MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIMATION

    公开(公告)号:WO2022144203A1

    公开(公告)日:2022-07-07

    申请号:PCT/EP2021/086776

    申请日:2021-12-20

    Abstract: A modular autoencoder model is described. The modular autoencoder model comprises input models configured to process one or more inputs to a first level of dimensionality suitable for combination with other inputs; a common model configured to: reduce a dimensionality of combined processed inputs to generate low dimensional data in a latent space; and expand the low dimensional data in the latent space into one or more expanded versions of the one or more inputs suitable for generating one or more different outputs; output models configured to use the one or more expanded versions of the one or more inputs to generate the one or more different outputs, the one or more different outputs being approximations of the one or more inputs; and a prediction model configured to estimate one or more parameters based on the low dimensional data in the latent space.

    MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIMATION

    公开(公告)号:WO2022144205A1

    公开(公告)日:2022-07-07

    申请号:PCT/EP2021/086783

    申请日:2021-12-20

    Abstract: A modular autoencoder model is described. The modular autoencoder model comprises input models configured to process one or more inputs to a first level of dimensionality suitable for combination with other inputs; a common model configured to: reduce a dimensionality of combined processed inputs to generate low dimensional data in a latent space; and expand the low dimensional data in the latent space into one or more expanded versions of the one or more inputs suitable for generating one or more different outputs; output models configured to use the one or more expanded versions of the one or more inputs to generate the one or more different outputs, the one or more different outputs being approximations of the one or more inputs; and a prediction model configured to estimate one or more parameters based on the low dimensional data in the latent space.

    ESTIMATION OF DATA IN METROLOGY
    7.
    发明申请

    公开(公告)号:WO2019086167A1

    公开(公告)日:2019-05-09

    申请号:PCT/EP2018/075720

    申请日:2018-09-24

    Abstract: Methods and apparatus for estimating an unknown value of at least one of a plurality of sets of data, each set of data comprising a plurality of values indicative of radiation diffracted and/or reflected and/or scattered by one or more features fabricated in or on a substrate, wherein the plurality of sets of data comprises at least one known value, and wherein at least one of the plurality of sets of data comprises an unknown value, the apparatus comprising a processor to estimate the unknown value of the at least one set of data based on: the known values of the plurality of sets of data; a first condition between two or more values within a set of data of the plurality of sets of data; and a second condition between two or more values being part of different sets of data of the plurality of the sets of data.

    METHODS RELATED TO AN AUTOENCODER MODEL OR SIMILAR FOR MANUFACTURING PROCESS PARAMETER ESTIMATION

    公开(公告)号:EP4254266A1

    公开(公告)日:2023-10-04

    申请号:EP22164893.4

    申请日:2022-03-29

    Abstract: A method for ordering and/or selection of latent elements for modeling low dimensional data within a latent space representation, the low dimensional data being a reduced dimensionality representation of input data as determined by a first model component of a model, comprising the steps of training said model and selecting one of said latent element selections based on said training, said training comprising: reducing a dimensionality of the input data to generate said low dimensional data in said latent space representation; training a second model component of said model for each of one or more latent element selections; and optimizing an approximation of the input data as output by said second model component for each said latent element selection, thereby ranking at least one of said plurality of latent elements in the latent space representation based on a contribution of each latent element to the input data.

    METROLOGY METHOD
    10.
    发明公开
    METROLOGY METHOD 审中-公开

    公开(公告)号:EP3709082A1

    公开(公告)日:2020-09-16

    申请号:EP19162808.0

    申请日:2019-03-14

    Abstract: Disclosed are a method, computer program and associated apparatuses for metrology. The method includes determining a reconstruction recipe describing at least nominal values for using in a reconstruction of a parameterization describing a target. The method comprises obtaining first measurement data relating to measurements of a plurality of targets on at least one substrate, said measurement data relating to one or more acquisition settings and solving a cost function minimizing differences between the first measurement data and simulated measurement data based on a reconstructed parameterization for each of said plurality of targets. A constraint on the cost function is imposed based on a hierarchical prior. Also disclosed is a hybrid model for providing simulated data for use in reconstruction, comprising obtaining a coarse model operable to provide simulated coarse data; and training a data driven model to correct said simulated coarse data so as to determine said simulated data.

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