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公开(公告)号:WO02103772A2
公开(公告)日:2002-12-27
申请号:PCT/FR0202029
申请日:2002-06-13
Applicant: ST MICROELECTRONICS SA , KONINKL PHILIPS ELECTRONICS NV , MARTY MICHEL , FORTUIN ARNOUD , ARNAL VINCENT
Inventor: MARTY MICHEL , FORTUIN ARNOUD , ARNAL VINCENT
IPC: H01L21/3065 , H01L21/316 , H01L21/76 , H01L21/762 , H01L21/764
CPC classification number: H01L21/76232 , H01L21/31612 , H01L21/76237 , H01L21/764
Abstract: The invention relates to a deep insulating trench, comprising side walls (11) and a base (10), embodied in a semiconductor substrate (1). The side walls (11) and the base (10) are coated with an electrically insulating material (12) which defines an empty cavity (13) and forms a plug (14) to seal the cavity (13). The side walls (11) are embodied with a neck (15) for determining the position of the plug (15) and a first section (16) which tapers out towards the neck (15) with increasing separation from the base (10). The above is particularly suitable for application in bipolar circuits and BiCMOS.
Abstract translation: 本发明涉及一种深绝缘沟槽,包括实施在半导体衬底(1)中的侧壁(11)和底座(10)。 侧壁(11)和基座(10)涂覆有限定空腔(13)并形成密封空腔(13)的塞子(14)的电绝缘材料(12)。 侧壁(11)具有用于确定插头(15)的位置的颈部(15)和与基部(10)分离的方式朝向颈部(15)逐渐变细的第一部分(16)。 以上特别适用于双极电路和BiCMOS。
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公开(公告)号:FR2823375A1
公开(公告)日:2002-10-11
申请号:FR0104820
申请日:2001-04-09
Applicant: ST MICROELECTRONICS SA
Inventor: ARNAL VINCENT , TORRES JOAQUIM
IPC: H01L21/764 , H01L21/768 , H01L23/522
Abstract: The production of an integrated circuit incorporating an insulating gaseous layer totally separating at least two selected tracks of a level of metallization of row i (Mi) comprises: (a) realizing the metallization of row I by inserting a sacrificial material (MSi) between the selected tracks at this level; (b) realizing, in the material of the insulating inter-tracks (IMDi+1) separating the tracks of the level of metallization of row i+1 and in the inter-way insulating material (ILDi+1) separating the interconnection contacts at the level of interconnection of row I+1, some shafts (CH) emerging in the sacrificial material; and (c) eliminating the sacrificial material across these shafts. An Independent claim is also included for an integrated circuit incorporating an insulating gaseous layer totally separating at least two tracks of a level of metallization of the circuit (L1, L2).
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公开(公告)号:DE60226539D1
公开(公告)日:2008-06-26
申请号:DE60226539
申请日:2002-04-17
Applicant: ST MICROELECTRONICS SA
Inventor: FARCY ALEXIS , ARNAL VINCENT , TORRES JOAQUIM
IPC: H01P3/08 , H01F17/00 , H01F41/04 , H01L21/02 , H01L23/64 , H01L27/08 , H01Q1/36 , H01Q11/08 , H01Q13/20
Abstract: The integrated chip inductance has a number of line conductors (L1 to L6) which are parallel and having an optimized width. Each line conductor is formed within the thickness of an isolating layer (20,23,27). The lines are interconnected by a perpendicular conductor segment.
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公开(公告)号:DE60130947D1
公开(公告)日:2007-11-29
申请号:DE60130947
申请日:2001-08-16
Applicant: ST MICROELECTRONICS SA
Inventor: ARNAL VINCENT , TORRES JOAQUIM
IPC: H01L21/02
Abstract: The fabrication of a metal plate capacitor in the metallisation levels above an integrated circuit consists of depositing an insulating layer (11) of between 0.5 and 1.5 microns on the surface of an integrated circuit (10). Method then involves grooving the insulating layer to form slabs (12), depositing and smoothing a metallic material (14) to form conducting lines (L1, L2, L3, L4) in the slabs, locally drawing the insulating layer to eliminate all the gaps separating two conducting lines, depositing a dielectric layer (16) and depositing and engraving a second metallic material (17) to at least completely fill the inter-line gaps.
