公开(公告)号：JP2000049295A

公开(公告)日：2000-02-18

申请号：JP19889599

申请日：1999-07-13

Applicant: ST MICROELECTRONICS SA ,  KONINKL PHILIPS ELECTRONICS NV

Inventor： GRIS YVON ,  TROILLARD GERMAINE ,  MOURIER JOCELYNE ,  GUELEN JOS ,  LUNARDI GENEVIEVE ,  BANVILLET HENRI ,  OBERLIN JEAN-CLAUDE ,  MADDALON CATHERINE

IPC: H01L21/302 ,  H01L21/02 ,  H01L21/3065 ,  H01L21/768 ,  H01L21/822 ,  H01L27/04

Abstract: PROBLEM TO BE SOLVED: To provide a method which has compatibility with the existing CMOS components manufacturing process in manufacturing a capacitor, having little possibility of causing the dielectric breakdown. SOLUTION: A first metal layer is deposited and etched with leaving a region 12, corresponding to a capacitor plate and contact region 13 on the first metal layer, an input layer 15 is deposited between metallization layers, a first opening is formed into an upper part of the capacitor plate 12, a thin insulation layer 17 is deposited, a second opening 20 is formed into an upper part of the contact region, a second metal layer 24 is deposited for completely filling the opening 20, a physical-chemical etching is applied to suppress the outside region of the second metal layer, and a third metal layer is deposited to cause to be left at positions 31, 32 on the third metal layer above the contact region and capacitor region.

公开(公告)号：JPH11274171A

公开(公告)日：1999-10-08

申请号：JP1441499

申请日：1999-01-22

Applicant: St Microelectronics Sa ,  エステーミクロエレクトロニクス ソシエテ アノニム

Inventor： GRIS YVON ,  TROILLARD GERMAINE ,  MOURIER JOCELYNE

IPC: H01L29/73 ,  C30B25/02 ,  H01L21/20 ,  H01L21/205 ,  H01L21/331 ,  H01L29/732

CPC classification number: C30B29/06 ,  C30B25/02 ,  H01L21/02381 ,  H01L21/02532 ,  H01L21/0262 ,  H01L29/66287 ,  Y10S117/913

Abstract: PROBLEM TO BE SOLVED: To deposit silicon at a low temperature, by deciding a window on a single crystal silicon substrate, and generating an inter-lattice defect in terms of atoms at a specified rate in the window.
SOLUTION: A window 13 is given on a single crystal silicon substrate 11. The surface of the area of a layer which is not covered by the window is processed in a way that a lattice defect is generated at the rate of one percent in terms of atoms to the depth of below 5 μm in a crystal lattice in a region 14 which is not covered. When the stage of any annealing is not executed immediately after the processing, an upper layer 15 is processed with conditions that a state is that of pressure reduction at the temperature below that at which epitaxial deposition is generally executed, a range is 600-700°C and below 900°C, reaction gas is silane (SiH
4 ) and pressure reduction is about 0.1×10
5 Pa (80 Torr). The layer 15 is similar to the substrate 11 but it has single crystal structure following a crystal axis different form the crystal axis of the substrate 11.
COPYRIGHT: (C)1999,JPO

Abstract translation: 要解决的问题：通过在单晶硅衬底上确定窗口并在窗口中以规定的速率产生晶格间缺陷，以便在低温下沉积硅。 解决方案：在单晶硅衬底11上提供窗口13.未被窗口覆盖的层的区域的表面以如下方式进行处理，即以1％的速率产生晶格缺陷， 原子在未被覆盖的区域14中的晶格中的5μm以下的深度。 当在处理之后立即执行任何退火阶段时，上层15的处理条件是在低于通常执行外延沉积的温度下的压力降低的状态，范围为600-700度 ℃，900℃以下，反应气体为硅烷（SiH4），减压约为0.1×10 5 Pa（80托）。 层15与基板11相似，但是具有与基板11的晶轴不同的晶轴的单晶结构。

公开(公告)号：DE69719711D1

公开(公告)日：2003-04-17

申请号：DE69719711

申请日：1997-12-24

Applicant: ST MICROELECTRONICS SA

Inventor： GRIS YVON ,  MOURIER JOCELYNE ,  TROILLARD GERMAINE

IPC: H01L21/8222 ,  H01L21/8248 ,  H01L21/8249 ,  H01L27/06

Abstract: A bipolar transistor (BT) is formed by depositing a polysilicon base layer (23) and then a protective oxide layer (24), forming an emitter-base opening, depositing and etching a polysilicon emitter layer (46) and etching the protective oxide layer (24) and the polysilicon base layer (23) outside the BT zones. Deep trenches are formed by: (a) opening the protective oxide layer and polysilicon base layer combination above a thick oxide zone (5) during formation of the emitter-base opening; (b) etching the thick oxide layer (5) during etching of the protective oxide layer (24); and (c) etching the silicon (2) below the thick oxide during etching of the polysilicon base layer (23). Preferably, the trench is etched to 1-1.5 mu m depth and 0.25-0.5 mu m width.

公开(公告)号：FR2781603B1

公开(公告)日：2000-10-06

申请号：FR9809437

申请日：1998-07-21

Applicant: ST MICROELECTRONICS SA

Inventor： GRIS YVON ,  TROILLARD GERMAINE ,  MOURIER JOCELYNE ,  GUELEN JOS ,  LUNARDI GENEVIEVE ,  BANVILLET HENRI ,  OBERLIN JEAN CLAUDE ,  MADDALON CATHERINE

IPC: H01L21/302 ,  H01L21/02 ,  H01L21/3065 ,  H01L21/768 ,  H01L21/822 ,  H01L27/04 ,  H01L21/3205 ,  H01L21/8234

Abstract: Process involves depositing and etching metal layer for region (12) corresponding to a capacitance plate and area (13) contacting a higher layer; depositing insulating layer; forming hole above the plate, depositing thin insulating layer; forming 2nd hole above contact zone; depositing 2nd metal layer; etching 2nd metal layer except in hole-filling regions; and depositing 3rd metal layer (31, 32). The 1st and 2nd metal layers are tungsten, and the 3rd metal layer is Al-Cu. The 1st hole has inclined walls, while the 2nd hole has straight walls.

公开(公告)号：FR2781603A1

公开(公告)日：2000-01-28

申请号：FR9809437

申请日：1998-07-21

Applicant: ST MICROELECTRONICS SA

Inventor： GRIS YVON ,  TROILLARD GERMAINE ,  MOURIER JOCELYNE ,  GUELEN JOS ,  LUNARDI GENEVIEVE ,  BANVILLET HENRI ,  OBERLIN JEAN CLAUDE ,  MADDALON CATHERINE

IPC: H01L21/302 ,  H01L21/02 ,  H01L21/3065 ,  H01L21/768 ,  H01L21/822 ,  H01L27/04 ,  H01L21/3205 ,  H01L21/8234

Abstract: Process involves depositing and etching metal layer for region (12) corresponding to a capacitance plate and area (13) contacting a higher layer; depositing insulating layer; forming hole above the plate, depositing thin insulating layer; forming 2nd hole above contact zone; depositing 2nd metal layer; etching 2nd metal layer except in hole-filling regions; and depositing 3rd metal layer (31, 32). The 1st and 2nd metal layers are tungsten, and the 3rd metal layer is Al-Cu. The 1st hole has inclined walls, while the 2nd hole has straight walls.