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公开(公告)号:DE602006009662D1
公开(公告)日:2009-11-19
申请号:DE602006009662
申请日:2006-08-24
Applicant: ST MICROELECTRONICS SRL , HYNIX SEMICONDUCTOR INC
Inventor: MICHELONI RINO , CRIPPA LUCA , RAVASIO ROBERTO , PIO FEDERICO
IPC: G11C16/34
Abstract: A method for operating a flash memory device ( 100 ) is proposed. The memory device includes a matrix of memory cells ( 110 ) each one having a programmable threshold voltage (V T ) defining a value stored in the memory cell. The method includes the steps of crasing a block ( 115 ) of memory cells, and compacting the threshold voltages of the memory cells of the block within a predefined compacting range, wherein the step of compacting includes: selecting at least one first memory cell (110 0e ) of the block for writing a target value; restoring the threshold voltage of a subset (110 0e ; 110 1o ) of the memory cells of the block to the compacting range, the subset consisting of the at least one first memory cell (110 0e ) and/or at least one second memory cell of the block (110 1o ) being adjacent to the at least one first memory cell; and at least partially writing the target value into the at least one first memory cell.
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公开(公告)号:DE602005012682D1
公开(公告)日:2009-03-26
申请号:DE602005012682
申请日:2005-07-22
Applicant: HYNIX SEMICONDUCTOR INC , ST MICROELECTRONICS SRL
Inventor: CRIPPA LUCA , MISSIROLI CHIARA , MICHELONI RINO
Abstract: A reading method of a NAND memory device including the steps of: first connecting a first end terminal (12a) of a stack (12) of cells (3, 3', 3") to a reference line (13); second connecting a second end terminal (12b) of the stack (12) of cells (3, 3', 3") to a respective bitline (10); charging the bitline (10) to a predetermined bitline read voltage (V DR ), wherein one of the steps of first connecting and second connecting is carried out before charging the bitline (10) and the other of the steps of first connecting and second connecting is carried out after charging the bitline (10). An order of carrying out the steps of first connecting and second connecting is determined based on an address (MSB; AL2) of a selected cell (3', 3") .
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公开(公告)号:DE602006010280D1
公开(公告)日:2009-12-24
申请号:DE602006010280
申请日:2006-06-07
Applicant: ST MICROELECTRONICS SRL , HYNIX SEMICONDUCTOR INC
Inventor: CRIPPA LUCA , MICHELONI RINO
IPC: G11C11/56
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公开(公告)号:DE602006013977D1
公开(公告)日:2010-06-10
申请号:DE602006013977
申请日:2006-09-13
Applicant: HYNIX SEMICONDUCTOR INC , ST MICROELECTRONICS SRL
Inventor: CRIPPA LUCA , RAVASIO ROBERTO , MICHELONI RINO
Abstract: The evaluation time (Teval) of the programmed or erased state of a cell of the NAND memory array is set for the individual memory device in a way that at least partially compensates the generally large spread of parasitic capacitance values of the array bitlines in the mass production fabrication process of these devices.
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公开(公告)号:DE602005011603D1
公开(公告)日:2009-01-22
申请号:DE602005011603
申请日:2005-07-28
Applicant: ST MICROELECTRONICS SRL , HYNIX SEMICONDUCTOR INC
Inventor: CRIPPA LUCA , MISSIROLI CHIARA , BOVINO ANGELO , RAVASIO ROBERTO , MICHELONI RINO
IPC: G11C11/56
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公开(公告)号:DE602006011451D1
公开(公告)日:2010-02-11
申请号:DE602006011451
申请日:2006-06-21
Applicant: HYNIX SEMICONDUCTOR INC , ST MICROELECTRONICS SRL
Inventor: CRIPPA LUCA , MICHELONI RINO
IPC: G11C16/34
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公开(公告)号:DE602005008396D1
公开(公告)日:2008-09-04
申请号:DE602005008396
申请日:2005-05-20
Applicant: ST MICROELECTRONICS SRL , HYNIX SEMICONDUCTOR INC
Inventor: RAGONE GIANCARLO , CRIPPA LUCA , SANGALLI MIRIAM , MICHELONI RINO
Abstract: A high-voltage switch (24) has a high-voltage input terminal (29), receiving a high voltage (HV), and an output terminal (31). A pass transistor (36), having a control terminal, is connected between the high-voltage input terminal (29) and the output terminal (31). The output of a voltage-multiplying circuit (40) of the charge-pump type is connected to the control terminal. The voltage-multiplying circuit (40) is of a symmetrical type, has first and second charge-storage means (41, 42), receiving a clock signal (CK) of a periodic type, and has a first circuit branch (44, 48) and a second circuit branch (45, 49), which are symmetrical to one another and operate in phase opposition with respect to the clock signal (CK).
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公开(公告)号:DE602005006791D1
公开(公告)日:2008-06-26
申请号:DE602005006791
申请日:2005-07-28
Applicant: ST MICROELECTRONICS SRL , HYNIX SEMICONDUCTOR INC
Inventor: CRIPPA LUCA , MICHELONI RINO
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公开(公告)号:JP2001084782A
公开(公告)日:2001-03-30
申请号:JP2000253119
申请日:2000-07-21
Applicant: ST MICROELECTRONICS SRL
Inventor: MICHELONI RINO , CAMPARDO GIOVANNI , CRIPPA LUCA
Abstract: PROBLEM TO BE SOLVED: To eliminate the drawback that reduction of read time is limited at a low supply voltage. SOLUTION: A read circuit 1' comprises an array branch 6 having an input array node 22 connected, via an array bit line 8, to an array cell 10; a reference branch 12 having an input reference node 32 connected, via a reference bit line 14, to a reference cell 16; a current-to-voltage converter 18 connected to an output array node 56 of the array branch and to an output reference node of the reference branch to supply on both nodes 56, 58 the respective electric potentials VM, VR correlated to the currents flowing in both cells 10, 16; and a comparator 19 connected at input to both nodes 56, 58 and supplying as output a signal OUT indicative of the contents stored in the array memory cell 10; and an array decoupling stage 80 arranged between both array nodes 22, 56 to decouple both array nodes 22, 56 from one another.
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公开(公告)号:ITMI20042213A1
公开(公告)日:2005-02-18
申请号:ITMI20042213
申请日:2004-11-18
Applicant: ST MICROELECTRONICS SRL
Inventor: CRIPPA LUCA , MICHELONI RINO , SANGALLI MIRIAM
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