DEEP INSULATING TRENCH AND METHOD FOR PRODUCTION THEREOF
    1.
    发明申请
    DEEP INSULATING TRENCH AND METHOD FOR PRODUCTION THEREOF 审中-公开
    深层绝缘固化剂及其生产方法

    公开(公告)号:WO02103772A2

    公开(公告)日:2002-12-27

    申请号:PCT/FR0202029

    申请日:2002-06-13

    CPC classification number: H01L21/76232 H01L21/31612 H01L21/76237 H01L21/764

    Abstract: The invention relates to a deep insulating trench, comprising side walls (11) and a base (10), embodied in a semiconductor substrate (1). The side walls (11) and the base (10) are coated with an electrically insulating material (12) which defines an empty cavity (13) and forms a plug (14) to seal the cavity (13). The side walls (11) are embodied with a neck (15) for determining the position of the plug (15) and a first section (16) which tapers out towards the neck (15) with increasing separation from the base (10). The above is particularly suitable for application in bipolar circuits and BiCMOS.

    Abstract translation: 本发明涉及一种深绝缘沟槽,包括实施在半导体衬底(1)中的侧壁(11)和底座(10)。 侧壁(11)和基座(10)涂覆有限定空腔(13)并形成密封空腔(13)的塞子(14)的电绝缘材料(12)。 侧壁(11)具有用于确定插头(15)的位置的颈部(15)和与基部(10)分离的方式朝向颈部(15)逐渐变细的第一部分(16)。 以上特别适用于双极电路和BiCMOS。

    Production of integrated circuit comprises incorporating insulating gaseous layer totally separating at least two selected metallized tracks

    公开(公告)号:FR2823375A1

    公开(公告)日:2002-10-11

    申请号:FR0104820

    申请日:2001-04-09

    Abstract: The production of an integrated circuit incorporating an insulating gaseous layer totally separating at least two selected tracks of a level of metallization of row i (Mi) comprises: (a) realizing the metallization of row I by inserting a sacrificial material (MSi) between the selected tracks at this level; (b) realizing, in the material of the insulating inter-tracks (IMDi+1) separating the tracks of the level of metallization of row i+1 and in the inter-way insulating material (ILDi+1) separating the interconnection contacts at the level of interconnection of row I+1, some shafts (CH) emerging in the sacrificial material; and (c) eliminating the sacrificial material across these shafts. An Independent claim is also included for an integrated circuit incorporating an insulating gaseous layer totally separating at least two tracks of a level of metallization of the circuit (L1, L2).

    4.
    发明专利
    未知

    公开(公告)号:DE60130947D1

    公开(公告)日:2007-11-29

    申请号:DE60130947

    申请日:2001-08-16

    Abstract: The fabrication of a metal plate capacitor in the metallisation levels above an integrated circuit consists of depositing an insulating layer (11) of between 0.5 and 1.5 microns on the surface of an integrated circuit (10). Method then involves grooving the insulating layer to form slabs (12), depositing and smoothing a metallic material (14) to form conducting lines (L1, L2, L3, L4) in the slabs, locally drawing the insulating layer to eliminate all the gaps separating two conducting lines, depositing a dielectric layer (16) and depositing and engraving a second metallic material (17) to at least completely fill the inter-line gaps.

    10.
    发明专利
    未知

    公开(公告)号:FR2801426B1

    公开(公告)日:2002-10-11

    申请号:FR9914486

    申请日:1999-11-18

    Abstract: An integrated circuit capacitor includes a substrate, a first metal electrode on the substrate, and a dielectric layer on the first metal electrode. The dielectric layer includes a homogeneous combination of at least two dielectric materials having permittivities varying in an opposite way based upon an electric field, with a proportion of each dielectric material being chosen so that the integrated circuit capacitor has a desired voltage linearity. A second metal electrode is on the dielectric layer.

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