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公开(公告)号:FR2801426A1
公开(公告)日:2001-05-25
申请号:FR9914486
申请日:1999-11-18
Applicant: ST MICROELECTRONICS SA
Inventor: DELPECH PHILIPPE , ARNAL VINCENT , LIS SANDRA
IPC: H01L21/02 , H01L21/314 , H01L29/92 , H01G4/08 , H01G4/33
Abstract: Capacitive structure (20) on a Si substrate (10) comprises first (1) and second (3) electrode layers and dielectric layer (2) comprising a homogeneous combination of molecules of at least two dielectrics with permittivities ( iota ) behaving oppositely as a function of electric field. The proportion of each dielectric is empirically chosen so that capacitance varies as little as possible with voltage. The dielectric of the dielectric layer (2) has formula SiOxNy, where x is different from y. The material of the first (1) and second (2) electrode layers is selected from aluminum, copper, tungsten, titanium, titanium nitride and their alloys. Independent claims are given for: (a) a dielectric comprising a homogeneous combination of molecules of at least two dielectrics with permittivities ( iota ) behaving oppositely as a function of electric field, and where the proportion of each dielectric in the combination is empirically chosen such that the combination has a permittivity whose variation as a function of electric field is as low as possible; and (b) a method of production of the above capacitive structure.
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公开(公告)号:FR2851373B1
公开(公告)日:2006-01-13
申请号:FR0301978
申请日:2003-02-18
Applicant: ST MICROELECTRONICS SA , KONINKL PHILIPS ELECTRONICS NV
Inventor: TORRES JOAQUIM , ARNAL VINCENT , GOSSET LAURENT
IPC: H01L21/764 , H01L21/768 , H01L23/522 , H01L23/532
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公开(公告)号:FR2823375B1
公开(公告)日:2004-07-09
申请号:FR0104820
申请日:2001-04-09
Applicant: ST MICROELECTRONICS SA
Inventor: ARNAL VINCENT , TORRES JOAQUIM
IPC: H01L21/764 , H01L21/768 , H01L23/522
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公开(公告)号:FR2801425B1
公开(公告)日:2004-05-28
申请号:FR9914480
申请日:1999-11-18
Applicant: ST MICROELECTRONICS SA
Inventor: DELPECH PHILIPPE , ARNAL VINCENT
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公开(公告)号:FR2851373A1
公开(公告)日:2004-08-20
申请号:FR0301978
申请日:2003-02-18
Applicant: ST MICROELECTRONICS SA , KONINKL PHILIPS ELECTRONICS NV
Inventor: TORRES JOAQUIM , ARNAL VINCENT , GOSSET LAURENT
IPC: H01L21/768 , H01L23/522 , H01L23/532 , H01L21/764
Abstract: The method involves forming air-gap (C1) between interconnection units (11-13) above a portion regulated of a surface of a substrate (100) inside an interconnection layer that has a silicon-di-oxide (1) extending above an intermediary layer of a permeable material (2). The air-gap is formed by retraction of a part of the silicon-di-oxide by keeping the material in contact with a retraction agent of the silicon-di-oxide. An independent claim is also included for an integrated electronic circuit.
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公开(公告)号:FR2801426B1
公开(公告)日:2002-10-11
申请号:FR9914486
申请日:1999-11-18
Applicant: ST MICROELECTRONICS SA
Inventor: DELPECH PHILIPPE , ARNAL VINCENT , LIS SANDRA
IPC: H01L21/02 , H01L21/314 , H01L29/92 , H01G4/08 , H01G4/33
Abstract: An integrated circuit capacitor includes a substrate, a first metal electrode on the substrate, and a dielectric layer on the first metal electrode. The dielectric layer includes a homogeneous combination of at least two dielectric materials having permittivities varying in an opposite way based upon an electric field, with a proportion of each dielectric material being chosen so that the integrated circuit capacitor has a desired voltage linearity. A second metal electrode is on the dielectric layer.
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