-
公开(公告)号:JP2000200877A
公开(公告)日:2000-07-18
申请号:JP36451099
申请日:1999-12-22
Applicant: IBM
Inventor: PETER RICHARD DANKUUMU , EDELSTEIN DANIEL CHARLES , LAIBOWITZ ROBERT BENJAMIN , DEBORAH ANNE NEWMEYER , NING TAK H , ROSENBERG ROBERT , THOMAS MAKAROORU SHOW
IPC: H01G4/33 , H01L21/02 , H01L21/316 , H01L21/822 , H01L23/522 , H01L23/532 , H01L23/64 , H01L27/04 , H01L27/105
Abstract: PROBLEM TO BE SOLVED: To ensure effective filtering action while reducing noise by employing an amorphous thin film material as a dielectric material having permittivity of a specified value or above being arranged between two electrodes. SOLUTION: A decoupling capacitor 10 is formed as a laminate where an amorphous dielectric thin film 12 is sandwiched between two electrodes 14, 16 of conductive layer containing TaN, Pt, Ir, ruthenium oxide, Al, Au, Cu, Ta, TaSiN and mixtures or a multiplayer thereof. The amorphous dielectric thin film 12 is composed of a perovskite-type oxide containing a titanate based dielectric, a manganate based material, a cuprite based material, a tungsten bronze type niobate, and tantalite wherein the perovskite-type oxide has permittivity higher than 10. Thus, effective filtering action can be ensured while reducing noise.
-
公开(公告)号:JPH11224936A
公开(公告)日:1999-08-17
申请号:JP29838198
申请日:1998-10-20
Applicant: IBM
Inventor: PETER RICHARD DANKOOMU , HUMMEL JOHN P , LAIBOWITZ ROBERT BENJAMIN , DEBORAH AN NEWMEYER , KATRINE LIN ZENGER , SCHROTT ALEJANDRO GABRIEL
IPC: H01L21/8247 , C23C8/12 , H01L21/822 , H01L21/8242 , H01L21/8246 , H01L27/04 , H01L27/10 , H01L27/105 , H01L27/108 , H01L29/788 , H01L29/792
Abstract: PROBLEM TO BE SOLVED: To provide a method for improving adhesion and interfacial characteristics between a noble metal part and a high-permeability film by exposing a surface of a noble-metal substrate to oxygen-containing energy and forming a noble-metal oxide film. SOLUTION: One of or a combination of high-density microwave, high-frequency plasma, ion collisions due to oxygen-containing ion beam is selected as an oxygen-containing energy source, and the energy source is used with or without a substrate bias under separate control. The noble metal is selected from among at least on of Pt, Ir, Au, Os, Ag, Pd, Rh and Ru, or selected from among a noble metal alloy of these noble metals. A noble metal oxide film 36 is formed on a noble-metal substrate 34, by exposing a surface of the substrate 34 to the oxygen containing energy source. The oxide layer thickness is normally in a range of 0.4 to 10 nm. In addition, the surface of the noble- metal substrate 34 may be exposed to the oxygen containing energy source for a sufficient time to form an interfacial reinforcement layer, and then a high-permeability material layer 38 may be deposited on the noble-metal substrate 34 with the oxygen containing layer in between.
-
公开(公告)号:DE3855305T3
公开(公告)日:2005-10-06
申请号:DE3855305
申请日:1988-03-04
Applicant: IBM
-
公开(公告)号:AT138501T
公开(公告)日:1996-06-15
申请号:AT88103367
申请日:1988-03-04
Applicant: IBM
-
公开(公告)号:DE3876473D1
公开(公告)日:1993-01-21
申请号:DE3876473
申请日:1988-03-25
Applicant: IBM
Inventor: CLARK GREGORY JOHN , GAMBINO RICHARD JOSEPH , KOCH ROGER HILSEN , LAIBOWITZ ROBERT BENJAMIN , MARWICK ALAN DAVID , UMBACH CORWIN PAUL
IPC: G01R33/035 , H01L39/22 , H01L39/24 , H01L39/14
Abstract: A superconducting device operable at temperatures in excess of 30oK and a method for making the device are described. A representative device is an essentially coplanar SQUID device (10, 56A, 56B, 58A, 58B) formed in a single layer (12) of high-Tc superconducting material, the SQUID device (10, 56A, 56B, 58A, 58B) being operable at temperatures in excess of 60 K. High energy beams (34), for example ion beams, are used to convert selected portions (30) of the high-Tc superconductor layer (12) to nonsuperconducting properties so that the material now has both, superconducting regions (20A, 20B) and nonsuperconducting regions (30). In this manner a superconducting loop (16A, 16B, 20A, 20B) having superconducting weak links (16A, 16B) can be formed to comprise the SQUID device.
