1.
    发明专利
    未知

    公开(公告)号:DE69016326T2

    公开(公告)日:1995-07-13

    申请号:DE69016326

    申请日:1990-05-12

    Applicant: IBM

    Abstract: A system for fabricating an ultra-thin composite dielectric, usable for the capacitor in DRAM and in other integrated circuits, involving the deposition, a LPCVD tube, of a nitride (3) in situ on a very thin LPCVD oxide (2). By re-oxidizing the nitride (3) or depositing a LPCVD oxide layer (4, 4 min ) in situ thereon, a composite ONO dielectric, having very low defect density and good overall electric properties, of less than 10 nm in thickness and as low as 4.5 nm, may be formed.

    8.
    发明专利
    未知

    公开(公告)号:DE69016326D1

    公开(公告)日:1995-03-09

    申请号:DE69016326

    申请日:1990-05-12

    Applicant: IBM

    Abstract: A system for fabricating an ultra-thin composite dielectric, usable for the capacitor in DRAM and in other integrated circuits, involving the deposition, a LPCVD tube, of a nitride (3) in situ on a very thin LPCVD oxide (2). By re-oxidizing the nitride (3) or depositing a LPCVD oxide layer (4, 4 min ) in situ thereon, a composite ONO dielectric, having very low defect density and good overall electric properties, of less than 10 nm in thickness and as low as 4.5 nm, may be formed.

Patent Agency Ranking