Abstract:
PROBLEM TO BE SOLVED: To provide a bipolar transistor with a protruberant extrinsic self-aligned base that uses a selective epitaxial growth for BICMOS integration, and to provide a high-performance BiCMOS structure with minimum process complexity, without having to sacrifice the performances of either the bipolar transistors or CMOS devices. SOLUTION: A high-performance bipolar transistor with a raised extrinsic self-aligned base is integrated into a BiCMOS structure including CMOS devices. By forming pad layers and raising the height of an intrinsic base layer relative to the source and drain of preexisting CMOS devices and by forming an extrinsic base through selective epitaxy, the effect of surface variations is minimized during a lithographic patterning of the extrinsic base. Also, by not employing chemical mechanical planarization process during the fabrication of the bipolar structures, the complexity of process integration is reduced. Internal spacers or external spacers may be formed for isolating the base from the emitter. The pad layers, the intrinsic base layer, and the extrinsic base layer form a mesa structure that coincide with the outer sidewall surfaces. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
THE PRESENT INVENTION PROVIDES AN ORGANIC CHIP CARRIER (10) PARTICULARLY USEFUL WITH FLIP CHIPS (42), COMPRISING AN ORGANIC DIELECTRIC LAYER (22), A FIRST LAYER OF CIRCUITRY (25) DISPOSED ON THE DIELECTRIC LAYER, AN ORGANIC CONFORMATIONAL COATING (34) DISPOSED OVER THE FIRST LAYER OF DIELECTRIC AND THE FIRST LAYER OF CIRCUITRY, AND A LAYER OF FINE LINE CIRCUITRY (40) HAVING LINE WIDTH OF ABOUT 0. 0508 MM (2.0 MIL) OR LESS. PREFERABLY ABOUT 0.0254 MM (1.0 MIL) OR LESS, PREFERABLY ABOUT 0.01778 MM (0.7 MIL), AND A SPACE BETWEEN LINES OF ABOUT 0.0381 MM (1.5 MIL) OR LESS, PREFERABLY ABOUT 0.02794 MM (1.1 MIL) OR LESS, DISPOSED ON THE CONFORMATIONAL LAYER. PREFERABLY THE DIELECTRIC LAYER IS FREE OF WOVEN FIBER GLASS. THE CONFORMATIONAL COATING PREFERABLY HAS A DIELECTRIC CONSTANT OF ABOUT 1.5 TO ABOUT 3.5, AND A PERCENT PLANARIZATION OF GREATER THAN ABOUT 3.5%. THE INVENTION ALSO RELATES TO METHODS OF MAKING THE DIELECTRIC COATED CHIP CARRIER.
Abstract:
A polyimide pattern is formed on a substrate by providing a layer of photosensitive polyimide precursor containing the polyimide precursor and a compound having a photosensitive group on the substrate and prebaking the layer. The layer is then exposed imagewise to actinic radiation through a photomask to form an exposed image pattern of the polyimide precursor in the layer. The unexposed areas of the layer are removed using a liquid developer and the exposed image pattern is cured by heating. In one aspect of the present invention, the prebaking step employs a judicious selection of times and temperatures to eliminate the problem of formation of a white residue that occurs from using prior art prebake procedures. In another aspect of the present invention, a particular liquid developer composition is employed to facilitate the formation of sloped vias in the polyimide. In another aspect of the present invention, a particular range of exposure wavelength(s) is employed to obtain smooth walled vias.
Abstract:
The present invention provides an organic chip carrier particularly useful with flip chips. The chip carrier comprises an organic dielectric layer, a first layer of circuitry disposed on the dielectric layer, an organic conformational coating disposed over the first layer of dielectric and the first layer of circuitry, and a layer of fine line circuitry. The fine line circuitry has a line width of about 2.0 mil or less, preferably about 1.0 mil or less, and more preferably about 0.7 mil, and a space between lines of about 1.5 mil or less, preferably about 1.1 mil or less. Preferably the dielectric layer is free of woven fiber glass. The conformational coating preferably has a dielectric constant of about 1.5 to about 3.5, and a percent planarization of greater than about 30%. The invention also relates to methods of making the dielectric coated chip carrier.
Abstract:
The present invention provides an organic chip carrier particularly useful with flip chips. The chip carrier comprises an organic dielectric layer, a first layer of circuitry disposed on the dielectric layer, an organic conformational coating disposed over the first layer of dielectric and the first layer of circuitry, and a layer of fine line circuitry. The fine line circuitry has a line width of about 2.0 mil or less, preferably about 1.0 mil or less, and more preferably about 0.7 mil, and a space between lines of about 1.5 mil or less, preferably about 1.1 mil or less. Preferably the dielectric layer is free of woven fiber glass. The conformational coating preferably has a dielectric constant of about 1.5 to about 3.5, and a percent planarization of greater than about 30%. The invention also relates to methods of making the dielectric coated chip carrier.