Abstract:
PROBLEM TO BE SOLVED: To provide a programmable delay element circuit that is used for a high-performance computer system. SOLUTION: A programmable delay element 100 is provided with a precise delay element 200 having a fractional delay unit. The precise delay element 200 is provided with a precise delay circuit having a plurality of selective delay paths. The precise delay element 200 is electrically connected to a data terminal used to receive and delay an input signal. A control circuit is electrically connected to the precise delay element 200 to select a delay path for the input signal. Furthermore, the precise delay element 200 is electrically coupled to a rough delay circuit 115 provided with a plurality of selective delay blocks adopting a repetitive configuration. The control circuit is electrically coupled to the selective delay paths of the precise delay element 200 and the rough delay circuit 115, so as to select a precise delay or a rough delay or both the precise delay and the rough delay.
Abstract:
PROBLEM TO BE SOLVED: To provide a memory system spared in a segment level. SOLUTION: This memory system includes a cascade type interconnection system spared in the segment level. The cascade type interconnection system has at least two memory assemblies and a memory bus. The memory bus has a plurality of segments, and the memory assemblies are connected to each other via the memory bus. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method and a device for managing a set of signal paths of a chip and to provide a computer instruction. SOLUTION: A defective signal path among the set of signal paths of the chip is detected. A route of a signal is specified again via the set of signal paths in response to detection of the defective signal path, the defective signal path is eliminated from the set of signal paths and the signal is transmitted by using the remaining data signal path of the set of signal paths and using an excess signal path. In addition, the chip is a data source, a test pattern is generated by the data source, the test pattern is transmitted to a data destination by using the set of signal paths, the received pattern is compared with expected data at the data destination and whether or not the defective signal path exists is determined by utilizing this comparison result. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
The computer system uses a process to test a second protocol converter 58 with the aid of a first converter 56. The data structure of a specific protocol A is converted into a second protocol B data structure. The test process has the computer system 50 with a slow protocol coupled to the first converter 56 and is then coupled to the fast response protocol interface 49 of the converter being tested. An interface 48 connects peripherals to this converter. The process operates to obtain symmetry in the conversion.
Abstract:
A method for clock domain crossing is disclosed, where data is transferred from a first clock domain 160 to a second clock domain 170, wherein the second clock domain has a fixed clock frequency and the first clock domain has a variable clock frequency, the variable frequency being equal to or lower than the fixed frequency. The method comprises writing the data from the first clock domain into two buffers 110/120 connected in parallel with each other. The buffers both have time delays when transferring data from the first clock domain to the second, the time delay of the second buffer being longer than the time delay of the first buffer. The data is forwarded from the first buffer to the second clock domain when the variable frequency is equal to the fixed frequency (when in a synchronous mode), and the data is forwarded from the second buffer to the second clock domain when the variable frequency is lower than the fixed frequency (when in an asynchronous mode). The buffers may be first-in-first-out (FIFO) buffers.