Abstract:
PROBLEM TO BE SOLVED: To improve circuit structure for reading and evaluating the memory state in a semiconductor memory cell. SOLUTION: A differential current evaluation circuit (SBS) is provided with input section resistance adjusting means (MIN, MINB) of a differential amplifier (DV) and a current evaluation circuit (SBS). These means (MIN, MINB) are connected to the output parts (outp, outn) and the input parts (inn, inp) of the differential amplifier (DV) and signal lines (BL, BLB), which are electrically connected also to the input parts (inn, inp) of the differential amplifier (DV). A sense amplifier circuit (LV) is provided with a circuit part (ST2). The differential current evaluation circuit (SBS) and the sense amplifier circuit (LV) are arranged in circuit structure for reading and evaluating the memory state of a semiconductor memory cell. A current evaluation circuit is activated, before a reading process and automatically inactivated, immediately after finishing the reading process by a circuit (STAD) for automatic inactivation. COPYRIGHT: (C)2004,JPO
Abstract:
An electronic amplifier circuit according to the principle of current detection is coupled to a memory cell field and has an input transistor for each respective row or column of the matrix array. The input transistor is connected to the respective row or column and can be driven and switched by a control signal of a multiplexer circuit. The amplifier circuit may be constructed as a gate circuit or as a transistor diode circuit. A matrix array of memory cells and a matrix array of photodetectors are also provided.
Abstract:
Es werden eine elektronische Treiberschaltung und ein Ansteuerverfahren offenbart. Die Treiberschaltung weist einen Ausgang auf; einen ersten Ausgangstransistor mit einem Steuerknoten und einer Laststrecke, wobei die Laststrecke zwischen den Ausgang und einen ersten Versorgungsknoten geschaltet ist; einen Spannungsregler, der dazu ausgebildet ist, eine Spannung über der Laststrecke des ersten Ausgangstransistors zu steuern; und einen ersten Treiber, der dazu ausgebildet ist, den ersten Ausgangstransistor in Abhängigkeit von einem ersten Steuersignal anzusteuern.
Abstract:
An amplifier circuit configuration includes a data line for transmitting a data signal. The data line is connected to a data signal input of an amplifier by way of a switching device. The amplifier includes a control circuit for controlling an input resistance of the amplifier with a terminal for a control signal. The terminal for the control signal of the control circuit is connected, parallel to the switching device, to the data line. As a consequence, a switching device, which is connected between the data line and the amplifier, has only little influence on the dynamic response when reading out a data signal.
Abstract:
The memory has several memory cells (SZ1,SZ2), wherein one of the memory cells is read out selectively via a bit line (BL,BLB) and a read amplifier (SA). A regulating circuit (LC) controls the current (IB) of the bit line in dependence on a voltage change of the bit line caused by a leakage current (IL) and compensates the leakage current.
Abstract:
Treiberschaltung mit:einem Ausgang (OUT);einem ersten Ausgangstransistor (11) mit einem Steuerknoten (G11) und einer Laststrecke (D11-S11), wobei die Laststrecke (D11-S11) zwischen den Ausgang (OUT) und einen ersten Versorgungsknoten (11) geschaltet ist;einem Spannungsregler (3, 4), der dazu ausgebildet ist, eine Spannung (VDS11) über der Laststrecke des ersten Ausgangstransistors (11) zu regeln, wenn der erste Ausgangstransistor (11) eingeschaltet ist; undeinem ersten Treiber (21), der dazu ausgebildet ist, den ersten Ausgangstransistor (11) in Abhängigkeit von einem ersten Steuersignal (CS11) anzusteuern.
Abstract:
The device is connected to at least one data line and has at least one memory node (K1,K2), at least one selection transistor (M5) connected to the first node, a first data line (BL), a first word line (WL1) and an arrangement (M7) for adapting the leakage current that causes a total leakage current from at least one bit line (BL) into the cell independent of the memory state of the cell, especially in the non-selected state.
Abstract:
The differential electric current evaluation circuit has differential amplifier (DV) with input portions and input resistance adjustment unit with transistors (MIN,MINB). The input portions and output portions of differential amplifier, are connected with signal lines (BL,BLB) with which transistors (MIN,MINB) of input resistance adjustment unit are connected, respectively. Independent claims are also included for the following: (1) sense amplifier circuit; (2) sense amplifier circuit structure.
Abstract:
An amplifier circuit configuration includes a data line for transmitting a data signal. The data line is connected to a data signal input of an amplifier by way of a switching device. The amplifier includes a control circuit for controlling an input resistance of the amplifier with a terminal for a control signal. The terminal for the control signal of the control circuit is connected, parallel to the switching device, to the data line. As a consequence, a switching device, which is connected between the data line and the amplifier, has only little influence on the dynamic response when reading out a data signal.