 120 can be incoherent or multi-wavelength. The pattern can be generated by imaging the pattern arranged on a mask on the sample and re-imaging the pattern by the detector.
    COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题：通过使用光学技术来提供用于测量样品的应力等的特性的系统和技术。 解决方案：在采样特性测量系统中，光可以以冲击在晶片表面上的预定图案的形式入射到样品110上，并且在检测器115处检测图案的反射。 指示反射后的图案的变化的信息可以用于确定一个或多个样品特性和/或一个或多个图案特性，例如应力，翘曲和曲率。 探测光束108可以是具有单个波长的相干光或具有多个波长的光。 该图案可以通过衍射光栅或全息图的透射来产生。 光源120可以是不相干的或多波长的。 可以通过对布置在样品上的掩模上的图案进行成像并通过检测器对图案重新成像来生成图案。 版权所有（C）2008，JPO＆INPIT

    Mapping measurement apparatus
    74.
    发明专利
    Mapping measurement apparatus 有权
    映射测量装置

    公开(公告)号：JP2005127908A

    公开(公告)日：2005-05-19

    申请号：JP2003364804

    申请日：2003-10-24

    Applicant: Jasco Corp ,  日本分光株式会社

    Inventor： SOGA YOSHIAKI ,  KOSHOBU JUN ,  TSUKADA HIROSHI

    IPC: G01N21/27 ,  G01N21/59

    CPC classification number: G01N21/3563 ,  G01N21/55 ,  G01N21/59 ,  G01N2201/1053 ,  G01N2201/117

    Abstract: PROBLEM TO BE SOLVED: To provide a mapping measurement apparatus for implementing mapping measurement using a simple apparatus constitution. SOLUTION: The mapping measurement apparatus 10 is provided with a light irradiating means 12 for irradiating a sample with a light and a light detecting means 14 for detecting a light reflected from or transmitted through the sample via an aperture 16, limits the light detected by the light detecting means 14 to the light from a predetermined measured region by leading the light reflected from or transmitted through the sample to the aperture 16, and implements the mapping measurement within a predetermined range of the sample by changing and measuring the measured region. A detecting scan mirror 18 is provided on an optical path from the sample 28 to the aperture 16, and has a reflecting face with a movable orientation. Since the reflecting face of the scan mirror 18 is variable in an incident direction of the reflected light or the transmitted light, the measured region detected by the light detecting means 14 can be changed. COPYRIGHT: (C)2005,JPO&NCIPI

    Abstract translation: 要解决的问题：提供一种使用简单的装置结构实现映射测量的映射测量装置。 解决方案：映射测量装置10设置有用于用光照射样品的光照射装置12和用于检测通过孔16反射或透过样品的光的光检测装置14，限制光 由光检测装置14检测到来自预定测量区域的光，将通过样品反射或透射的光引导到孔16，并通过改变和测量测量区域在样品的预定范围内实现映射测量 。 检测扫描镜18设置在从样品28到孔16的光路上，并且具有可移动取向的反射面。 由于扫描镜18的反射面在反射光或透射光的入射方向上是可变的，所以可以改变由光检测装置14检测到的测量区域。 版权所有（C）2005，JPO＆NCIPI

    OPTICAL ILLUMINATION APPARATUS AND METHOD
    76.
    发明申请
    OPTICAL ILLUMINATION APPARATUS AND METHOD 审中-公开
    光学照明装置和方法

    公开(公告)号：WO2009144614A1

    公开(公告)日：2009-12-03

    申请号：PCT/IB2009/052055

    申请日：2009-05-18

    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  VAN DIJK, Erik, M., H., P. ,  HEZEMANS, Cornelius, A.

    Inventor： VAN DIJK, Erik, M., H., P. ,  HEZEMANS, Cornelius, A.

    IPC: G01N21/64 ,  G02B21/00

    CPC classification number: G01N21/6452 ,  G01N2021/6463 ,  G01N2201/1053 ,  G02B21/0032

    Abstract: An optical system for detecting light from a 2D area of a sample (36) comprises a collection lens (34) for collecting light from a collection region of the sample. A light detector (44) is positionally fixed with respect to the sample, and a reflector arrangement (61) directs collected light to the detector. The reflector arrangement comprises movable components and the collection lens (34) is movable relative to the sample. The collection lens and the movable components are configurable to define different collection regions, and the movement of the components effects a direction of the light from the collection region to a substantially unchanged area of the light detector (44). This arrangement avoids the need for a bulky detector in order to detect signals from a 2D sample area formed by scanning across the sample.

    Abstract translation: 用于检测来自样品（36）的2D区域的光的光学系统包括：收集透镜（34），用于收集来自样品的收集区域的光。 光检测器（44）相对于样品位置固定，反射器装置（61）将收集的光引导到检测器。 反射器装置包括可移动部件，并且收集透镜（34）可相对于样品移动。 收集透镜和可移动部件可配置为限定不同的收集区域，并且部件的移动影响来自光收集区域的光的方向到光检测器（44）的基本上不变的区域。 这种布置避免了对庞大检测器的需要，以便检测来自通过扫描样品形成的2D样品区域的信号。

    A NON-IONISING IMAGER
    77.
    发明申请
    A NON-IONISING IMAGER 审中-公开
    非离子成像器

