DEVICE FOR INVESTIGATING FORM FEATURE OF SAMPLE SURFACE

    公开(公告)号:JPH10311841A

    公开(公告)日:1998-11-24

    申请号:JP10891298

    申请日:1998-04-20

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide a method for improving the accuracy of measurements made by a scanning probe microscope. SOLUTION: A scanning probe microscope 10 has a probe 18 which moves as it is engaged with and separated from a sample surface by the combination of deflection generated in a high-speed actuator 22 having a relatively small range of motion and deflection generated in a low-speed actuator 26 having a relatively large range of motion. If the deflection of the high speed actuator moves out of a predetermined range, the low speed actuator operates in such a way that the next operation of the high speed actuator brings the high speed actuator back to the predetermined range. If the low speed actuator is required to be operated in this way, scanning movement whereby a sample surface is moved to pass through a probe is stopped until the probe is brought to the correct engagement level with the sample surface, so that the high speed actuator is deflected within the predetermined range.

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