Abstract:
Metal-organic substrate adhesion is improved by irradiating the substrate with low energy reactive ions, electrons, or photons to alter the chemical composition of a surface layer of the substrate to a depth of from about 1 nm to a few tens of nanometers. The energy of the incident reactive ions and electrons can be in the range of about 50 to 2000 eV, while the energy of the incident photons can be in the range of about 0.2 - 500 eV. Irradiation of the substrate can occur prior to or during metal deposition. For simultaneous metal deposition/particle irradiation, the arrival rates of the metal atoms and the substrate treatment particles are within a few orders of magnitude of one another. The low energy irradiation can be conducted at room temperature or elevated temperatures.
Abstract:
PROBLEM TO BE SOLVED: To provide a temperature-sensitivity ring oscillator (TSRO) inside an integrated circuit. SOLUTION: A temperature measuring instrument, such as a thermal resistor, is in proximity to the TSRO, and substantially the same temperature is shared. A memory can be used for storing data, which are function of the outputs of the TSRO and the temperature measuring instrument. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method and device for reducing the power consumption of a clocked circuit including a plurality of latches. SOLUTION: A first latch which has more than a prescribed slack is detected within the plurality of latches. Then, the possibility of substituting an available second latch (requiring less power to operate) is determined subject to the constraint that the slack after substitution should still be positive although it may be less than the prescribed number above. When such a possibility is determined to exist, the first latch is replaced with the available second latch.
Abstract:
PROBLEM TO BE SOLVED: To provide an integral circuit thermal system for calibrating threshold temperature. SOLUTION: A temperature-sensing ring oscillator (TSRO) generates a TSRO calibration parameter. The TSRO calibration parameter is stored by using a memory, and the threshold TSRO oscillation frequency is obtained from the TSRO calibration parameter by using a module, and at least one threshold TSRO oscillation frequency is stored by using the memory. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an apparatus incorporating hardware based logic and a predetermined default list of software affecting responses to be taken in connection with temperature sensed by thermal sensors for detecting the temperature of portions of a computer logic circuit. SOLUTION: When application software is loaded, the software can modify the default response list. The list of responses to be taken and the over temperature conditions at which the responses are to be activated are stored in hardware directly accessible by a hardware based thermal sensor monitoring logic circuit for direct control of the hardware. The control can alter conditions such as clock frequency, stopping use of application software, interrupting OS function, removing power from components and so forth. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
An integrated scanning force microprobe and optical microscopy metrology system is disclosed, that measures the depth and width of a trench in a sample. The probe remains fixed while the sample is moved relative to the probe. The system detects the proximity of the probe to a sample and to the side walls of the trench, providing output signals indicating the vertical and transverse relationship of the probe to the sample. The system adjusts the relative position of the sample vertically and transversely as a function of the output signals. Variety of probes can be used with this system to detect the depth and width of the trench. The probe should have at least one protuberance extending down to sense the bottom of the trench. The tip of the probe can have Lateral protuberances that can extend in opposite directions (across the width of the trench) from the probe to detect the side walls of the trench. Forces on the protuberances are measured to determine the depth and the location of the side walls of the trench.
Abstract:
An integrated scanning force microprobe and optical microscopy metrology system is disclosed, that measures the depth and width of a trench in a sample. The probe remains fixed while the sample is moved relative to the probe. The system detects the proximity of the probe to a sample and to the side walls of the trench, providing output signals indicating the vertical and transverse relationship of the probe to the sample. The system adjusts the relative position of the sample vertically and transversely as a function of the output signals. Variety of probes can be used with this system to detect the depth and width of the trench. The probe should have at least one protuberance extending down to sense the bottom of the trench. The tip of the probe can have Lateral protuberances that can extend in opposite directions (across the width of the trench) from the probe to detect the side walls of the trench. Forces on the protuberances are measured to determine the depth and the location of the side walls of the trench.