    公开(公告)号：WO2008119964A8

    公开(公告)日：2009-01-08

    申请号：PCT/GB2008001085

    申请日：2008-03-28

    Applicant: UNIV STRATHCLYDE ,  UNIV DUNDEE ,  GIRKIN JOHN MICHAEL ,  POLAND SIMON ,  LONGBOTTOM CHRISTOPHER

    Inventor： GIRKIN JOHN MICHAEL ,  POLAND SIMON ,  LONGBOTTOM CHRISTOPHER

    IPC: A61B5/00 ,  G01N21/49

    CPC classification number: A61B5/0088 ,  A61B5/0082 ,  G01N21/359 ,  G01N21/49 ,  G01N2021/4707 ,  G01N2021/4719 ,  G01N2201/1053 ,  G01N2201/1085

    Abstract: A medical imager, primarily for use in oral and dental applications. The imager has a source for providing a plurality of collimated beams of non-ionising radiation, in particular near-infrared light, and a plurality of correlated detectors. Each detector is arranged to receive unscattered light from one or part of one of said collimated beams and scattered light from one or more other beams. The imager further comprises means for using both the unscattered and scattered light to form an image.

    Abstract translation: 一种医用成像仪，主要用于口腔和牙科应用。 成像器具有用于提供多个非电离辐射的准直束，特别是近红外光的源和多个相关检测器的源。 每个检测器布置成从所述准直束中的一个或一部分接收未散射的光并且来自一个或多个其它光束的散射光。 成像器还包括使用未散射光和散射光两者来形成图像的装置。

    THREE DIMENSIONAL SCANNING SYSTEM
    79.
    发明申请
    THREE DIMENSIONAL SCANNING SYSTEM 审中-公开
    三维扫描系统

    公开(公告)号：WO1992021277A1

    公开(公告)日：1992-12-10

    申请号：PCT/US1992004176

    申请日：1992-05-19

    Applicant: BEATY, Elwin, M.

    Inventor： PALM, Steven, G.

    IPC: G02B26/08

    CPC classification number: G02B26/101 ,  G01B11/02 ,  G01N21/88 ,  G01N21/93 ,  G01N2021/8887 ,  G01N2021/95638 ,  G01N2201/102 ,  G01N2201/1053 ,  Y10S359/90

    Abstract: A part scanning and part calibration apparatus and mechanism for the inspection of printed circuit boards and integrated circuits. The invention provides a method of inspecting small parts (30) that utilizes a camera (22) and two rotating mirrors (16, 18) to provide an image of a pattern masked reticle upon which a precise pattern has been deposited. A third overhead mirror (14A) is provided to view the part (30) under inspection from another perspective. State values of a system are provided that create a triangulation of the scene whereby certain dimensions of the system can be calibrated. The method and apparatus of the invention allow the elimination of a second camera and utilization of an imaging camera that is of lower resolution and thus lower cost than previously known schemes. By knowing the precise location of the camera and the optical access of each rotatable mirror the method of the invention allows the calibration of the remaining state variables of the system. A precise reticle mask (10) is provided with dot patterns which provide an additional set of information which is needed to calibrate the system. The method proceeds by inspecting the reticle and retaining the state values as the reticle is scanned. By scanning more than one dot pattern the missing state values can be resolved using an iterative trigonometric solution.

    다채널 형광 검출 모듈 및 이를 포함하는 핵산 분석 시스템
    80.
    发明公开
    다채널 형광 검출 모듈 및 이를 포함하는 핵산 분석 시스템 审中-实审
    多通道荧光检测模块和具有相同功能的核酸分析系统

    公开(公告)号：KR1020150015289A

    公开(公告)日：2015-02-10

    申请号：KR1020130091171

    申请日：2013-07-31

    Applicant: 삼성전자주식회사

    Inventor： 김경호 ,  정원석 ,  지성민 ,  김준호 ,  남궁각 ,  박진성

    IPC: G01N35/08 ,  G01N21/64 ,  C12Q1/68

    CPC classification number: G01N21/6486 ,  G01N2021/6421 ,  G01N2201/0612 ,  G01N2201/062 ,  G01N2201/103 ,  G01N2201/1053 ,  G01N35/08 ,  C12Q1/6816 ,  C12Q1/6834 ,  G01N21/64

    Abstract: 다채널 형광 검출 모듈 및 이를 포함하는 핵산 분석 시스템이 개시된다. 일 실시예에 따른 핵산 분석 시스템은, 미세 유체 소자를 포함하는 다수의 카트리지들이 각각 배치될 수 있는 다수의 적재부; 직선 운동을 하는 가동자를 구비하는 리니어 액추에이터를 포함하는 이송 모듈; 및 상기 가동자에 고정되어 상기 가동자와 함께 이동하는 것으로, 상기 카트리지에 여기광을 조사하고 상기 카트리지 내의 샘플로부터 발생한 형광을 검출하는 형광 검출 모듈;을 포함하며, 상기 다수의 적재부들은 상기 가동자의 직선 운동 궤도를 따라 일렬로 배열될 수 있다.

    Abstract translation: 在本发明中，公开了多通道荧光检测模块和包含该多通道荧光检测模块的核酸分析系统，其包括多个装载部件，其中布置有多个具有微流体装置的盒; 转移模块，其具有包括可移动元件直线移动的线性致动器; 以及荧光检测模块，其固定在可移动元件上，因此一起移动，将激发光发射到暗盒，并且检测墨盒中的样品的荧光，其中多个加载部件与所述可移动元件的直线移动轨迹一起排列成行 活动元素

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