-
公开(公告)号:MX165961B
公开(公告)日:1992-12-11
申请号:MX1110788
申请日:1988-04-13
Applicant: IBM
Inventor: KOCH ROGER HILSEN , LAIBOWITZ ROBERT BENJAMIN , UMBACH CORWIN PAUL , MARWICK ALAN DAVID , CLARK GREGORY JOHN , GAMBINO RICHARD JOSEPH
IPC: G01R33/035 , H01L39/22 , H01L39/24 , G01R33/02
Abstract: A superconducting device operable at temperatures in excess of 30oK and a method for making the device are described. A representative device is an essentially coplanar SQUID device (10, 56A, 56B, 58A, 58B) formed in a single layer (12) of high-Tc superconducting material, the SQUID device (10, 56A, 56B, 58A, 58B) being operable at temperatures in excess of 60 K. High energy beams (34), for example ion beams, are used to convert selected portions (30) of the high-Tc superconductor layer (12) to nonsuperconducting properties so that the material now has both, superconducting regions (20A, 20B) and nonsuperconducting regions (30). In this manner a superconducting loop (16A, 16B, 20A, 20B) having superconducting weak links (16A, 16B) can be formed to comprise the SQUID device.
-
公开(公告)号:DE3578634D1
公开(公告)日:1990-08-16
申请号:DE3578634
申请日:1985-10-11
Applicant: IBM
Inventor: LAIBOWITZ ROBERT BENJAMIN , UMBACH CORWIN PAUL
Abstract: @ This invention relates to an electrical interconnection for connecting conductive layers and to a method for fabricating such devices. The interconnections (7) can be made from normal metal, superconductors, low bandgap insulators, semimetals or semiconductors depending on the application, and form vias between the conductive layers.After the formation of contamination cones (3) on a substrate (2), a first conductive layer (4) is deposited on a portion of a cone and over the substrate. An insulating material (6) is deposited conformally over the conductive layer (4) and cone (3) such that the thickness of the insulating matenal over the conductive layer has a thickness less than the height of the contamination cone. Those portions of the insulation material, the conductive layer and the contamination cone which extend beyond the nominal surface of the insulating layer are removed, exposing a portion of the cone and a portion of the conductive layer which forms an interconnection (7). In a final step, another layer (5) of conductive material is deposited such that an electrically conductive interconnection (7) is made between the just deposited conductive layer (5) and the initially deposited conductive layer 1 ( 4 ).
-
公开(公告)号:DE3278837D1
公开(公告)日:1988-09-01
申请号:DE3278837
申请日:1982-08-13
Applicant: IBM
Inventor: BROERS ALEC NIGEL , LAIBOWITZ ROBERT BENJAMIN
-
公开(公告)号:DE2363088A1
公开(公告)日:1974-07-11
申请号:DE2363088
申请日:1973-12-19
Applicant: IBM
Inventor: DISTEFANO THOMAS HERMAN , LAIBOWITZ ROBERT BENJAMIN , ROSENBERG ROBERT
Abstract: The present invention relates to electrodes used for charging electrophotographic image surfaces in copying machines. More particularly, the disclosure is directed to the negative corona discharge electrodes which produce a negative charge that is applied to the photoconductive surface exposed to the corona discharge. In the present invention, the electrode structure includes a combination of a wire of valve metal with a high resistivity coating spread uniformly over the surface of the wire. The valve metal, one example being tantalum, may serve as the electrode wire itself or may surround an inner wire such as stainless steel. By providing an electrode for corona discharge having a uniform high resistive coating, the plasma glow produced will spread uniformly along the length of the wire. By using a valve metal, which forms a hard oxide under the high resistivity coating, the electrode is self-healing in that if cracks or imperfections occur in the coating, the exposed valve metal will oxidize and fill in the cracks and imperfections.
-
公开(公告)号:SG72884A1
公开(公告)日:2000-05-23
申请号:SG1998004543
申请日:1998-11-05
Applicant: IBM
Inventor: DUNCOMBE PETER RICHARD , HUMMEL JOHN PATRICK , LAIBOWITZ ROBERT BENJAMIN , NEUMAYER DEBORAH ANN , SAENGER KATHERINE LYNN , SCHROTT ALEJANDRO GABRIEL
IPC: H01L21/8247 , C23C8/12 , H01L21/822 , H01L21/8242 , H01L21/8246 , H01L27/04 , H01L27/10 , H01L27/105 , H01L27/108 , H01L29/788 , H01L29/792
-
-
-
-
-
-
-
-
-