Abstract:
An integrated circuit including an array of flash EEPROM memory cells wherein overerase correction is provided after application of each erase pulse.
Abstract:
A flash memory device is divided into two or more banks. Each bank includes a number of sectors. Each sector includes flash memory cells. Each bank has a decoder that selectively receives an address from an input address buffer or from an internal address sequencer controlled by an internal state machine. The output data for each bank can be communicated to a read sense amplifier or a verify sense amplifier. The read sense amplifier connects to the output buffer while the verify sense amplifier connects to the state machine. When one bank receives a write command, the internal state machine takes control and starts the program or erase operation. While one bank is busy with a program or erase operation, the other bank can be accessed for a read operation.
Abstract:
A simultaneous operation non-volatile memory device with a flexible bank partition architecture comprises a memory array (20) including a plurality of memory cells arranged in a plurality of columns and rows, a plurality of bit lines (28 and 30) each connected to a respective column of the memory cells, each of the bit lines comprising first and second bit line segments separated by a gap designating a memory partition boundary between upper and lower memory banks, and an X-decoder (22) connected to the respective rows of the memory cells to row decode the memory array in response to receiving upper and lower bank memory addresses. Two pre-decoders (24 and 26) are connected to the X-decoder (22). Two Y-decoders (32 and 34) are connected to the bit line segments to provide column decoding for the memory cells in the upper and lower memory banks, respectively.
Abstract:
A flash memory device is divided into two or more banks. Each bank includes a number of sectors. Each sector includes flash memory cells. Each bank has a decoder that selectively receives an address from an input address buffer or from an internal address sequencer controlled by an internal state machine. The output data for each bank can be communicated to a read sense amplifier or a verify sense amplifier. The read sense amplifier connects to the output buffer while the verify sense amplifier connects to the state machine. When one bank receives a write command, the internal state machine takes control and starts the program or erase operation. While one bank is busy with a program or erase operation, the other bank can be accessed for a read operation.
Abstract:
An integrated circuit including an array of flash EEPROM memory cells wherein overerase correction is provided after application of each erase pulse.
Abstract:
A method of forming flexibly partitioned metal line segments (10 and 12) for separate memory banks in a simultaneous operation flash memory device with a flexible bank partition architecture comprises the steps of providing a basic metal layer (2) comprising a plurality of basic metal layer segments (2a, 2b, 2c, ...2j) separated by a plurality of gaps (6a, 6b, 6c, ...6i), each of the gaps having a predefined gap interval length, and providing a metal option layer (8) comprising a plurality of metal option layer segments on the basic metal layer (2), the metal option layer segments overlapping the gaps between the basic metal layer segments but leaving one of the gaps open, to form the metal line segments for the separate memory banks.
Abstract:
A flash memory device is divided into two or more banks. Each bank includes a number of sectors. Each sector includes flash memory cells. Each bank has a decoder that selectively receives an address from an input address buffer or from an internal address sequencer controlled by an internal state machine. The output data for each bank can be communicated to a read sense amplifier or a verify sense amplifier. The read sense amplifier connects to the output buffer while the verify sense amplifier connects to the state machine. When one bank receives a write command, the internal state machine takes control and starts the program or erase operation. While one bank is busy with a program or erase operation, the other bank can be accessed for a read operation.
Abstract:
A simultaneous operation non-volatile memory device with a flexible bank partition architecture comprises a memory array (20) including a plurality of memory cells arranged in a plurality of columns and rows, a plurality of bit lines (28 and 30) each connected to a respective column of the memory cells, each of the bit lines comprising first and second bit line segments separated by a gap designating a memory partition boundary between upper and lower memory banks, and an X-decoder (22) connected to the respective rows of the memory cells to row decode the memory array in response to receiving upper and lower bank memory addresses. Two pre-decoders (24 and 26) are connected to the X-decoder (22). Two Y-decoders (32 and 34) are connected to the bit line segments to provide column decoding for the memory cells in the upper and lower memory banks, respectively.
Abstract:
A method of forming flexibly partitioned metal line segments (10 and 12) for separate memory banks in a simultaneous operation flash memory device with a flexible bank partition architecture comprises the steps of providing a basic metal layer (2) comprising a plurality of basic metal layer segments (2a, 2b, 2c, ...2j) separated by a plurality of gaps (6a, 6b, 6c, ...6i), each of the gaps having a predefined gap interval length, and providing a metal option layer (8) comprising a plurality of metal option layer segments on the basic metal layer (2), the metal option layer segments overlapping the gaps between the basic metal layer segments but leaving one of the gaps open, to form the metal line segments for the separate memory banks.
Abstract:
A bank selector circuit for a simultaneous operation flash memory device with a flexible bank partition architecture comprises a memory boundary option (18), a bank selector encoder (2) connected to receive a memory partition indicator signal from the memory boundary option (18), and a bank selector decoder (3) connected to receive a bank selector code from the bank selector encoder (2). The decoder (3), upon receiving a memory address, outputs a bank selector output signal to point the memory address to either a lower memory bank or an upper memory bank in the simultaneous operation flash memory device, in dependence upon the selected memory partition boundary.