Voltage-stable negative resistance device
    1.
    发明授权
    Voltage-stable negative resistance device 失效
    电压稳定的负极电阻器件

    公开(公告)号:US3576572A

    公开(公告)日:1971-04-27

    申请号:US3576572D

    申请日:1968-07-15

    Applicant: IBM

    Inventor: BRASLAU NORMAN

    CPC classification number: G11C11/39 H01L47/00 H03K3/02

    Abstract: A voltage-stable, negative resistance device is provided that comprises a bulk material which is subjected to both a selected Radio Frequency electric field and a DC bias electric field. A pair of such devices provides a memory when mounted in a waveguide that is subjected to either a standing wave field or a traveling wave field.

    5.
    发明专利
    未知

    公开(公告)号:DE3580229D1

    公开(公告)日:1990-11-29

    申请号:DE3580229

    申请日:1985-08-28

    Applicant: IBM

    Inventor: BRASLAU NORMAN

    Abstract: Electrical parameter values, such as semiconductor sheet resistivity and mobility values, of a sample are measured in an apparatus of the kind in which the sample is positioned in a microwave guide and the microwave signal reflected from the sample is compared to the incident microwave to provide information about the values. The sample, a wafer 1, is positioned between parallel plates 2, 3 in a wafer holder 4, the plate 3 comprising support plate 30, 31 and wafer backing plate 33 held in place by vacuum chamber 34,35. The plate 2 has a groove 27 positioned and dimensioned to provide a so-called "choke flange" which compensates for the transmission discontinuity in the waveguide caused by the gap between the plates 2,3. The wafer 1 extends right across the total cross-section of the waveguide formed by the duct 7,8. The end of the duct 7 is coupled to a microwave source and the end of duct 8 is terminated in a short circuit, the spacing of which from the sample can be adjusted.

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