Abstract:
A sensor (100) for use in lithographic apparatus of an immersion type and which, in use, comes into contact with the immersion liquid (11) is arranged so that the thermal resistance of a first heat path from a transducer (104) of the sensor to a temperature conditioning device (107) is less than the thermal resistance of a second heat flow path from the transducer to the immersion liquid. Thus, heat flow is preferentially towards the temperature conditioning device and not the immersion liquid so that temperature-induced disturbance in the immersion liquid is reduced or minimized.
Abstract:
A lithographic apparatus has a support structure (MT) configured to support a patterning device (MA), the patterning device serving to pattern a radiation beam (B) according to a desired pattern and having a planar main surface (12) through which the radiation beam passes; an outlet opening (100) configured to direct a flow of a gas onto the patterning device; and an inlet opening (150) configured to extract the gas which has exited the outlet opening, wherein the outlet opening and inlet opening are in a facing surface facing the planar main surface of the patterning device.
Abstract:
An object table (WT) to support an object (W), the object table having a support body (100), an object holder (30) to hold an object, an opening (5) adjacent an edge of the object holder, and a channel (16) in fluid communication with the opening via a passageway (14), wherein the channel is defined by a first material which is different to a second material defining the passageway.
Abstract:
An object table to support an object, the object table having a support body, an object holder to hold an object, an opening adjacent an edge of the object holder, and a channel in fluid communication with the opening via a passageway, wherein the channel is defined by a first material which is different to a second material defining the passageway.