Abstract:
Methods, systems and computer program products for analyzing a timing design of an integrated circuit are disclosed. According to an embodiment, a method for analyzing a timing design of an integrated circuit comprises: providing an initial static timing analysis of the integrated circuit; selecting a static timing test with respect to a static timing test point based on the initial static timing analysis; selecting a timing path (20, 30, 50) leading to the static timing test point for the static timing test; determining an integrated slack path variability for the timing path (20, 30, 50) based on a joint probability distribution of at least one statistically independent parameter; and analyzing the timing design based on the integrated slack path variability.
Abstract:
Disclosed are embodiments of an interconnection array (4) for a circuit. The interconnection array comprises a victim net (100) that is positioned parallel to and adjacent to sections of multiple crossed aggressor nets (200-400), thereby, minimizing the exposure of the circuit to delay or false switching as a result of coupling capacitance. Also, disclosed are embodiments of an associated method of re-routing an interconnection array (4) that incorporates identifying a victim net (100) and at least two aggressor nets (200-400) and crossing the aggressor nets (200-400) so that sections of multiple aggressor nets are positioned parallel to and adjacent to the victim net (100) in order to minimizes the impact of coupling capacitance on the victim net (100) with minimal changes to the wiring environment.