Abstract:
A high-voltage integrated driver circuit for driving the word lines of a digital computer memory array of floating-gate avalanche-injection transistor memory cells, and for other applications where a high driving voltage is required. The disclosed driver circuit comprises a field-effect output transistor having a source electrode connected to a respective word line, a drain electrode adapted to have a chip select pulse signal applied thereto, and a gate electrode connected to selectably operable circuitry which may be conditioned either to a first state for clamping the voltage of the gate to cut off the output transistor and thereby maintain the output and the word line at a first voltage level, or to a second state for unclamping the voltage of the gate of the output transistor to permit the voltage of the output and the respective word line to swing with a high amplitude so as to cause the selected memory cell transistor to go into avalanche breakdown and thereby charge its floating gate so as to store a bit of information in the selected cell.
Abstract:
A read-mostly memory cell is disclosed comprising a floating gate avalanche injection field effect transistor storage device equipped with an erasing electrode. The memory portion of the erasable storage devices comprises a P channel FET having a floating polycrystalline silicon gate separated from an N-doped substrate by a layer of silicon dioxide. The erasing portion of the device comprises an erasing electrode separated from the polycrystalline silicon floating gate by a thermally grown layer of silicon dioxide having a leakage characteristic which is low in the presence of low electrical fields and high in the presence of high electrical fields. The floating gate is heavily doped with boron which also partially dopes the thermally grown silicon dioxide layer. The floating gate is charged negatively by avalanche breakdown of the FET drain while the erase gate is grounded to the substrate. The floating gate is discharged (erased) upon the application of a positive pulse to the erase electrode with respect to the semiconductor substrate causing electrodes on the charged floating gate to leak through the thermal oxide to the erasing electrode.
Abstract:
A semiconductor device circuit for reading an FET capacitor store dynamic memory cell and for regenerating the charge (if any) in said capacitor whereby non-destructive read-out is achieved. The memory cell includes an FET switch for selectively connecting the storage capacitor to a memory array bit-sense line through either one of a pair of oppositely connected bipolar transistors for reading and writing, respectively. The bit-sense line is connected to the input terminal of a latching regenerative feedback amplifier such as a silicon controlled rectifier. The potential level at said input terminal rises to a relatively higher level by regenerative feedback action in response to a relatively lower bit-sensing voltage which initiates the latching action. The storage capacitor of the memory cell is recharged via one of the bipolar transistors in response to the aforesaid relatively higher potential at the the amplifier input terminal. Bipolar current switch embodiments as well as a silicon controlled rectifier embodiment are disclosed for instrumenting the latching regenerative feedback amplifier.
Abstract:
1519103 Selective printing INTERNATIONAL BUSINESS MACHINES CORP 18 Nov 1976 [31 Dec 1975] 48201/76 Heading B6F Ink jet printer has pair of parallel rows of nozzles offset in the direction of their length. The jets issuing from each row are directed to different sets of non-adjacent dot positions in a row 12 and the trajectories of the jets emanating from one row of nozzles are not parallel to those of the jets emanating from the other row. The nozzles may be produced by anisotropic etching of a semi-conductor chip.